Observation of compound semiconductors and heterovalent interfaces using aberration-corrected scanning transmission electron microscopy

2016 ◽  
Vol 32 (5) ◽  
pp. 921-927 ◽  
Author(s):  
David J. Smith ◽  
Jing Lu ◽  
Toshihiro Aoki ◽  
Martha R. McCartney ◽  
Yong-Hang Zhang
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
Compound Semiconductors ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Image Position ◽  
Aberration Corrected

Abstract

scholarly journals Atomic-Scale Analysis of Chemical Bonding of Delaminated Graphene at Faceted SiC by Aberration-Corrected Scanning Transmission Electron Microscopy

2013 ◽  
Vol 19 (S2) ◽  
pp. 1238-1239
Author(s):  
G. Nicotra ◽  
Q.M. Ramasse ◽  
I. Deretzis ◽  
C. Bongiorno ◽  
C. Spinella ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Chemical Bonding ◽  
Scanning Transmission Electron Microscopy ◽  
Atomic Scale ◽  
Scale Analysis ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Aberration Corrected

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

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