scholarly journals Use of Area Array Detector for X-Ray Fluorescence Holography Allows Simultaneous Recording of the Full Hologram without Sacrificing Angular Accuracy

MRS Bulletin ◽  
2001 ◽  
Vol 26 (6) ◽  
pp. 432-432
Author(s):  
Steffen Kaldor
Keyword(s):  
Simultaneous Recording ◽  
Array Detector ◽  
X Ray ◽  
Area Array

scholarly journals In-situ diffraction experiments at the Photon Factory MX beamlines

2014 ◽  
Vol 70 (a1) ◽  
pp. C500-C500
Author(s):  
Yusuke Yamada ◽  
Naohiro Matsugaki ◽  
Masahiko Hiraki ◽  
Ryuichi Kato ◽  
Toshiya Senda
Keyword(s):  
Gas Flow ◽  
Active Area ◽  
Array Detector ◽  
Data Sets ◽  
Diffraction Experiment ◽  
X Ray ◽  
Photon Factory ◽  
Large Active Area ◽  
In Situ Diffraction

Crystallization trial is one of the most important but time-consuming steps in macromolecular crystallography. Once a crystal appears in a certain crystallization condition, the crystal is typically harvested from the crystallization drop, soaked into a cryoprotection buffer, flash-cooled with a liquid nitrogen or cold gas flow and finally evaluated its diffraction quality by an X-ray beam. During these long process, crystal may be damaged and the result from the diffraction experiment does not necessarily reflect a nature of the crystal. On in-situ diffraction experiment, where a crystal in a crystallization drop is directly irradiated to an X-ray beam, a diffraction image from a crystal without any external factors such as harvesting and cryoprotection and, as a result, a nature of crystal can be evaluated quickly. In the Photon Factory, a new table-top diffractometer for in-situ diffraction experiments has been developed. It consists of XYZ translation stages with a plate handler, on-axis viewing system with a large numeric aperture and a plate rack where ten crystallization plates can be placed. These components sit on a common plate and it is placed on the existing diffractometer table in the beamline endstation. The CCD detector with a large active area and a pixel array detector with a small active area are used for acquiring diffraction images from crystals. Dedicated control software and user interface were also developed. Since 2014, user operation of the new diffractometer was started and in-situ diffraction experiments were mainly performed for evaluations of crystallization plates from a large crystallization screening project in our facility. BL-17A [1], one of micro-focus beamlines at the Photon Factory, is planned to be upgraded in March 2015. With this upgrade, a new diffractometer, which has a capability to handle a crystallization plate, will be installed so that diffraction data sets from crystals in crystallization drop can be collected.

scholarly journals X-ray transmission grating spectrometer with CCD detector for laser plasma studies

1991 ◽  
Vol 9 (2) ◽  
pp. 579-591 ◽  
Author(s):  
L. Pína ◽  
H. Fiedorowicz ◽  
M. O. Koshevoi ◽  
A. A. Rupasov ◽  
B. Rus ◽  
...  
Keyword(s):  
Laser Plasma ◽  
Dynamic Range ◽  
High Sensitivity ◽  
Array Detector ◽  
Charge Coupled Device ◽  
X Ray ◽  
Transmission Grating ◽  
Hot Plasma ◽  
Ccd Detector ◽  
Wet Processing

A program is under way to develop methods and instrumentation based on charge-coupled device (CCD) sensors for hot plasma diagnostics. We have developed a new X-ray spectrometer in which a freestanding X-ray transmission grating is coupled to a CCD linear array detector with electronic digitized readout replacing film and its wet processing. This instrument measures time-integrated pulsed X-ray spectra with moderate spectral resolution (δλ ≤ 0.6 nm) over a broad spectral range (0.3–2 keV) with high sensitivity, linearity, and large dynamic range. The performance of the device was tested using laser plasma as the X-ray source.

