Compression of Single-Crystal Micropillars of the ζ Intermetallic Phase in the Fe-Zn System

2012 ◽  
Vol 1516 ◽  
pp. 157-162 ◽  
Author(s):  
Masahiro Inomoto ◽  
Norihiko L. Okamoto ◽  
Haruyuki Inui
Keyword(s):  
Single Crystal ◽  
Room Temperature ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Deformation Behaviour ◽  
Intermetallic Phase ◽  
Compression Tests ◽  
Slip Direction ◽  
Beam Method ◽  
Image Position

ABSTRACTThe deformation behaviour of the ζ (zeta) phase in the Fe-Zn system has been investigated via room-temperature compression tests of single-crystal micropillar specimens prepared by the focused ion beam method. Trace analysis of slip lines indicates that {110} slip occurs for the specimens investigated in the present study. Although the slip direction has not been uniquely determined, comparison of Schmid factors and yield stress values suggests that the slip direction might be <1$\overline 1 $2>, which is inconsistent with the easiest slip system {110}[001] predicted on the basis of the primitive Peierls-Nabarro model.

Compression of Single-Crystal Micropillars of the Γ Intermetallic Phase in the Fe-Zn System

2014 ◽  
Vol 922 ◽  
pp. 264-269 ◽  
Author(s):  
Masahiro Inomoto ◽  
Norihiko L. Okamoto ◽  
Haruyuki Inui
Keyword(s):  
Single Crystal ◽  
Deformation Behavior ◽  
Room Temperature ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Intermetallic Phase ◽  
Gamma Phase ◽  
Compression Tests ◽  
Slip Direction ◽  
Beam Method

The deformation behavior of the Γ (gamma) phase in the Fe-Zn system has been investigated via room-temperature compression tests of single-crystal micropillar specimens fabricated by the focused ion beam method. Trace analysis of slip lines indicates that {110} slip occurs for the specimens investigated in the present study. Although the slip direction has not been uniquely determined, the slip direction might be <111> in consideration of the crystal structure of the Γ phase (bcc).

Micropillar Compression of MoSi2 Single Crystals

2015 ◽  
Vol 1760 ◽  
Author(s):  
Satoshi Nakatsuka ◽  
Kyosuke Kishida ◽  
Haruyuki Inui
Keyword(s):  
Slip System ◽  
Room Temperature ◽  
Focused Ion Beam ◽  
Size Dependence ◽  
Ion Beam ◽  
Edge Length ◽  
Approximate Power ◽  
Micropillar Compression ◽  
Temperature Activation ◽  
Image Position

ABSTRACTDeformation behavior of MoSi2 has been studied by micropillar compressions of single crystalline specimens prepared by focused ion beam (FIB) technique as a function of crystal orientation at room temperature. Activation of the {011}<100> and {01$\overline 3$}<331> slip systems were observed in the micropillars compressed along [$\overline 1$10] and [0 15 1], respectively. The CRSS values for each slip system exhibit an approximate power law relationship with the edge length of micropillar. The {01$\overline 3$}<331> slip exhibit much stronger size-dependence than the {011}<100> slip system.

Nanocomposite Polyurethane Foams Via POSS Blends

2002 ◽  
Vol 733 ◽  
Author(s):  
Brock McCabe ◽  
Steven Nutt ◽  
Brent Viers ◽  
Tim Haddad
Keyword(s):  
High Temperature ◽  
Sample Preparation ◽  
Room Temperature ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Polyurethane Foams ◽  
Development Projects ◽  
Polymer Systems ◽  
Polyurethane Resin ◽  
Military Development

AbstractPolyhedral Oligomeric Silsequioxane molecules have been incorporated into a commercial polyurethane formulation to produce nanocomposite polyurethane foam. This tiny POSS silica molecule has been used successfully to enhance the performance of polymer systems using co-polymerization and blend strategies. In our investigation, we chose a high-temperature MDI Polyurethane resin foam currently used in military development projects. For the nanofiller, or “blend”, Cp7T7(OH)3 POSS was chosen. Structural characterization was accomplished by TEM and SEM to determine POSS dispersion and cell morphology, respectively. Thermal behavior was investigated by TGA. Two methods of TEM sample preparation were employed, Focused Ion Beam and Ultramicrotomy (room temperature).

