Study of Structural Defects in CdZnTe Crystals by High Resolution Electron Microscopy

2011 ◽  
Vol 1341 ◽  
Author(s):  
A. Hossain ◽  
A. E. Bolotnikov ◽  
G. S. Camarda ◽  
Y. Cui ◽  
R. Gul ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
High Resolution ◽  
High Resolution Electron Microscopy ◽  
Scanning Transmission Electron Microscope ◽  
Structural Defects ◽  
Transmission Electron ◽  
Resolution Electron ◽  
Scanning Transmission ◽  
Infrared Microscope

ABSTRACTWe investigated defects in CdZnTe crystals produced from various conditions and their impact on fabricated devices. In this study, we employed transmission and scanning transmission electron microscope (TEM and STEM), because defects at the nano-scale are not observed readily under an optical or infrared microscope, or by most other techniques. Our approach revealed several types of defects in the crystals, such as low-angle boundaries, dislocations and precipitates, which likely are major causes in degrading the electrical properties of CdZnTe devices, and eventually limiting their performance.

Unstained Biological Specimens in High Resolution Electron Microscopy

1974 ◽  
Vol 32 ◽  
pp. 234-235
Author(s):  
M. K. Lamvik ◽  
J. M. Pullman ◽  
A. V. Crewe
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Heavy Atom ◽  
High Resolution Electron Microscopy ◽  
Scanning Transmission Electron Microscope ◽  
Dark Field ◽  
Structural Studies ◽  
Transmission Electron ◽  
Resolution Electron ◽  
Scanning Transmission

Negative staining and high resolution shadowing have been extensively used for structural studies in electron microscopy. However, these techniques cover the specimen with a layer of heavy salt or metal, and hence do not allow determination of true mass distribution or localization of specific sites using heavy atom markers. A prerequisite for such structural studies is an examination of unstained specimens. For thin specimens dark field microscopy must be used to obtain adequate contrast. The scanning transmission electron microscope is preferred for such studies since elastic, energyloss, and unscattered electrons can be recorded and analyzed quantitatively to form images with a minimum of beam-induced damage.

scholarly journals Vitrification of Y zeolite and its effects on HREM images

1986 ◽  
Vol 44 ◽  
pp. 774-775
Author(s):  
R. Csencsits
Keyword(s):  
Electron Microscopy ◽  
Computer Simulation ◽  
Electron Microscope ◽  
High Resolution ◽  
High Resolution Electron Microscopy ◽  
Systematic Investigation ◽  
Y Zeolite ◽  
Y Zeolites ◽  
Transmission Electron ◽  
Resolution Electron

High resolution electron microscopy (HREM) is a valuable technique for studying catalytic zeolite systems because it gives direct information about the structure and defects present in the structure. The difficulty with doing an HREM study on zeolites is that they become amorphous under electron irradiation. This work is a systematic investigation of the damage of Y zeolites in the transmission electron microscope (TEM); the goals of this study are to determine the mechanism for electron damage and to access the effects of damage in Y zeolites on their HREM images using computer simulation.

Defect Structures in Al-Ni-Rh Crystalline Approximants Studied by HREM and HAADF Techniques

2007 ◽  
Vol 561-565 ◽  
pp. 1353-1356 ◽  
Author(s):  
Wei Sun ◽  
Y.H. Chen ◽  
J.P. Wang ◽  
Z. Zhang
Keyword(s):  
Electron Microscopy ◽  
Structural Characteristics ◽  
Symmetry Plane ◽  
High Resolution Electron Microscopy ◽  
Dark Field ◽  
Structural Defects ◽  
Transmission Electron ◽  
Resolution Electron ◽  
Scanning Transmission ◽  
Annular Dark Field

By means of a combination of high-resolution electron microscopy (HREM) and high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) techniques, we have directly revealed that periodic arrangements in different manners for flattened hexagons constructed with atom columnar clusters can form two Al-Ni-Rh crystalline approximant phases. In contrast to periodic arrangements of flattened hexagons, configurations and distributions of various defects in these structurally-complicated alloy phases have been examined and their structural characteristics discussed. HREM observations clearly show that structural defects in Al-Ni-Rh crystalline approximants are of phason type and they are correlated with incorrect arrangements of atom columnar clusters. The distribution of high density planar defects can destroy the long-range periodicity in at least one direction in the pseudo decagonal symmetry plane. By means of the HAADF-STEM imaging technique, the existence of ill-formed atom columnar clusters in the core area of a linear defect, which is usually not visible in HREM observations, has been clearly revealed.

Electron Beam-Induced Nano-Deposition Using a Transmission Electron Microscope

2005 ◽  
Vol 480-481 ◽  
pp. 129-132 ◽  
Author(s):  
Masayuki Shimojo ◽  
Kazutaka Mitsuishi ◽  
M. Tanaka ◽  
M. Song ◽  
Kazuo Furuya
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
High Resolution Electron Microscopy ◽  
Scanning Transmission Electron Microscope ◽  
Beam Position ◽  
Nano Crystalline ◽  
Transmission Electron ◽  
Resolution Electron ◽  
Scanning Transmission

Nanometre-sized structures were fabricated by electron beam-induced deposition in a scanning transmission electron microscope. A small amount of metal-organic gases, W(CO)6 and dimethyl acetylacetonato gold, were introduced near a substrate in the chamber of the microscope. The gas was decomposed by the irradiation of focused electron beams and nanometre-sized deposits containing W or Au were produced. Moving the beam position enables us to produce structures with a variety of shapes. High-resolution electron microscopy observation revealed that the structures consisted of nano-crystalline and amorphous parts.

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