Characterization of a prototype pixel array detector (PAD) for use in microsecond framing time-resolved X-ray diffraction studies

1997 ◽  
Vol 44 (3) ◽  
pp. 950-956 ◽  
Author(s):  
S.L. Barna ◽  
J.A. Shepherd ◽  
M.W. Tate ◽  
R.L. Wixted ◽  
E.F. Eikenberry ◽  
...  
Keyword(s):  
Array Detector ◽  
X Ray Diffraction ◽  
Time Resolved ◽  
X Ray ◽  
Pixel Array ◽  
Pixel Array Detector

Impact of Reprocessing Technique on First Level Interconnects of Pb-Free to SnPb Reballed Area Array Flip Chip Devices

2014 ◽  
Vol 2014 (1) ◽  
pp. 000112-000116
Author(s):  
Joelle Arnold ◽  
Steph Gulbrandsen ◽  
Nathan Blattau
Keyword(s):  
Computer Tomography ◽  
Damage Accumulation ◽  
Flip Chip ◽  
Ball Grid Array ◽  
Acoustic Microscopy ◽  
Eutectic Solder ◽  
X Ray ◽  
Area Array ◽  
Solder Balls ◽  
Commercial Off The Shelf

The risk of damage caused by reballing SnPb eutectic solder balls onto a commercial off-the-shelf (COTS) active flip chip with a ball grid array (BGA) of SAC305 was studied. The effects of reballing performed by five different reballers were examined and compared. The active flip chip device selected included manufacturer specified resistance between eight (8) differential port pairs. The path resistance between these pins following reballing, as compared to an unreballed device, was used to assess damage accumulation in the package. 2-dimensional x-ray microscopy, acoustic microscopy, and x-ray computer tomography were also used to characterize the effects of reballing. These studies indicated that no measureable damage was incurred by the reballing process, implying that reballed devices should function as well as non-reballed devices in the same application.

scholarly journals Development of a fast pixel array detector for use in microsecond time-resolved x-ray diffraction

1995 ◽  
Author(s):  
Sandor L. Barna ◽  
John A. Shepherd ◽  
Robert L. Wixted ◽  
Mark W. Tate ◽  
Brian G. Rodricks ◽  
...  
Keyword(s):  
Array Detector ◽  
X Ray Diffraction ◽  
Time Resolved ◽  
X Ray ◽  
Pixel Array ◽  
Pixel Array Detector

In situ time-resolved X-ray diffraction of tobermorite formation process under hydrothermal condition: Influence of reactive al compound

2011 ◽  
Vol 26 (2) ◽  
pp. 134-137 ◽  
Author(s):  
K. Matsui ◽  
A. Ogawa ◽  
J. Kikuma ◽  
M. Tsunashima ◽  
T. Ishikawa ◽  
...  
Keyword(s):  
Hydrothermal Reaction ◽  
High Energy ◽  
Saturated Steam ◽  
Array Detector ◽  
Time Interval ◽  
X Rays ◽  
X Ray Diffraction ◽  
Formation Reaction ◽  
X Ray

Hydrothermal formation reaction of tobermorite in the autoclaved aerated concrete (AAC) process has been investigated by in situ X-ray diffraction. High-energy X-rays from a synchrotron radiation source in combination with a newly developed autoclave cell and a photon-counting pixel array detector were used. XRD measurements were conducted in a temperature range 100–190°C throughout 12 h of reaction time with a time interval of 4.25 min under a saturated steam pressure. To clarify the tobermorite formation mechanism in the AAC process, the effect of Al addition on the tobermorite formation reaction was studied. As intermediate phases, non-crystalline calcium silicate hydrate (C-S-H), hydroxylellestadite (HE), and katoite (KA) were clearly observed. Consequently, it was confirmed that there were two reaction pathways via C-S-H and KA in the tobermorite formation reaction of Al containing system. In addition, detailed information on the structural changes during the hydrothermal reaction was obtained.

