Low Resistive and Low Absorptive Nitride-Based Tunnel junctions

2015 ◽  
Vol 1736 ◽  
Author(s):  
Daichi Minamikawa ◽  
Daiki Takasuka ◽  
Masataka Ino ◽  
Motoaki Iwaya ◽  
Tetsuya Takeuchi ◽  
...  

ABSTRACTWe have investigated two approaches for an alternative hole injection with a tunnel junction targeting deep UV-LEDs. One was an AlGaN-based tunnel junction. We fabricated the AlGaN-based tunnel junctions with various AlN mole fractions (0~0.2) grown on conventional blue-LEDs by MOVPE. A 7.5 nm heavily Mg-doped GaN/15 nm heavily Si-doped Al0.2Ga0.8N tunnel junction showed a large voltage drop, 5.31 V at 20 mA, under reverse bias. The other was a GaInN-based tunnel junction. We prepared Ga0.6In0.4N tunnel junctions with various thicknesses and Si doping levels grown on the blue LEDs by MOVPE. A 2 nm heavily Mg-doped Ga0.6In0.4N/3 nm heavily Si-doped GaN tunnel junction showed only 0.12 V drop at 20mA under reverse bias. Since an absorption of the thin GaInN tunnel junction was estimated to be less than 10 %, such a tunnel junction with small bandgap and thin layer thickness is a practical approach to obtain a low resistive and low absorptive hole injection in the deep UV-LEDs.

2021 ◽  
Vol 11 (9) ◽  
pp. 1466-1475
Author(s):  
Tianlong He ◽  
Ming Tian ◽  
Junhua Yin ◽  
Shuai Chen ◽  
Lingyu Wan ◽  
...  

Deposition of high-quality Si-doped crystalline AlGaN layers, especially non-polar-grown AlGaN layers, is critical and remains difficult in preparing AlGaN-based light-emitting diodes (LEDs), as the Si-doping-induced variations of crystalline structures are still under exploration. In this work, structural characterizations of Si-doped AlxGa1−xN layers were carried out by associating with examination of their carrier recombination behaviors in photoluminescence (PL) processes, to clarify the physical mechanism on how Si doping controls the formation of structural defects in AlGaN alloy. The obtained results showed that Si doping induced extrinsic shallow donor states and increased the densities of point defects like cation vacancies. On the contrary, Si doping suppressed formation of line defects like dislocations and planar defects like stacking faults with suitable doping concentration. These results may guide further improvement of UV-LEDs based on AlGaN alloy.


Author(s):  
Shyam Bharadwaj ◽  
Kevin Lee ◽  
SM Islam ◽  
Vladimir Protasenko ◽  
Huili (Grace) Xing ◽  
...  
Keyword(s):  
Deep Uv ◽  

2017 ◽  
Vol 111 (5) ◽  
pp. 051104 ◽  
Author(s):  
Yuewei Zhang ◽  
Sriram Krishnamoorthy ◽  
Fatih Akyol ◽  
Jared M. Johnson ◽  
Andrew A. Allerman ◽  
...  

2001 ◽  
Vol 693 ◽  
Author(s):  
H. Hirayama ◽  
T. Yamanaka ◽  
A. Kinoshita ◽  
K. Hiraoka ◽  
A. Hirata ◽  
...  

AbstractMg-doped quaternary InAlGaN is very attractive for use as p-side layers of 300-nm band ultraviolet (UV) light-emitting diodes (LEDs) or laser diodes (LDs), because high hole conductivity is expected to obtain for wide bandgap (~4 eV) InAlGaN with Mg-doping. We fabricated p-n junction diode consisting of Mg-doped In0.02Al0.28Ga0.70N and Si-doped Al0.25Ga0.75N, and demonstrated intense UV emission under CW current injection at room temperature. The rising voltage in I-V curve was around 3.8 V and the breakdown voltage was as high as 10 V. Single peaked intense emission was observed at 340 nm from around InAlGaN/AlGaN p-n junction area without any deep level emission. Also we found that Ni/Au electrode directly fabricated on Mg-doped InAlGaN is useful. From these results, Mg-doped InAlGaN is considered to be very attractive for use as p-side layer of UV-LEDs or LDs.


1988 ◽  
Vol 144 ◽  
Author(s):  
T. Maed ◽  
T. Ishikawa ◽  
K. Kondo

ABSTRACTWe studied doping Se into AlGaAs layers using PbSe as a dopant source for molecular beam epitaxy (MBE). Good controllability and abruptness equivalent to that of Si-doping were obtained. Se-doping was successfully applied to HEMT structures with reduced DX center concentrations. The two dimensional electron gas (2DEG) characteristics of these structures were comparable to those of Si-doped structures.


2020 ◽  
Vol 10 (9) ◽  
pp. 2171
Author(s):  
Christian J. Zollner ◽  
Abdullah S. Almogbel ◽  
Yifan Yao ◽  
Michael Wang ◽  
Michael Iza ◽  
...  
Keyword(s):  

2013 ◽  
Vol 10 (11) ◽  
pp. 1521-1524 ◽  
Author(s):  
Noritoshi Maeda ◽  
Hideki Hirayama

Author(s):  
Yusuke Tsukada ◽  
Hideki Hirayama ◽  
Masahiro Akiba ◽  
Noritoshi Maeda ◽  
Norihiko Kamata

2019 ◽  
Vol 6 (6) ◽  
pp. 1475-1481 ◽  
Author(s):  
Kyu Hyoung Lee ◽  
Min-Wook Oh ◽  
Hyun-Sik Kim ◽  
Weon Ho Shin ◽  
Kimoon Lee ◽  
...  

An improved thermoelectric figure of merit (zT) of 0.14 at 795 K was obtained in 7% Si doped InSe due to the emergence of the flat band.


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