Structural and Magnetic Characterization of Rare Earth and Transition Metal Films Grown on Epitaxial Buffer Films on Semiconductor

1989 ◽  
Vol 151 ◽  
Author(s):  
R. F. C. Farrow ◽  
S. S. P. Parkin ◽  
V. S. Speriosu ◽  
A. Bezinge ◽  
A. P. Segmuller
Keyword(s):  
Rare Earth ◽  
Structural Characteristics ◽  
Metal Films ◽  
Epitaxial Films ◽  
Coherency Strain ◽  
Magnetic Data ◽  
Bulk Crystals ◽  
Structural Effects ◽  
X Ray

ABSTRACTStructural and magnetic data are presented and discussed for epitaxial films of rare earth metals ( Dy, Ho, Er) on LaF3 films on the GaAs(TTT) surface and Fe on Ag films on the GaAs(001) surface. Both systems exhibit unusual structural characteristics which influence the magnetic properties of the metal films. In the case of rare earth epitaxy on LaF3 we present evidence for epitaxy across an incommensurate or discommensurate interface. Coherency strain is not transmitted into the metal which behaves much like bulk crystals of the rare earths. In the case of Fe films , tilted epitaxy and long-range coherency strain are confirmed by X-ray diffractometry. Methods of controlling some of these structural effects by modifying the epitaxial structures are presented.

Structural Characterization of Thin Metal Overlayers by X-ray Photoelectron and Auger-Electron Forward Scattering

1986 ◽  
Vol 83 ◽  
Author(s):  
W. F. Egelhoff
Keyword(s):  
Ultrathin Films ◽  
Surface Segregation ◽  
Metal Films ◽  
Epitaxial Films ◽  
Forward Scattering ◽  
Crystalline Lattice ◽  
Auger Electrons ◽  
X Ray ◽  
Metal Overlayers

ABSTRACTForward scattering of XPS and Auger electrons by atoms in a crystalline lattice produce beams of enhanced intensity radiating out from the surface at angles corresponding to the internuclear axes present in the top few atomic layers. This effect has been applied to analyze the mechanism of surface segregation in ultrathin metal films, to analyze the interdiffusion at the interfaces of ultrathin films, and to assess the effects of substrate contamination on the growth of epitaxial films. The systems studied in this work are Cu, Ni, and Co on Ni(100), however the purpose of this work is not to investigate these particular systems but to use them to illustrate the capabilities of forward scattering.

scholarly journals The Physico-Chemical and Mineralogical Characterization of Mg-Rich Synthetic Gypsum Produced in a Rare Earth Refining Plant

2021 ◽  
Vol 13 (9) ◽  
pp. 4840
Author(s):  
Fatai Arolu Ayanda ◽  
Mohd Firdaus Mohd Anuar ◽  
Syaharudin Zaibon ◽  
Shamshuddin Jusop
Keyword(s):  
Rare Earth ◽  
Acid Soils ◽  
Acid Neutralization ◽  
Mineralogical Characterization ◽  
X Ray ◽  
Neutralization Capacity ◽  
Acid Neutralization Capacity ◽  
Refining Plant ◽  
Calcium Magnesium

The physical, chemical and mineralogical characterization of the constituents of magnesium-rich synthetic gypsum produced in a rare earth-refining plant located in Gebeng, Pahang, Malaysia was conducted through elemental chemical analysis, scanning electron microscopy with Energy Dispersive X-ray (EDX)-analyzer, thermal analysis, X-ray fluorescence and X-ray diffraction. The crystalline nature of the by-product was studied using FTIR spectroscopy. Elemental analysis confirmed the presence of Ca and Mg, which are essential macronutrients required by plants and this Ca alongside the high pH (9.17) of MRSG may confer on the material a high acid neutralization capacity. From the result, it was observed that the studied by-product is a heterogeneous crystalline material comprising of gypsum (CaSO4.2H2O) and other major components such as calcium (magnesium) compounds (hydroxide, oxide, silicates, and carbonate) and sulfur. These aggregates may contribute to give an acid neutralization capacity to MRSG. The XRD study of MRSG indicated a high content of gypsum (45.4%), shown by the d-spacing of 7.609 Å (2-theta 11.63) in the diffractogram. The infrared absorption spectra of MRSG indicate close similarities to mined gypsum. The results of the characterization indicated that MRSG has valuable properties that can promote its use in amending soil fertility constraints on nutrient-deficient tropical acid soils.