Silicon array detector system for high-rate, low-noise X-ray spectroscopy

1999 ◽  
Vol 46 (4) ◽  
pp. 886-889 ◽  
Author(s):  
B.A. Ludewigt ◽  
B. Krieger ◽  
D. Lindstrom ◽  
M.R. Maier ◽  
M. Rutgersson ◽  
...  
Keyword(s):  
Low Noise ◽  
Detector System ◽  
High Rate ◽  
Array Detector ◽  
X Ray

The XFM beamline at the Australian Synchrotron

2020 ◽  
Vol 27 (5) ◽  
pp. 1447-1458 ◽  
Author(s):  
Daryl L. Howard ◽  
Martin D. de Jonge ◽  
Nader Afshar ◽  
Chris G. Ryan ◽  
Robin Kirkham ◽  
...  
Keyword(s):  
Materials Science ◽  
Energy Detection ◽  
Array Detector ◽  
X Rays ◽  
X Ray Diffraction ◽  
High Definition ◽  
Large Area ◽  
X Ray ◽  
Diffraction Microscopy ◽  
System Time

The X-ray fluorescence microscopy (XFM) beamline is an in-vacuum undulator-based X-ray fluorescence (XRF) microprobe beamline at the 3 GeV Australian Synchrotron. The beamline delivers hard X-rays in the 4–27 keV energy range, permitting K emission to Cd and L and M emission for all other heavier elements. With a practical low-energy detection cut-off of approximately 1.5 keV, low-Z detection is constrained to Si, with Al detectable under favourable circumstances. The beamline has two scanning stations: a Kirkpatrick–Baez mirror microprobe, which produces a focal spot of 2 µm × 2 µm FWHM, and a large-area scanning `milliprobe', which has the beam size defined by slits. Energy-dispersive detector systems include the Maia 384, Vortex-EM and Vortex-ME3 for XRF measurement, and the EIGER2 X 1 Mpixel array detector for scanning X-ray diffraction microscopy measurements. The beamline uses event-mode data acquisition that eliminates detector system time overheads, and motion control overheads are significantly reduced through the application of an efficient raster scanning algorithm. The minimal overheads, in conjunction with short dwell times per pixel, have allowed XFM to establish techniques such as full spectroscopic XANES fluorescence imaging, XRF tomography, fly scanning ptychography and high-definition XRF imaging over large areas. XFM provides diverse analysis capabilities in the fields of medicine, biology, geology, materials science and cultural heritage. This paper discusses the beamline status, scientific showcases and future upgrades.

scholarly journals A simultaneous multiple angle-wavelength dispersive X-ray reflectometer using a bent-twisted polychromator crystal

2012 ◽  
Vol 20 (1) ◽  
pp. 80-88 ◽  
Author(s):  
Tadashi Matsushita ◽  
Etsuo Arakawa ◽  
Wolfgang Voegeli ◽  
Yohko F. Yano
Keyword(s):  
Structural Changes ◽  
Vertical Direction ◽  
Sample Surface ◽  
Array Detector ◽  
Single Crystal Substrate ◽  
Time Resolved ◽  
Reflectivity Curve ◽  
X Ray ◽  
Monochromator Crystal ◽  
Crystal Substrate

An X-ray reflectometer has been developed, which can simultaneously measure the whole specular X-ray reflectivity curve with no need for rotation of the sample, detector or monochromator crystal during the measurement. A bent-twisted crystal polychromator is used to realise a convergent X-ray beam which has continuously varying energyE(wavelength λ) and glancing angle α to the sample surface as a function of horizontal direction. This convergent beam is reflected in the vertical direction by the sample placed horizontally at the focus and then diverges horizontally and vertically. The normalized intensity distribution of the reflected beam measured downstream of the specimen with a two-dimensional pixel array detector (PILATUS 100K) represents the reflectivity curve. Specular X-ray reflectivity curves were measured from a commercially available silicon (100) wafer, a thin gold film coated on a silicon single-crystal substrate and the surface of liquid ethylene glycol with data collection times of 0.01 to 1000 s using synchrotron radiation from a bending-magnet source of a 6.5 GeV electron storage ring. A typical value of the simultaneously covered range of the momentum transfer was 0.01–0.45 Å−1for the silicon wafer sample. The potential of this reflectometer for time-resolved X-ray studies of irreversible structural changes is discussed.

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