Leaching Studies of Synroc Crystalline Ceramic Waste Forms

1988 ◽  
Vol 127 ◽  
Author(s):  
A. G. Solomaha ◽  
Hj. Matzkeb

ABSTRACTThe leaching performance of pressureless sintered SYNROC crystalline ceramic waste forms containing simulated high-level radioactive waste has been evaluated under different leach conditions, i.e. in deionized water and in a simulated brine (Q-brine) at different leach temperatures. The leach solutions were analyzed using inductively coupled plasma and atomic absorption spectrometry (ICPS and AAS) to determine the concentrations of the simulated waste elements and the matrix components released into the leachants. The leach rates of Ba and Ca were in the range of 0.1 to 0.02 g/(m2.d) after one week of leaching in deionized water at 150 °C. No significant difference in the leach behaviour of SYNROC was observed in distilled water and in simulated brine. The leached surfaces of SYNROC were characterized using Rutherford backscattering spectrometry (RBS), secondary ion mass spectrometry (SIMS), scanning electron microscopy (SEM) and elastic recoil detection analysis (ERDA). RBS and SIMS analyses revealed the existence of near-surface layers enriched in Ti and depleted in Ba and Ca. Elastic recoil detection analysis showed the existance of hydrated surface layers on the leached SYNROC which were much thinner than those observed in parallel work with borosilicate waste glasses. Radiation damage produced by ion implantation increased the otherwise very-small leach rates of SYNROC. At high damage levels, SYNROC was shown to become amorphous (metamict).

2016 ◽  
Vol 879 ◽  
pp. 810-814 ◽  
Author(s):  
Mihail Ionescu ◽  
Alec Deslandes ◽  
Rohan Holmes ◽  
Mathew C. Guenette ◽  
Inna Karatchevtseva ◽  
...  

Silicon carbide (3C-β SiC) samples were irradiated with He ions of energy up to 30 keV and a fluence up to 1016/cm2, to produce damage in the near-surface region. A duplicate set of He ion irradiated SiC samples, as well as undamaged SiC, were also irradiated with H2+ ions of energy up to 20 keV and a similar fluence, to study the interaction of H species with pristine SiC and with He radiation-damaged SiC. Samples were annealed in steps of 200 K, from 473 K to 1273 K, and the retention of H and He were measured using elastic recoil detection analysis with 7.8 MeV C3+ ions, after each anneal step. Modification to the surface following irradiation is observed via Raman spectroscopy, which exhibits development of damage states such as disordered carbon and Si-Si peaks. Only minor changes in the H and He profiles were observed up to 1073 K, however after the 1273 K anneal the H and He profiles changed considerably, with a marked difference between samples irradiated only with He and those irradiated with He and H.


2016 ◽  
Vol 26 (1) ◽  
pp. 83 ◽  
Author(s):  
Vu Duc Phu ◽  
Le Hong Khiem ◽  
A. P. Kobzev ◽  
M. Kulik

This paper presents the results of an experimental study of three samples containing various elements in the near-surface layers. The depth profiles of all the elements of different atomic masses from hydrogen to silver were investigated by Rutherford Backscattering Spectrometry (RBS) and Elastic Recoil Detection Analysis (ERDA). The experiments were performed by using the low-energy (about 2 MeV) 4He+ ion beams. The obtained results demonstrate the possibility of the RBS and ERDA methods in the investigation of depth profiles of any mass element with an atomic concentration of about 0.01 at.% and a depth resolution close to 10 nm.


2018 ◽  
Author(s):  
Dmitrii Moldarev ◽  
Elbruz M. Baba ◽  
Marcos V. Moro ◽  
Chang C. You ◽  
Smagul Zh. Karazhanov ◽  
...  

It has been recently demonstrated that yttrium oxyhydride(YHO) films can exhibit reversible photochromic properties when exposed to illumination at ambient conditions. This switchable optical propertyenables their utilization in many technological applications, such as smart windows, sensors, goggles, medical devices, etc. However, how the composition of the films affects their optical properties is not fully clear and therefore demands a straightforward investigation. In this work, the composition of YHO films manufactured by reactive magnetron sputtering under different conditions is deduced in a ternary diagram from Time-of-Flight Elastic Recoil Detection Analysis (ToF-ERDA). The results suggest that stable compounds are formed with a specificchemical formula – YH<sub>2-δ</sub>O<sub>δ</sub>. In addition, optical and electrical properties of the films are investigated, and a correlation with their compositions is established. The corresponding photochromic response is found in a specific oxygen concentration range (0.45 < δ < 1.5) with maximum and minimum of magnitude on the lower and higher border, respectively.


2021 ◽  
Author(s):  
Hélène Bureau ◽  
Hicham Khodja ◽  
Imène Estève ◽  
Matthieu Charrondière-Lewis ◽  
Eloise Gaillou ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document