X-Ray Diffraction Study of Rare Earth Epitaxial Structures Grown by MBE onto (111) GaAs

1989 ◽  
Vol 151 ◽  
Author(s):  
W. R. Bennett ◽  
R. F. C. Farrow ◽  
S. S. P. Parkin ◽  
E. E. Marinero
Keyword(s):  
Rare Earth ◽  
Molecular Beam Epitaxy ◽  
Rare Earth Metal ◽  
Molecular Beam ◽  
Earth Metal ◽  
Magnetic Ordering ◽  
Metal Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Strain Components

ABSTRACTWe report on the new epitaxial system LaF3/Er/Dy/Er/LaF3/GaAs (111) grown by molecular beam epitaxy. X-ray diffraction studies have been used to determine the epitaxial relationships between the rare earths, the LaF3 and the substrate. Further studies of symmetric and asymmetric reflections yielded the in-plane and perpendicular strain components of the rare earth layers. Such systems may be used to probe the effects of magnetoelastic interactions and dimensionality on magnetic ordering in rare earth metal films and multilayers.

Structural Systematics of Rare Earth Complexes. VII. Crystal Structure of Bis(2,2'/6',2␛-Terpyridinium) Octaaquaterbium(III) Heptachloride Hydrate

1994 ◽  
Vol 47 (2) ◽  
pp. 391 ◽  
Author(s):  
CJ Kepert ◽  
BW Skeleton ◽  
AH White
Keyword(s):  
Crystal Structure ◽  
Rare Earth ◽  
Single Crystal ◽  
Structural Characterization ◽  
Title Compound ◽  
Room Temperature ◽  
Chloride Ions ◽  
Full Matrix ◽  
X Ray

The room-temperature single-crystal X-ray structural characterization of the title compound (tpyH2)2[Tb(OH2)8]Cl7.~2⅓H2O is recorded. Crystals are triclinic, Pī , a 17.063(5), b 16.243(3), c 7.878(3) Ǻ, α 84.78(2), β 84.39(3), γ 87.81(2)°, Z = 2 formula units; 3167 'observed' diffractometer reflections were refined by full-matrix least-squares procedures to a residual of 0.057. Notable features of interest of the compound are the 'chelation' of chloride ions by the terpyridinium cations , and the existence of a free [Tb(OH2)8]2+ cation in the presence of an abundance of chloride ions.

scholarly journals Preparation and Characterization of Immobilized Molybdenum Complex on Pillared Montmorillonite K-10

2018 ◽  
Vol 1 (1) ◽  
Author(s):  
Farah Wahida Harun ◽  
Siti Balkis Mahamat Nor ◽  
Siti Salhah Othman
Keyword(s):  
Structural Characteristics ◽  
Xrd Analysis ◽  
Attenuated Total Reflection ◽  
Basal Spacing ◽  
Molybdenum Complex ◽  
X Ray ◽  
Pillared Montmorillonite ◽  
Sem Micrograph ◽  
Pillaring Solution

