New designs of hydrophobic and mesostructured Ultra Low k materials with isolated mesopores

2011 ◽  
Vol 1335 ◽  
Author(s):  
Anthony Grunenwald ◽  
André Ayral ◽  
Pierre Antoine Albouy ◽  
Vincent Rouessac ◽  
David Jauffres ◽  
...  
Keyword(s):  
Grazing Incidence ◽  
Face Centered Cubic ◽  
X Ray Diffraction ◽  
X Ray ◽  
In Situ Xrd ◽  
X Ray Scattering ◽  
Face Centered ◽  
Film Porosity ◽  
Low K

ABSTRACTIn this work, hydrophobic mesostructured organosilica thin films, exhibiting isolated mesopores (~ 7 nm), have been successfully deposited by spin-coating using different polystyrene-block-polyethylene oxide copolymers (PS-b-PEO) as structure-directing agents and methyltriethoxysilane (MTES) as organosilica precursor. Different ordered mesostructures (Face Centered Cubic, 2D or 3D Hexagonal and Body Centered Cubic) can be achieved by controlling different synthesis parameters. X-Ray Diffraction (XRD) and Grazing Incidence Small Angle X-Ray Scattering (GISAXS) techniques were used to investigate the mesostructure evolution through thermal and UV treatments. Swelling and shrinkage were evidenced by in-situ XRD and X-Ray Reflectivity measurements during the thermal removal of the meso-templates. Infrared spectroscopy and 29Si NMR were additionally used to investigate the microstructure evolution. The film porosity was estimated thanks to Ellipsometry Porosimetry (EP). Correlation between mechanical properties through nanoindentation measurements and the mesostructure ordering is discussed as well as assessments of the dielectric constant k by mercury contact probe.

In situ high-temperature X-ray diffraction characterization of silver sulfide, Ag2S

2011 ◽  
Vol 26 (2) ◽  
pp. 114-118 ◽  
Author(s):  
Thomas Blanton ◽  
Scott Misture ◽  
Narasimharao Dontula ◽  
Swavek Zdzieszynski
Keyword(s):  
High Temperature ◽  
Structure Refinement ◽  
Silver Sulfide ◽  
Rietveld Analysis ◽  
Face Centered Cubic ◽  
X Ray Diffraction ◽  
X Ray ◽  
Face Centered ◽  
Fcc Phase

Silver sulfide, Ag2S, is most commonly known as the tarnish that forms on silver surfaces due to the exposure of silver to hydrogen sulfide. The mineral acanthite is a monoclinic crystalline form of Ag2S that is stable to 176°C. Upon heating above 176°C, there is a phase conversion to a body-centered cubic (bcc) form referred to as argentite. Further heating above 586°C results in conversion of the bcc phase to a face-centered cubic (fcc) phase polymorph. Both high-temperature cubic phases are solid-state silver ion conductors. In situ high-temperature X-ray diffraction was used to better understand the polymorphs of Ag2S on heating. The existing powder diffraction file (PDF) entries for the high-temperature fcc polymorph are of questionable reliability, prompting a full Rietveld structure refinement of the bcc and fcc polymorphs. Rietveld analysis was useful to show that the silver atoms are largely disordered and can only be described by unreasonably large isotropic displacement parameters or split site models.

scholarly journals Structure of a monolayer of molecular rotors on aqueous subphase from grazing-incidence X-ray diffraction

2018 ◽  
Vol 115 (38) ◽  
pp. 9373-9378 ◽  
Author(s):  
Jiří Kaleta ◽  
Jin Wen ◽  
Thomas F. Magnera ◽  
Paul I. Dron ◽  
Chenhui Zhu ◽  
...  
Keyword(s):  
Grazing Incidence ◽  
Molecular Rotors ◽  
Triangular Grid ◽  
X Ray Diffraction ◽  
X Ray ◽  
Aqueous Subphase ◽  
Preparation Conditions ◽  
X Ray Scattering ◽  
A Minor

