Micropillar Compression of MoSi2 Single Crystals
Keyword(s):
Ion Beam
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ABSTRACTDeformation behavior of MoSi2 has been studied by micropillar compressions of single crystalline specimens prepared by focused ion beam (FIB) technique as a function of crystal orientation at room temperature. Activation of the {011}<100> and {01$\overline 3$}<331> slip systems were observed in the micropillars compressed along [$\overline 1$10] and [0 15 1], respectively. The CRSS values for each slip system exhibit an approximate power law relationship with the edge length of micropillar. The {01$\overline 3$}<331> slip exhibit much stronger size-dependence than the {011}<100> slip system.