Fourier Transform Photoluminescence Excitation Spectroscopy: A New Technique for the Characterisation of Low Dimensional Semiconductor Structures

1988 ◽  
Vol 138 ◽  
Author(s):  
G. Clarke ◽  
B. Hamilton
Keyword(s):  
Fourier Transform ◽  
New Technique ◽  
Photoluminescence Excitation ◽  
Semiconductor Structures ◽  
A New Technique ◽  
Low Dimensional

Physioelectrochemical investigation of the supercapacitive performance of a ternary nanocomposite by common electrochemical methods and fast Fourier transform voltammetry

2015 ◽  
Vol 39 (12) ◽  
pp. 9454-9460 ◽  
Author(s):  
Javad Shabani Shayeh ◽  
Ali Ehsani ◽  
Ayda Nikkar ◽  
Parviz Norouzi ◽  
Mohammad Reza Ganjali ◽  
...  
Keyword(s):  
Cyclic Voltammetry ◽  
Fourier Transform ◽  
Fast Fourier Transform ◽  
Composite Electrode ◽  
Electrochemical Methods ◽  
New Technique ◽  
Supercapacitive Performance ◽  
Ternary Nanocomposite ◽  
A New Technique ◽  
Continuous Cyclic Voltammetry

Fast Fourier transform continuous cyclic voltammetry as a new technique for the explanation of a composite electrode for supercapacitors.

NEW TECHNIQUE TO SUPPRESS SIDELOBE CLUTTER IN PERIMETER SECURITY SYSTEMS

2007 ◽  
Vol 17 (02) ◽  
pp. 367-382 ◽  
Author(s):  
G. W. WEBB ◽  
I. V. MININ ◽  
O. V. MININ
Keyword(s):  
Fourier Transform ◽  
Millimeter Wave ◽  
New Technique ◽  
Main Beam ◽  
Security Systems ◽  
Signal Suppression ◽  
A New Technique ◽  
The Fourier Transform ◽  
Beam Signal

False echoes degrade the operation of radar and imaging antennas. The false returns or clutter arise from antenna sidelobes and raise the threshold of detection in perimeter security systems. Accordingly there is great interest in reducing the sidelobes in present day millimeter wave and future terahertz antennas. Here we describe a new technique to suppress antenna sidelobe returns. The technique exploits our ability to distinguish between the phase of desired signals arriving in the antenna main beam and the phase of undesired clutter signals coming from the sidelobes. We demonstrate that through modulation of phase and taking the Fourier transform of the received signal, we can preferentially suppress the clutter return relative to the desired main beam signal. Suppression of average clutter return of over 25 dB is found.

Focal Plane Array (FPA) Fourier Transform Infrared (FT-IR) Imaging Spectroscopy as a new technique to evaluate of human oocytes quality

Placenta ◽  
2011 ◽  
Vol 32 ◽  
pp. S281
Author(s):  
Giorgia Gioacchini ◽  
Oliana Carnevali ◽  
Elisabetta Giorgini ◽  
Lisa Vaccari ◽  
Veronica Bianchi ◽  
...  
Keyword(s):  
Fourier Transform ◽  
Focal Plane ◽  
Imaging Spectroscopy ◽  
Fourier Transform Infrared ◽  
Focal Plane Array ◽  
New Technique ◽  
Human Oocytes ◽  
Ir Imaging ◽  
Ft Ir ◽  
A New Technique

Fourier Transform Infrared Photopyroelectric Spectroscopy of Solids: A New Technique

1990 ◽  
Vol 44 (1) ◽  
pp. 132-143 ◽  
Author(s):  
A. Mandelis ◽  
F. Boroumand ◽  
H. Solka ◽  
J. Highfield ◽  
H. Van Den Bergh
Keyword(s):  
Fourier Transform ◽  
Fourier Transform Infrared ◽  
New Technique ◽  
Solid Materials ◽  
Analytical Technique ◽  
Spectroscopic Investigations ◽  
Ft Ir ◽  
Photothermal Methods ◽  
Salient Features ◽  
A New Technique

A novel analytical technique, Fourier transform infrared photopyroelectric spectroscopy (FT-IR-P2ES) is demonstrated and applied to spectroscopic investigations of solid materials. The salient features of the technique and its advantages over other conventional FT-IR photothermal methods are discussed. A few selected quantitative applications are presented as examples of the versatility and sensitivity of the new technique.

scholarly journals A new technique for the measurement of show-through mottle of fine paper

TAPPI Journal ◽  
2019 ◽  
Vol 18 (9) ◽  
pp. 570-574
Author(s):  
JEAN-PHILIPPE BERNIE ◽  
JULIE TALBOT ◽  
HARSHAD PANDE
Keyword(s):  
Optical Properties ◽  
Fourier Transform ◽  
Fast Fourier Transform ◽  
New Technique ◽  
Paper Machine ◽  
Visual Evaluation ◽  
Machine Control ◽  
A New Technique ◽  
The Relationship

Mottling within print-through and show-through is caused by the variability of the local optical properties of the sheet. This mottling is visually disturbing and a mark of poor paper quality. The ability to predict print-through mottle of printed paper by measuring show-through mottle on the unprinted sheet would be a valuable asset for paper machine control. We examined the relationship between print-through mottle and show-through mottle. We worked with nine samples of 60 lb. uncoated fine paper (90 g/m2), from various North American paper companies, that were printed on an offset press, 400K (400% Black), on both sides. A show-through mottle instrumental determination technique was developed using an existing Fast Fourier Transform-based algorithm. The nine samples examined were ranked similarly by the visual evaluation of print-through mottle and by the instrumental determination of show-through mottle. We thus established that show-through on the unprinted sheet can be used as a reliable predictor of print-through, therefore saving time and money for papermakers. We also found a significant two-sidedness in show-through for some of the samples.

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