AFM Study of Surface Morphology of Aluminum Nitride Thin Films

1995 ◽  
Vol 388 ◽  
Author(s):  
Yoshihisa Watanabe ◽  
Yoshikazu Nakamura ◽  
Shigekazu Hirayama ◽  
Yuusaku Naota
Keyword(s):  
Thin Films ◽  
Surface Morphology ◽  
Substrate Temperature ◽  
Single Crystal ◽  
Room Temperature ◽  
Ion Beam ◽  
Soda Lime ◽  
Silicon Single Crystal ◽  
Soda Lime Glass ◽  
Average Roughness

AbstractAluminum nitride (AlN) thin films have been synthesized by ion-beam assisted deposition method. Film deposition has been performed on the substrates of silicon single crystal, soda-lime glass and alumin A. the influence of the substrate roughness on the film roughness is studied. the substrate temperature has been kept at room temperature and 473K and the kinetic energy of the incident nitrogen ion beam and the deposition rate have been fixed to 0.5 keV and 0.07 nm/s, respectively. the microstructure of the synthesized films has been examined by X-ray diffraction (XRD) and the surface morphology has been observed by atomic force microscopy(AFM). IN the XRD patterns of films synthesized at both room temperature and 473K, the diffraction line indicating the alN (10*0) can be discerned and the broad peak composed of two lines indicating the a1N (00*2) and a1N (10*1) planes is also observed. aFM observations for 100 nm films reveal that (1) the surface of the films synthesized on the silicon single crystal and soda-lime glass substrates is uniform and smooth on the nanometer scale, (2) the average roughness of the films synthesized on the alumina substrate is similar to that of the substrate, suggesting the evaluation of the average roughness of the film itself is difficult in the case of the rough substrate, and (3) the average roughness increases with increasing the substrate temperature.

Fabrication of $\bf NdBa_{2}Cu_{3}O_{7-{\ninmbi \delta}}$ (110)-(001) Grain Boundary Josephson Junction by Focused Ion Beam Method

1997 ◽  
Vol 36 (Part 2, No. 6B) ◽  
pp. L764-L766 ◽  
Author(s):  
Yuuji Mizuno ◽  
Yoshihiro Ishimaru ◽  
Jianguo Wen ◽  
Youichi Enomoto
Keyword(s):  
Grain Boundary ◽  
Josephson Junction ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Beam Method

Dynamic and Quasi-Static Compressive Deformation Behaviour of Polyimide Foam at Various Elevated Temperature

2014 ◽  
Vol 566 ◽  
pp. 158-163 ◽  
Author(s):  
A. Yosimoto ◽  
Hidetoshi Kobayashi ◽  
Keitaro Horikawa ◽  
Keiko Watanabe ◽  
Kinya Ogawa
Keyword(s):  
Compressive Strength ◽  
Room Temperature ◽  
Deformation Behaviour ◽  
Testing Machine ◽  
Negative Temperature ◽  
Strain Rates ◽  
Compression Tests ◽  
Hopkinson Pressure Bar ◽  
Universal Testing ◽  
Pressure Bar

In order to clarify the effect of strain rate and test temperature on the compressive strength and energy absorption of polyimide foam, a series of compression tests for the polyimide foam with two different densities were carried out. By using three testing devices, i.e. universal testing machine, dropping weight machine and sprit Hopkinson pressure bar apparatus, we performed a series of compression tests at various strain rates (10-3~103s-1) and at several test temperatures in the range of room temperature to 280 ̊C. At over 100 s-1, the remarkable increase of flow stress was observed. The negative temperature dependence of strength was also observed.

Nanocrystals acting as Coulomb islands operating at room temperature created using a focused ion-beam process

2001 ◽  
Vol 79 (1) ◽  
pp. 120-122 ◽  
Author(s):  
T. W. Kim ◽  
D. C. Choo ◽  
J. H. Shim ◽  
M. Jung ◽  
S. O. Kang ◽  
...  
Keyword(s):  
Room Temperature ◽  
Focused Ion Beam ◽  
Ion Beam
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