In-situ Pair Distribution Function Study of the Growth of Supported Platinum Particles in Zeolite X

2014 ◽  
Vol 1712 ◽  
Author(s):  
Liliana M. Gámez ◽  
Oscar Resto ◽  
Maria M. Martinez-Inesta
Keyword(s):  
Distribution Function ◽  
Pair Distribution Function ◽  
High Energy ◽  
X Ray Diffraction ◽  
Zeolite X ◽  
Time Resolved ◽  
Supported Platinum ◽  
Platinum Particles ◽  
Dehydrogenation Reactions

ABSTRACTPlatinum particles supported in zeolites are used as catalysts for hydrogenation/ dehydrogenation reactions. In this study in situ high energy synchrotron X-ray diffraction was used to study the Pt particle formation under calcination and reduction conditions using time resolved pair distribution function (PDF). Because these particles grow inside the pores of zeolite X, PDF is able to give insight to unique information at the short and medium interatomic distance range that cannot be readily obtained with other techniques. Among the information obtained are the Pt atom interactions during calcination and the evolvement of the Pt particle sizes and average Pt-Pt distances during reduction.

scholarly journals Time-resolved pair distribution function analysis of disordered materials on beamlines BL04B2 and BL08W at SPring-8

2018 ◽  
Vol 25 (6) ◽  
pp. 1627-1633 ◽  
Author(s):  
Koji Ohara ◽  
Satoshi Tominaka ◽  
Hiroki Yamada ◽  
Masakuni Takahashi ◽  
Hiroshi Yamaguchi ◽  
...  
Keyword(s):  
Distribution Function ◽  
Pair Distribution Function ◽  
Structural Changes ◽  
Function Analysis ◽  
Image Data ◽  
High Energy ◽  
Disordered Materials ◽  
X Rays ◽  
Two Dimensional ◽  
Time Resolved

A dedicated apparatus has been developed for studying structural changes in amorphous and disordered crystalline materials substantially in real time. The apparatus, which can be set up on beamlines BL04B2 and BL08W at SPring-8, mainly consists of a large two-dimensional flat-panel detector and high-energy X-rays, enabling total scattering measurements to be carried out for time-resolved pair distribution function (PDF) analysis in the temperature range from room temperature to 873 K at pressures of up to 20 bar. For successful time-resolved analysis, a newly developed program was used that can monitor and process two-dimensional image data simultaneously with the data collection. The use of time-resolved hardware and software is of great importance for obtaining a detailed understanding of the structural changes in disordered materials, as exemplified by the results of commissioned measurements carried out on both beamlines. Benchmark results obtained using amorphous silica and demonstration results for the observation of sulfide glass crystallization upon annealing are introduced.

scholarly journals Exploring the origins of crystallisation kinetics in hierarchical materials using in situ X-ray diffraction and pair distribution function analysis

2020 ◽  
Vol 22 (34) ◽  
pp. 18860-18867 ◽  
Author(s):  
Matthew E. Potter ◽  
Mark E. Light ◽  
Daniel J. M. Irving ◽  
Alice E. Oakley ◽  
Stephanie Chapman ◽  
...  
Keyword(s):  
Distribution Function ◽  
Pair Distribution Function ◽  
Function Analysis ◽  
X Ray Diffraction ◽  
Crystallisation Kinetics ◽  
Total Scattering ◽  
Hierarchically Porous ◽  
X Ray ◽  
Scattering Measurements

Novel in situ synchrotron total scattering measurements probe the assembly of primary building units into templated hierarchically porous aluminophosphate catalysts, providing unique insights to understanding crystallisation kinetics.

scholarly journals In situ X-ray pair distribution function analysis of accelerated carbonation of a synthetic calcium–silicate–hydrate gel

2015 ◽  
Vol 3 (16) ◽  
pp. 8597-8605 ◽  
Author(s):  
Antoine E. Morandeau ◽  
Claire E. White
Keyword(s):  
Distribution Function ◽  
Pair Distribution Function ◽  
Calcium Silicate Hydrate ◽  
Function Analysis ◽  
High Energy ◽  
Accelerated Carbonation ◽  
X Ray ◽  
Kinetics Of Reaction ◽  
Kinetics Of

The kinetics of reaction and the local atomic structure of carbonating C–S–H gel are characterised using high-energy synchrotron radiation.

