Vector Magneto-Optical Generalized Ellipsometry on Passivated Permalloy Slanted Columnar Thin Films

2012 ◽  
Vol 1408 ◽  
Author(s):  
Daniel Schmidt ◽  
Chad Briley ◽  
Eva Schubert ◽  
Mathias Schubert
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Three Dimensional ◽  
Hysteresis Loops ◽  
Magnetic Behavior ◽  
Atomic Layer ◽  
Optical Coupling ◽  
Nanostructured Thin Film ◽  
Coupling Parameters ◽  
Columnar Thin Film

ABSTRACTVector magneto-optical generalized ellipsometry on passivated ferromagnetic permalloy slanted columnar thin films is reported. The nanostructured thin film was grown by electron-beam glancing angle deposition and subsequently coated with a thin Al2O3 layer by atomic layer deposition. Magneto-optical generalized ellipsometry data have been acquired while an external magnetic field H with constant amplitude was rotated with respect to the sample (spatial hysteresis loops). The magneto-optical coupling parameters, which are proportional to the sample magnetization M, reveal intriguing anisotropic magnetic behavior of the slanted columnar thin film. Three-dimensional graphs of the magneto-optical coupling parameters with respect to spatial hysteresis loops shown here are representative for the sample magnetization.

scholarly journals Tip-Based Nanomachining on Thin Films: A Mini Review

2021 ◽  
Author(s):  
Shunyu Chang ◽  
Yanquan Geng ◽  
Yongda Yan
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Data Storage ◽  
Three Dimensional ◽  
Maintenance Cost ◽  
Two Dimensional ◽  
Force Microscopy ◽  
Atomic Force ◽  
Current State ◽  
Two Dimensional Materials

AbstractAs one of the most widely used nanofabrication methods, the atomic force microscopy (AFM) tip-based nanomachining technique offers important advantages, including nanoscale manipulation accuracy, low maintenance cost, and flexible experimental operation. This technique has been applied to one-, two-, and even three-dimensional nanomachining patterns on thin films made of polymers, metals, and two-dimensional materials. These structures are widely used in the fields of nanooptics, nanoelectronics, data storage, super lubrication, and so forth. Moreover, they are believed to have a wide application in other fields, and their possible industrialization may be realized in the future. In this work, the current state of the research into the use of the AFM tip-based nanomachining method in thin-film machining is presented. First, the state of the structures machined on thin films is reviewed according to the type of thin-film materials (i.e., polymers, metals, and two-dimensional materials). Second, the related applications of tip-based nanomachining to film machining are presented. Finally, the current situation of this area and its potential development direction are discussed. This review is expected to enrich the understanding of the research status of the use of the tip-based nanomachining method in thin-film machining and ultimately broaden its application.

scholarly journals Reliability enhancement in thin film transistors using Hf and Al co-incorporated ZnO active channels deposited by atomic-layer-deposition

RSC Advances ◽  
2018 ◽  
Vol 8 (60) ◽  
pp. 34215-34223
Author(s):  
So-Yeong Na ◽  
Sung-Min Yoon
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Atomic Layer Deposition ◽  
Thin Film Transistors ◽  
Atomic Layer ◽  
Oxide Thin Films ◽  
Layer Deposition ◽  
Reliability Enhancement ◽  
Active Channels

Oxide thin films transistors (TFTs) with Hf and Al co-incorporated ZnO active channels prepared by atomic-layer deposition are presented.

Nanostructured organic radical cathodes from self-assembled nitroxide-containing block copolymer thin films

2015 ◽  
Vol 3 (38) ◽  
pp. 19575-19581 ◽  
Author(s):  
G. Hauffman ◽  
A. Vlad ◽  
T. Janoschka ◽  
U. S. Schubert ◽  
J.-F. Gohy
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Block Copolymer ◽  
Diblock Copolymers ◽  
Organic Radical ◽  
Nanostructured Thin Film ◽  
Self Assembled

Nanostructured thin film organic radical cathodes have been prepared from poly(styrene)-block-poly(2,2,6,6-tetramethylpiperidinyloxy-4-yl methacrylate) diblock copolymers.

