Controlling microscopic friction on gold surfaces by electrochemical potential

2012 ◽  
Vol 1423 ◽  
Author(s):  
Florian Hausen ◽  
Johannes A. Zimmet ◽  
Roland Bennewitz

ABSTRACTThe nano-scale friction on crystalline gold surfaces can be systematically varied by changing the oxidation state of the surfaces through an applied electrochemical potential. We present experimental results from high-resolution friction force microscopy, where the atomic structure of the surface is reflected in lateral force maps. While the oxidation of gold surfaces always brings upon a significant increase in friction, the situation is more complex in the potential regime where only sulfate anions are adsorbed. The influence of adsorbed anions on friction depends on electrochemical potential and on normal load, demonstrating that electrochemical processes and sliding dynamics are altered in the confinement of the tip-sample contact.

Author(s):  
K. S. Kanaga Karuppiah ◽  
Sriram Sundararajan

A comparison of two lateral force calibration techniques for friction force microscopy is presented. We used methods developed by Ogletree et.al. [1] and Ruan and Bhushan [2] to measure the friction response between the atomic force microscope (AFM) probe and a silicon sample and to obtain lateral force calibration factors. The factors were used to characterize the friction behavior and interfacial shear strength of a silicon nitride (Si3N4) probe-ultra high molecular weight polyethylene (UHMWPE) interface.


2010 ◽  
Vol 81 (8) ◽  
pp. 083701 ◽  
Author(s):  
Aleksander Labuda ◽  
William Paul ◽  
Brendan Pietrobon ◽  
R. Bruce Lennox ◽  
Peter H. Grütter ◽  
...  

Author(s):  
R. Buzio ◽  
C. Boragno ◽  
F. Buatier de Mongeot ◽  
U. Valbusa

We present experimental results concerning the Friction Force Microscopy (FFM) investigation of smooth mica and Si surfaces lubricated by a model lubricant. We have studied the friction force as a function of normal load and sliding velocity, analyzing results in the framework of interfacial liquid structuring and drainage effects.


Author(s):  
B Bhushan

Atomic force microscopy/friction force microscopy (AFM/FFM) techniques are increasingly used for tribological studies of engineering surfaces at scales ranging from atomic and molecular to microscales. These techniques have been used to study surface roughness, adhesion, friction, scratching/wear, indentation, detection of material transfer and boundary lubrication and for nanofabrication/nanomachining purposes. Micro/nanotribological studies of materials of scientific and engineering interest have been conducted. Commonly measured roughness parameters are found to be scale dependent, requiring the need of scale-independent fractal parameters to characterize surface roughness. Measurement of atomic-scale friction of a freshly cleaved highly orientated pyrolytic graphite exhibited the same periodicity as that of corresponding topography. However, the peaks in friction and those in corresponding topography were displaced relative to each other. Variations in atomic-scale friction and the observed displacement have been explained by the variations in interatomic forces in the normal and lateral directions. Local variation in microscale friction is found to correspond to the local slope, suggesting that a ratchet mechanism is responsible for this variation. Directionality in the friction is observed on both micro- and macroscales which results from the surface preparation and anisotropy in surface roughness. Microscale friction is generally found to be smaller than macroscale friction as there is less ploughing contribution in microscale measurements. Microscale friction is load dependent and friction values increase with an increase in the normal load, approaching the macrofriction at contact stresses higher than the hardness of the softer material. The wear rate for single-crystal silicon is negligible below 20 μN and is much higher and remains approximately constant at higher loads. Elastic deformation at low loads is responsible for negligible wear. The mechanism of material removal on a microscale is studied. At the loads used in the study, material is removed by the ploughing mode in a brittle manner without much plastic deformation. Most of the wear debris is loose. Evolution of the wear has also been studied using AFM. Wear is found to be initiated at nanoscratches. AFM has been modified to obtain load-displacement curves and for measurement of nanoindentation hardness and Young's modulus of elasticity, with the depth of indentation as low as 1 nm. Hardness of ceramics on the nanoscale is found to be higher than that on the microscale. Ceramics exhibit significant plasticity and creep on the nanoscale. Scratching and indentation on nanoscales are powerful ways to screen for adhesion and resistance to deformation of ultra-thin films. Detection of material transfer on the nanoscale is possible with AFM. Boundary lubrication studies and measurement of lubricant-film thickness with a lateral resolution on a nanoscale have been conducted using AFM. Self-assembled monolayers and chemically bonded lubricant films with a mobile fraction are superior in wear resistance. Friction and wear on micro- and nanoscales at low loads have been found to be generally smaller compared to that at macroscales. Therefore, micro/nanotribological studies may help define the regimes for ultra-low friction and near-zero wear.


Friction ◽  
2021 ◽  
Author(s):  
Deliang Zhang ◽  
Yuge Zhang ◽  
Qiang Li ◽  
Mingdong Dong

AbstractLoad-dependent friction hysteresis is an intriguing phenomenon that occurs in many materials, where the friction measured during unloading is larger than that measured during loading for a given normal load. However, the mechanism underlying this behavior is still not well understood. In this work, temperature-controlled friction force microscopy was utilized to explore the origin of friction hysteresis on exfoliated monolayer graphene. The experimental observations show that environmental adsorbates from ambient air play an important role in the load dependence of friction. Specifically, the existence of environmental adsorbates between the tip and graphene surface gives rise to an enhanced tip-graphene adhesion force, which leads to a positive friction hysteresis where the friction force is larger during unloading than during loading. In contrast to positive friction hysteresis, a negative friction hysteresis where the friction force is smaller during unloading than during loading is observed through the removal of the environmental adsorbates upon in situ annealing. It is proposed that the measured friction hysteresis originates from the hysteresis in the contact area caused by environmental adsorbates between the tip and graphene. These findings provide a revised understanding of the friction hysteresis in monolayer graphene in terms of environmental adsorbates.


1995 ◽  
Vol 117 (2) ◽  
pp. 244-249 ◽  
Author(s):  
C.-J. Lu ◽  
Zhaoguo Jiang ◽  
D. B. Bogy ◽  
T. Miyamoto

In a Lateral Force Microscope (LFM), appropriate spring constants of the tip assembly are essential for obtaining proper normal loads for wear or scratch tests and good lateral force signals. We developed a new tip assembly design for which the lateral and normal springs can be changed independently. It was installed on a LFM where two optical heads are used to detect the lateral and normal deflections of the tip assembly for simultaneous measurements of the surface topography and friction force. Reliable calibration procedures for the LFM are presented. The LFM was used to measure the lateral forces in wear tests under various normal forces for thin film magnetic disks with and without a carbon overcoat. The friction coefficient is constant in the load range where there is no wear and increases with normal load after the tip starts to damage the surface. The carbon-coated disk has a lower friction coefficient and can support larger normal loads without wear.


Author(s):  
J.L. Batstone ◽  
J.M. Gibson ◽  
Alice.E. White ◽  
K.T. Short

High resolution electron microscopy (HREM) is a powerful tool for the determination of interface atomic structure. With the previous generation of HREM's of point-to-point resolution (rpp) >2.5Å, imaging of semiconductors in only <110> directions was possible. Useful imaging of other important zone axes became available with the advent of high voltage, high resolution microscopes with rpp <1.8Å, leading to a study of the NiSi2 interface. More recently, it was shown that images in <100>, <111> and <112> directions are easily obtainable from Si in the new medium voltage electron microscopes. We report here the examination of the important Si/Si02 interface with the use of a JEOL 4000EX HREM with rpp <1.8Å, in a <100> orientation. This represents a true structural image of this interface.


Sign in / Sign up

Export Citation Format

Share Document