This study was carried out to immobilize molybdenyl (VI) acetylacetonate (MoO2(acac)2) complex on alumina pillared montmorillonite K-10 (MMT K-10). Pillar MMT K-10 was produced by introducing MMT K-10 with a hydrolysis solution of NaOH with AlCl3. Different concentrations of pillaring solution were prepared in terms of OHto Al3+ ratio (0.5, 1.0, 1.5 and 2.0) to observe the structural characteristics of MMT K-10. The pillared materials were then immobilized with 0.1 M MoO2(acac)2 and were characterized using X-ray diffractometry (XRD), scanning electron microscopy coupled in an energy dispersive X-ray spectrometer (SEM-EDX) and Fourier transform infrared spectroscopy with attenuated total reflection (FTIR-ATR) techniques. FTIR bands at ca. 890 – 930 cm-1 indicate that the Mo complex was immobilized on the surface of pillared MMT K-10 not in between the layers. This is supported by the SEM and XRD analysis where the SEM micrograph showed deposition of Mo on the surface of MMT K-10 as well as no modification of basal spacing was observed by XRD. Meanwhile, the d(001) spacing of the alumina pillared MMT K10 samples were seen to increase slightly as the concentration of OH/Al3+ increased.

Characterization of Cold Sprayed Copper Coatings on Al Alloy Substrate

2015 ◽  
Vol 3 (2) ◽  
pp. 41-53
Author(s):  
Tarun Goyal ◽  
T. S. Sidhu ◽  
R. S. Walia
Keyword(s):  
Spray Deposition ◽  
Structural Characteristics ◽  
Al Alloy ◽  
X Ray Diffraction ◽  
X Ray ◽  
Copper Coatings ◽  
Powder Particles ◽  
Micro Analysis ◽  
Hardness Values

This study reveals the successful low pressure cold spray deposition of near-uniform, defect free and dense copper coatings approximately 700-1900 µm thick, on Al alloy for electro-technical applications. The micro structural characteristics of the deposits have been studied using the combined techniques of X-ray diffraction (XRD), scanning electron microscopy (SEM), and energy dispersive X-ray spectroscopy (EDS) and electron-probe micro analysis (EPMA). The coatings exhibited characteristic splat-like, layered morphologies due to the deposition of solid powder particles which appeared to have been plastically deformed on impact to the substrate. The developed coatings have a dense (in the range of 3090-5015 kg/m3)and nearly uniform microstructure, with almost uniform hardness values in the range of 120 -140 Hv, and electrical conductivity in the range of 23-30 MS/m. EDAX, XRD and EPMA results revealed that the main constituent in the coating is Cu.

scholarly journals Structural and morphological characterization of rare earth modified lead titanate

Cerâmica ◽  
2007 ◽  
Vol 53 (328) ◽  
pp. 422-447
Author(s):  
F. C. D. Lemos ◽  
D. M. A. Melo ◽  
P. S. de Lima ◽  
C. A. Paskocimas ◽  
E. Longo ◽  
...  
Keyword(s):  
Rare Earth ◽  
Lead Titanate ◽  
Pechini Method ◽  
Morphological Characterization ◽  
X Ray Diffraction ◽  
X Ray ◽  
Different Temperatures ◽  
Crystallite Sizes ◽  
Modifier Cation

Rare earth modified lead titanate powders Pb1-xRExTiO3 (REPT), x = 0.01, 0.05, 0.07 and RE = Yb, Y, were prepared by the Pechini method. The materials were calcined under flowing oxygen at different temperatures from 300 to 700 ºC. Nanostructured REPT were investigated using X-ray diffraction, scanning electron microscopy and surface area analysis (BET). The results suggest that the modifier cation incorporated into the system has notable influence in the microstructure and a notable decrease in the crystallite sizes.

scholarly journals Synchrotron X-ray diffraction characterization of the inheritance of GaN homoepitaxial thin films grown on selective growth substrates

CrystEngComm ◽  
2018 ◽  
Vol 20 (20) ◽  
pp. 2861-2867 ◽  
Author(s):  
Yanfang Lou ◽  
Chulho Song ◽  
Yanna Chen ◽  
Loku Singgappulige Rosantha Kumara ◽  
Natalia Palina ◽  
...  
Keyword(s):  
Thin Films ◽  
Structural Characteristics ◽  
Selective Growth ◽  
X Ray Diffraction ◽  
X Ray ◽  
Growth Substrates

The structural characteristics of a selective growth GaN substrate were inherited from an Al2O3 substrate and then transferred to homoepitaxial thin films.

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