Growth Behavior of Atomic-Layer-Deposited Pb(Zr,Ti)O[sub x] Thin Films on Planar Substrate and Three-Dimensional Hole Structures

2008 ◽  
Vol 155 (11) ◽  
pp. D715 ◽  
Author(s):  
Takayuki Watanabe ◽  
Susanne Hoffmann-Eifert ◽  
Cheol Seong Hwang ◽  
Rainer Waser
Keyword(s):  
Thin Films ◽  
Three Dimensional ◽  
Atomic Layer ◽  
Growth Behavior ◽  
Planar Substrate

Magnetic Anisotropy of Strained La0.7Sr0.3MnO3 Thin Films Studied by MOKE

2001 ◽  
Vol 690 ◽  
Author(s):  
M. Koubaa ◽  
A.M. Haghiri-Gosnet ◽  
P. Lecoeur ◽  
W. Prellier ◽  
B. Mercey
Keyword(s):  
Thin Films ◽  
Surface Morphology ◽  
Scaling Law ◽  
Hysteresis Loops ◽  
Magnetic Behavior ◽  
Growth Conditions ◽  
Structural Quality ◽  
Lattice Strains ◽  
Stress States

ABSTRACTThe effects of the growth conditions and the lattice strains of pulsed laser deposited (PLD) La0.7Sr0.3MnO3 (LSMO) thin films upon the magnetic behavior have been studied using magneto-optical Kerr effect (MOKE) at room temperature. First, the structural quality of the films was investigated by XRD and the surface morphology was studied using AFM. It is shown that both surface morphology and crystallinity are optimized when the target-to-substrate distance and the oxygen pressure are chosen in agreement with a PD3 scaling law. Secondly, hysteresis loops have been recorded along the [100], [110] and [001] directions and the easy directions of magnetization have been determined for both stress states, i.e. tension on SrTiO3 and compression on LaAlO3. In tensile films, the whole plane is found to be easy, whereas, in compressive films, the easy axis should be an intermediate direction between the film's plane and its normal. Moreover, tensile films deposited under optimized growth conditions exhibit the largest anisotropy coefficient (K1eff = -6.9×105 erg/cm3).

Simulation of 3D Films Deposited by Glancing Angle Deposition Using 3D-Films

2000 ◽  
Vol 616 ◽  
Author(s):  
T. Smy ◽  
D. Vick ◽  
M. J. Brett ◽  
S. K. Dew ◽  
A. T. Wu ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Three Dimensional ◽  
Thin Film Deposition ◽  
Glancing Angle Deposition ◽  
Film Deposition ◽  
Porous Thin Films ◽  
Glancing Angle ◽  
Memory Resources ◽  
Angle Deposition

AbstractA new fully three dimensional (3D) ballistic deposition simulator 3D-FILMS has been developed for the modeling of thin film deposition and structure. The simulator may be implemented using the memory resources available to workstations. In order to illustrate the capabilities of 3D-FILMS, we apply it to the growth of engineered porous thin films produced by the technique of GLancing Angle Deposition (GLAD).

On the application of a single-crystal κ-diffractometer and a CCD area detector for studies of thin films

2013 ◽  
Vol 20 (4) ◽  
pp. 644-647 ◽  
Author(s):  
Henrik Hovde Sønsteby ◽  
Dmitry Chernyshov ◽  
Michael Getz ◽  
Ola Nilsen ◽  
Helmer Fjellvåg
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Crystal Orientation ◽  
Atomic Layer ◽  
Area Detector ◽  
Layer Deposition ◽  
Crucial Information ◽  
Key Features ◽  
Set Up

A multipurpose six-axis κ-diffractometer, together with the brilliance of the ESRF light source and a CCD area detector, has been explored for studying epitaxial relations and crystallinity in thin film systems. The geometrical flexibility of the six-axis goniometer allows measurement of a large volume in reciprocal space, providing an in-depth understanding of sample crystal relationships. By a set of examples of LaAlO3thin films deposited by the atomic layer deposition technique, the possibilities of the set-up are presented. A fast panoramic scan provides determination of the crystal orientation matrices, prior to more thorough inspection of single Bragg nodes. Such information, in addition to a broadening analysis of families of single reflections, is shown to correlate well with the crystallinity, crystallite size, strain and epitaxial relationships in the thin films. The proposed set-up offers fast and easy sample mounting and alignment, along with crucial information on key features of the thin film structures.

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