Applications of an amorphous silicon-based area detector for high-resolution, high-sensitivity and fast time-resolved pair distribution function measurements

2007 ◽  
Vol 40 (3) ◽  
pp. 463-470 ◽  
Author(s):  
Peter J. Chupas ◽  
Karena W. Chapman ◽  
Peter L. Lee
Keyword(s):  
Distribution Function ◽  
Amorphous Silicon ◽  
Pair Distribution Function ◽  
High Sensitivity ◽  
High Energy ◽  
Scattering Data ◽  
Fast Time ◽  
Large Area ◽  
Nickel Metal ◽  
Time Resolved

The application of a large-area (41 × 41 cm, 2048 × 2048 or 1024 × 1024 pixel) high-sensitivity (detective quantum efficiency > 65%) fast-readout (up to 7.5 or 30 Hz) flat-panel detector based on an amorphous silicon array system to the collection of high-energy X-ray scattering data for quantitative pair distribution function (PDF) analysis is evaluated and discussed. Data were collected over a range of exposure times (0.13 s–7 min) for benchmark PDF samples: crystalline nickel metal and amorphous silica (SiO2). The high real-space resolution of the resultant PDFs (withQmaxup to ∼40 Å−1) and the high quality of fits to data [RNi(0.13s)= 10.5%,RNi(1.3s)= 6.3%] obtained in short measurement times indicate that this detector is well suited to studies of materials disorder. Further applications of the detector to locate weakly scattering H2molecules within the porous Prussian blue system, {\rm Mn}^{\rm II}_{\,3}[CoIII(CN)6]2·xH2, and to follow thein situreduction of PtIVO2to Pt0at 30 Hz, confirm the high sensitivity of the detector and demonstrate a new potential for fast time-resolved studies.

Anisotropic atomic structure in a homogeneously deformed metallic glass

2007 ◽  
Vol 22 (2) ◽  
pp. 382-388 ◽  
Author(s):  
M.J. Kramer ◽  
R.T. Ott ◽  
D.J. Sordelet
Keyword(s):  
Distribution Function ◽  
Metallic Glass ◽  
Atomic Structure ◽  
Pair Distribution Function ◽  
High Energy ◽  
Tensile Creep ◽  
Uniaxial Tensile ◽  
X Ray Diffraction ◽  
Orientation Anisotropy ◽  
Length Changes

The anisotropic atomic structure in a Zr41.2Ti13.8Cu12.5Ni10Be22.5 metallic glass strained during uniaxial tensile creep at 598 K was studied at room temperature using high-energy x-ray diffraction. Changes in the atomic structure were examined by comparing the total scattering function [S(Q)] and the reduced pair distribution function [G(r)] of the creep to that of a companion specimen subjected to the same heat treatment only. Two-dimensional maps of the ΔS(Q) and its Fourier transformation demonstrate the distribution in the bond orientation anisotropy increases with increasing total strain. A fit of the reduced pair distribution function using a simplified two-component model suggests that the bond length changes in the deformed creep samples are not uniform.

Nanophase Evolution at Semiconductor/Electrolyte Interface in Situ Probed by Time-Resolved High-Energy Synchrotron X-ray Diffraction

Nano Letters ◽  
2010 ◽  
Vol 10 (9) ◽  
pp. 3747-3753 ◽  
Author(s):  
Yugang Sun ◽  
Yang Ren ◽  
Dean R. Haeffner ◽  
Jonathan D. Almer ◽  
Lin Wang ◽  
...  
Keyword(s):  
High Energy ◽  
X Ray Diffraction ◽  
Time Resolved ◽  
X Ray ◽  
Electrolyte Interface
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