In situ grazing-incidence X-ray scattering shows that a monolayer of artificial rod-shaped dipolar molecular rotors produced on the surface of an aqueous subphase in a Langmuir trough has a structure conducive to a 2D ferroelectric phase. The axes of the rotors stand an average of 0.83 nm apart in a triangular grid, perpendicular to the surface within experimental error. They carry 2,3-dichlorophenylene rotators near rod centers, between two decks of interlocked triptycenes installed axially on the rotor axle. The analysis is based first on simultaneous fitting of observed Bragg rods and second on fitting the reflectivity curve with only three adjustable parameters and the calculated rotor electron density, which also revealed the presence of about seven molecules of water near each rotator. Dependent on preparation conditions, a minor and variable amount of a different crystal phase may also be present in the monolayer.

Hydrogen-induced structural transformation of AuCu nanoalloys probed by synchrotron X-ray diffraction techniques

Nanoscale ◽  
2014 ◽  
Vol 6 (8) ◽  
pp. 4067-4071 ◽  
Author(s):  
M. Yamauchi ◽  
K. Okubo ◽  
T. Tsukuda ◽  
K. Kato ◽  
M. Takata ◽  
...  
Keyword(s):  
Structural Transformation ◽  
Hydrogen Atmosphere ◽  
Face Centered Cubic ◽  
X Ray Diffraction ◽  
X Ray ◽  
Face Centered

In situ X-ray diffraction measurements reveal that the transformation of a AuCu nanoalloy from a face-centered-cubic to an L10 structure is accelerated under a hydrogen atmosphere.

In Situ X-Ray Diffraction Analysis of Face-Centered Cubic Metals Deformed at Room and Cryogenic Temperatures

2019 ◽  
Vol 28 (8) ◽  
pp. 4658-4666
Author(s):  
Marcel Tadashi Izumi ◽  
John Jairo Hoyos Quintero ◽  
Maicon Rogerio Crivoi ◽  
Milene Yumi Maeda ◽  
Ricardo Sanson Namur ◽  
...  
Keyword(s):  
Diffraction Analysis ◽  
Face Centered Cubic ◽  
Cryogenic Temperatures ◽  
X Ray Diffraction ◽  
X Ray ◽  
Cubic Metals ◽  
Face Centered

Structural Characterization of Multilayers Using X-ray Diffraction

1991 ◽  
Vol 239 ◽  
Author(s):  
B. M. Clemens ◽  
J-A. Bain ◽  
A. P. Payne ◽  
T. C. Hufnagel ◽  
S. M. Brennan
Keyword(s):  
Grazing Incidence ◽  
Sputter Deposition ◽  
X Ray Diffraction ◽  
Deposition Pressure ◽  
X Ray ◽  
X Ray Scattering ◽  
Multilayered Materials ◽  
Cr System

ABSTRACTStructural deviations from ideal layering of bulk constituents can have dramatic effects on the properties of multilayered materials. We discuss three examples of the use of x-ray diffraction in non-standard geometries to examine these effects. In Mo/Ni multilayers, we use asymmetric diffraction and grazing incidence x-ray scattering (GIXS) to deduce the strain and intermixing. We find that coherency stresses between the BCC Mo and FCC Ni planes play a major role. In the Fe/Cr system, we use rocking curves and asymmetric scans about the small angle superlattice lines to investigate the nature and extent of layer roughness. We find that conformai roughness dominates our best samples, while non-conformal roughness increases with sputter deposition pressure. In the Gd/Co system, we use in-situ GIXS to investigate amorphization reaction during deposition. We find a strong diffusional asymmetry and rapid reaction during growth.

