scholarly journals Advances in 3D focused ion beam tomography

MRS Bulletin ◽  
2014 ◽  
Vol 39 (4) ◽  
pp. 354-360 ◽  
Author(s):  
Marco Cantoni ◽  
Lorenz Holzer
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Image Position ◽  
Focused Ion Beam Tomography

Abstract

Towards quantitative analysis of enamel erosion by focused ion beam tomography

2018 ◽  
Vol 34 (11) ◽  
pp. e289-e300 ◽  
Author(s):  
Nancie Cougot ◽  
Thierry Douillard ◽  
Florent Dalmas ◽  
Nelly Pradelle ◽  
Rémy Gauthier ◽  
...  
Keyword(s):  
Quantitative Analysis ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Enamel Erosion ◽  
Focused Ion Beam Tomography

Compression of Micro-pillars of a Long Period Stacking Ordered Phase in the Mg-Zn-Y system

2013 ◽  
Vol 1516 ◽  
pp. 151-156 ◽  
Author(s):  
Atsushi Inoue ◽  
Kyosuke Kishida ◽  
Haruyuki Inui ◽  
Koji Hagihara
Keyword(s):  
Basal Plane ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Deformation Bands ◽  
Axis Orientation ◽  
Lpso Phase ◽  
Long Period ◽  
Image Position ◽  
Micro Pillars ◽  
Loading Axis

ABSTRACTDeformation behavior of an 18R-type long period stacking ordered (LPSO) phase in the Mg-Zn-Y system was studied by micro-pillar compressions of single crystalline specimens prepared by focused ion beam (FIB) technique as a function of loading axis orientation and specimen dimensions. When the loading axis is inclined to the basal plane of the LPSO phase by 42°, basal slip of (0001)<11$\bar 2$0>-type is activated irrespective of the specimen dimensions. When the loading axis is parallel to the basal plane, the formation of thick deformation bands are observed for all specimens tested. Strong size-dependence of yield stress values is observed for both types of micro-pillar specimens with different loading axis orientations.

scholarly journals Quantification of Subsurface Damage in a Brittle Insulating Ceramic by Three-Dimensional Focused Ion Beam Tomography

2011 ◽  
Vol 17 (2) ◽  
pp. 240-245 ◽  
Author(s):  
N. Payraudeau ◽  
D. McGrouther ◽  
K.U. O'Kelly
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Three Dimensional ◽  
Subsurface Damage ◽  
Insulating Material ◽  
Acquisition Process ◽  
Automated Method ◽  
Minimal Damage ◽  
Automatic Acquisition ◽  
Focused Ion Beam Tomography

AbstractIn this study, we present a fully automated method to investigate and reconstruct the three-dimensional crack structure beneath an indent in a highly insulating material. This work concentrates on issues arising from a long automatic acquisition process, the insulating nature of the specimen, and the introduction of minimal damage to the original cracks resulting from indentation.

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