Measurement and Modeling of Atomic Chlorine Concentrations in Plasma Processes
Keyword(s):
AbstractSpatially resolved concentration profiles of ground-state chlorine atoms were measured in CF3 Cl/Ar RF plasmas using two-photon laser induced fluorescence. A significant Cl gradient was found between the two electrodes under conditions typical for plasma etching. This experimental observation is consistent with previous model predictions which assumed the primary loss of Cl was a second-order surface recombination on the upper electrode which is partially limited by gaseous diffusion.
Keyword(s):
2013 ◽
Vol 15
(20)
◽
pp. 7666
◽
Keyword(s):
2012 ◽
Vol 116
(39)
◽
pp. 20882-20886
◽
2018 ◽
Vol 20
(30)
◽
pp. 19922-19931
◽
1997 ◽
Vol 265
(3-5)
◽
pp. 297-302
◽
Keyword(s):
Keyword(s):
Keyword(s):