Epitaxial Graphenes on Silicon Carbide

MRS Bulletin ◽  
2010 ◽  
Vol 35 (4) ◽  
pp. 296-305 ◽  
Author(s):  
Phillip N. First ◽  
Walt A. de Heer ◽  
Thomas Seyller ◽  
Claire Berger ◽  
Joseph A. Stroscio ◽  
...  

AbstractThis article reviews the materials science of graphene grown epitaxially on the hexagonal basal planes of SiC crystals and progress toward the deterministic manufacture of graphene devices. We show that the growth of epitaxial graphene on Si-terminated SiC(0001) differs from growth on the C-terminated SiC(0001) surface, resulting in, respectively, strong and weak coupling to the substrate and to successive graphene layers. Monolayer epitaxial graphene on either surface displays the expected electronic structure and transport characteristics of graphene, but the non-graphitic stacking of multilayer graphene on SiC(0001) determines an electronic structure much different from that of graphitic multilayers on SiC(0001). This materials system is rich in subtleties, and graphene grown on the two polar faces of SiC differs in important ways, but all of the salient features of ideal graphene are found in these epitaxial graphenes, and wafer-scale fabrication of multi-GHz devices already has been achieved.

2009 ◽  
Vol 23 (12n13) ◽  
pp. 2665-2666
Author(s):  
M. POTEMSKI

The results of spectroscopic (magneto-transmission and Raman scattering) studies1–8 of multilayers of carbon which are thermally decomposed from carbon-terminated surface of silicon carbide, and of thin layers of highly oriented pyrolytic and natural graphite were presented. Those carbon multilayers on silicon carbide which are not directly affected by the SiC / C interface and which in consequence are nearly charge neutral show the magneto-optical properties identical with the properties characteristic of a single graphite sheet, graphene. Inter Landau level transitions in this multilayer graphene have been studied in a wide spectral range from far-infrared to almost visible region. The dispersion relations of electronic states are found to reflect the form of the Dirac cone with almost perfect electron-hole symmetry and only weak deviations from linearity at high energies. Cyclotron resonance transition in multilayer graphene can be observed in magnetic fields down to 40 mT, and its width is practically independent on temperature up to 300 K. Such parameters as carrier mobility and minimal conductivity as well as the possibility to probe the immediate vicinity of the Dirac point were evaluated and discussed in detail. For comparison, the magneto-optical properties of thin layers of bulk graphite were also reported. The Dirac like electronic dispersion relations are also found in these systems, but only in the vicinity of the particular (H) point of the Brillouin zone. In general, the measured spectra are, however, more complex and reflect the three-dimensional character of graphene layers with Bernal stacking. Note from Publisher: This article contains the abstract only.


2010 ◽  
Vol 645-648 ◽  
pp. 603-606 ◽  
Author(s):  
Jonas Röhrl ◽  
Martin Hundhausen ◽  
Florian Speck ◽  
Thomas Seyller

The phonon frequencies of epitaxial graphene on silicon carbide (SiC) depend on mechanical strain and charge transfer from the substrate to the epitaxial layer. Strain and doping depend on the preparation process and on the number of graphene layers. We measured the phonon frequencies by Raman spectroscopy and compare the results between epitaxial layers fabricated by high temperature annealing and by hydrogen intercalation of the covalently bound graphene layer of the 6 p 3 6 p 3 reconstructed SiC surface. Only the latter graphene layer shows tensile strain, which can partly be explained by lattice mismatch between substrate and epitaxial graphene.


2007 ◽  
Vol 99 (12) ◽  
Author(s):  
F. Varchon ◽  
R. Feng ◽  
J. Hass ◽  
X. Li ◽  
B. Ngoc Nguyen ◽  
...  

Author(s):  
A. Bostwick ◽  
E. Rotenberg ◽  
J. McChesney ◽  
T. Ohta ◽  
T. Seyller ◽  
...  

2020 ◽  
Vol 29 (5) ◽  
pp. 846-852
Author(s):  
Michael D. Pedowitz ◽  
Soaram Kim ◽  
Daniel I. Lewis ◽  
Balaadithya Uppalapati ◽  
Digangana Khan ◽  
...  

2012 ◽  
Vol 111 (11) ◽  
pp. 114307 ◽  
Author(s):  
K. Grodecki ◽  
J. A. Blaszczyk ◽  
W. Strupinski ◽  
A. Wysmolek ◽  
R. Stępniewski ◽  
...  

2018 ◽  
Vol 98 (15) ◽  
Author(s):  
Adriana Vela ◽  
M. V. O. Moutinho ◽  
F. J. Culchac ◽  
P. Venezuela ◽  
Rodrigo B. Capaz

2010 ◽  
Vol 97 (25) ◽  
pp. 252101 ◽  
Author(s):  
Wei Pan ◽  
Stephen W. Howell ◽  
Anthony Joseph Ross ◽  
Taisuke Ohta ◽  
Thomas A. Friedmann

2012 ◽  
Vol 3 ◽  
pp. 345-350 ◽  
Author(s):  
Carla Bittencourt ◽  
Adam P Hitchock ◽  
Xiaoxing Ke ◽  
Gustaaf Van Tendeloo ◽  
Chris P Ewels ◽  
...  

We demonstrate that near-edge X-ray-absorption fine-structure spectra combined with full-field transmission X-ray microscopy can be used to study the electronic structure of graphite flakes consisting of a few graphene layers. The flake was produced by exfoliation using sodium cholate and then isolated by means of density-gradient ultracentrifugation. An image sequence around the carbon K-edge, analyzed by using reference spectra for the in-plane and out-of-plane regions of the sample, is used to map and spectrally characterize the flat and folded regions of the flake. Additional spectral features in both π and σ regions are observed, which may be related to the presence of topological defects. Doping by metal impurities that were present in the original exfoliated graphite is indicated by the presence of a pre-edge signal at 284.2 eV.


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