In-Situ Observation of The Initial Stages of Co (0001) Epitaxy on Pt (111) Using Grazing Incidence X-Ray Diffraction

1993 ◽  
Vol 312 ◽  
Author(s):  
James A. Bain ◽  
Bruce M. Clemens ◽  
Sean Brennan
Keyword(s):  
Early Stage ◽  
Stacking Faults ◽  
Grazing Incidence ◽  
In Situ Observation ◽  
X Ray Diffraction ◽  
X Ray ◽  
Incoherent Interface ◽  
X Ray Scattering ◽  
Fault Density

AbstractThe heteropitaxial growth of (111) Pt on (0001) sapphire and of (0001) Co on (111) Pt on (0001) sapphire has been observed in-situ using grazing incidence x-ray scattering (GIXS). The in-plane lattice parameters of the Pt and Co phases have been measured as a function of film thickness in the regime from two monolayers to 200 monolayers, Relaxation of elastic strain with thickness has been quantified. X-ray reflections consistent with stacking faults in the Co films have been observed and monitored as a function of thickness, giving a measure of the stacking fault density. A distinct Co phase was observed at two monolayers of Co on a thick Pt layer, indicating an incoherent interface between the Co and Pt, even at this very early stage of deposition.

scholarly journals TheIn situgrowth of Nanostructures on Surfaces (INS) endstation of the ESRF BM32 beamline: a combined UHV–CVD and MBE reactor forin situX-ray scattering investigations of growing nanoparticles and semiconductor nanowires

2015 ◽  
Vol 22 (3) ◽  
pp. 688-700 ◽  
Author(s):  
V. Cantelli ◽  
O. Geaymond ◽  
O. Ulrich ◽  
T. Zhou ◽  
N. Blanc ◽  
...  
Keyword(s):  
Silicon Nanowires ◽  
Grazing Incidence ◽  
High Energy ◽  
Semiconductor Nanowires ◽  
Gas Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

This paper presents the upgraded `In situ growth of Nanoscructures on Surfaces' (INS) endstation of the InterFace beamline IF-BM32 at the European Synchrotron Radiation Facility (ESRF). This instrument, originally designed to investigate the structure of clean surfaces/interfaces/thin-films by surface X-ray diffraction, has been further developed to investigate the formation and evolution of nanostructures by combining small- and wide-angle X-ray scattering methodologies,i.e.grazing-incidence small-angle X-ray scattering (GISAXS) and grazing-incidence X-ray diffraction (GIXD). It consists of a UHV chamber mounted on az-axis type goniometer, equipped with residual gas analysis, reflection high-energy electron diffraction (RHEED) and Auger electron spectroscopy (AES) to complete the X-ray scattering investigations. The chamber has been developed so as up to eight sources of molecular beam epitaxy (MBE) can be simultaneously mounted to elaborate the nanostructures. A chemical vapor deposition (CVD) set-up has been added to expand the range of growing possibilities, in particular to investigatein situthe growth of semiconductor nanowires. This setup is presented in some detail, as well as the firstin situX-ray scattering measurements during the growth of silicon nanowires.

New Structure of CTAB Templated Silica Films as revealed by GISAXS coupled to HRTEM

2000 ◽  
Vol 628 ◽  
Author(s):  
Sophie Besson ◽  
Catherine Jacquiod ◽  
Thierry Gacoin ◽  
André Naudon ◽  
Christian Ricolleau ◽  
...  
Keyword(s):  
Cetyltrimethylammonium Bromide ◽  
Grazing Incidence ◽  
Hexagonal Structure ◽  
X Ray Diffraction ◽  
Electronic Microscopy ◽  
Silica Films ◽  
X Ray ◽  
X Ray Scattering ◽  
Hexagonal Arrangement ◽  
Spherical Micelles

ABSTRACTA microstructural study on surfactant templated silica films is performed by coupling traditional X-Ray Diffraction (XRD) and Transmission Electronic Microscopy (TEM) to Grazing Incidence Small Angle X-Ray Scattering (GISAXS). By this method it is shown that spin-coating of silicate solutions with cationic surfactant cetyltrimethylammonium bromide (CTAB) as a templating agent provides 3D hexagonal structure (space group P63/mmc) that is no longer compatible with the often described hexagonal arrangement of tubular micelles but rather with an hexagonal arrangement of spherical micelles. The extent of the hexagonal ordering and the texture can be optimized in films by varying the composition of the solution.

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