Synthesis of Oriented BiFeO3 Thin Films by Chemical Solution Deposition: Phase, Texture, and Microstructural Development

2005 ◽  
Vol 20 (8) ◽  
pp. 2127-2139 ◽  
Author(s):  
F. Tyholdt ◽  
S. Jørgensen ◽  
H. Fjellvåg ◽  
A.E. Gunnæs
Keyword(s):  
Thin Films ◽  
Photoelectron Spectroscopy ◽  
Chemical Solution Deposition ◽  
Microstructural Development ◽  
Chemical Solution ◽  
X Ray Diffraction ◽  
Scanning Calorimetry ◽  
Solution Deposition ◽  
X Ray ◽  
Glass Substrates

Textured, thin films of BiFeO3 (∼120 nm thickness) were synthesized by chemical solution deposition from a mixture of iron- and bismuth- 2-methoxyethoxides on Si(100)/SiO2/TiO2/Pt substrates. The use of alkoxides ensured good homogeneity and a low degree of organics that further facilitated low crystallization temperatures. Crystalline films were according to x-ray diffraction already obtained at 480 °C. Precursor characteristics were investigated using thermogravimetry and differential scanning calorimetry, whereas phase purity, microstructure and film topography were examined by x-ray diffraction, transmission electron microscopy, atomic force microscopy, and x-ray photoelectron spectroscopy. A small (10%) Bi excess was found necessary to obtain dense, pore-free films. Such additions also prevented decomposition of BiFeO3 at high temperatures. The observed (012) texture is believed to originate from the growth mechanism as no relation to the substrate is found. This is also confirmed by observing (012) texture for films on glass substrates.

(Pb, Sm)TiO3 THIN FILMS PREPARED BY CHEMICAL SOLUTION DEPOSITION USING A Bi2Ti2O7 BUFFER LAYER

2004 ◽  
Vol 11 (02) ◽  
pp. 211-215
Author(s):  
CHANGHONG YANG ◽  
ZHUO WANG ◽  
XIUFENG CHENG ◽  
HONGXIA LI ◽  
JIANRU HAN ◽  
...  
Keyword(s):  
Thin Films ◽  
Chemical Solution Deposition ◽  
Annealing Temperature ◽  
Hysteresis Curve ◽  
Chemical Solution ◽  
X Ray Diffraction ◽  
Solution Deposition ◽  
X Ray ◽  
Atomic Force ◽  
Clockwise Hysteresis

A thin-film bilayer structure consisting of polycrystalline Pb 0.85 Sm 0.1 TiO 3 and preferentially (111)-oriented Bi 2 Ti 2 O 7 were prepared using the chemical solution deposition technique. Thin films were deposited by spin-coating. The structural properties of the films were examined by X-ray diffraction. The surface morphology and quality were studied by using an atomic force microscope. The films exhibit a good insulating property and resistance to breakdown. The clockwise hysteresis curve is referred to as polarization type switching, and the memory window is about 3.5 V. The accumulation capacitance and dielectric loss decrease with the increased annealing temperature. The ( Pb, Sm ) TiO 3/ Bi 2 Ti 2 O 7 films in the "on" and "off" states are relatively stable.

scholarly journals Structural and Optical Properties Evolution of ‘Fused’ Multilayer Nano PbS Thin Films Deposited by Chemical Bath Deposition

2014 ◽  
Vol 25 ◽  
pp. 16-25
Author(s):  
Ali M. Mousa ◽  
Selma M. Al-Jawad ◽  
Suad M. Kadhim Al-Shammari
Keyword(s):  
Chemical Solution Deposition ◽  
Chemical Solution ◽  
X Ray Diffraction ◽  
Structural And Optical Properties ◽  
Unusual Behavior ◽  
Solution Deposition ◽  
X Ray ◽  
Glass Substrates ◽  
Chemical Solution Deposition Method ◽  
Deposition Conditions

Here, we report the unusual behavior shown by the PbS samples prepared using a multilayer deposition approach by chemical solution deposition method. Thin samples were prepared by depositing several films at different deposition conditions on glass substrates. X-ray diffraction showed that final multilayer samples showed a peculiar variation. Even when they showed well defined structure the intensities of the peaks do not correspond to those of the initial films.

Epitaxial Growth of ZnO Thin Films on SiC Prepared by Chemical Solution Deposition

2006 ◽  
Vol 957 ◽  
Author(s):  
Young-Sik Park ◽  
Young-Sun Jeon ◽  
Kyung-Ok Jeon ◽  
Bo-An Kang ◽  
Kyu-Seog Hwang ◽  
...  
Keyword(s):  
Thin Films ◽  
Chemical Solution Deposition ◽  
Mechanical Stability ◽  
Low Cost ◽  
Zno Thin Films ◽  
Chemical Solution ◽  
X Ray Diffraction ◽  
Solution Deposition ◽  
X Ray ◽  
Probe Microscope

ABSTRACTZinc oxide (ZnO) thin films have emerged as one of the most promising oxide materials owing to their optical and electrical properties, together with their high chemical and mechanical stability. Chemical solution deposition (CSD) is attractive technique for obtaining ZnO thin films and has the advantages of easy control of the film composition and easy fabrication of a larger-area thin film at low cost. In this work, epitaxial ZnO thin films on SiC substrate were prepared by using a CSD method with a zinc naphthenate precursor. Precursor films were pyrolyzed at 500°C for 10 min in air and finally annealed at 600°C, 700°C, 800°C and 900°C for 30 min in air. Crystallinity and in-plane alignment of the films were investigated by X-ray diffraction theta-2 theta scan and pole-figure analysis. Scanning electron microscope, scanning probe microscope, and He-Cd laser (325 nm) are used to detect the surface morphology and photoluminescence of the films. The effects of annealing temperature on crystallinity and epitaxy of the films will be fully discussed on the basis of the results of X-ray diffraction analysis.

scholarly journals Structural and electrical properties of LaNiO3 thin films grown on (100) and (001) oriented SrLaAlO4 substrates by chemical solution deposition method

2014 ◽  
Vol 1633 ◽  
pp. 25-33 ◽  
Author(s):  
D. S. L. Pontes ◽  
F. M Pontes ◽  
Marcelo A. Pereira-da-Silva ◽  
O. M. Berengue ◽  
A. J. Chiquito ◽  
...  
Keyword(s):  
Thin Films ◽  
Electrical Properties ◽  
Single Crystal ◽  
Chemical Solution Deposition ◽  
Deposition Method ◽  
Chemical Solution ◽  
X Ray Diffraction ◽  
Solution Deposition ◽  
X Ray ◽  
Chemical Solution Deposition Method

ABSTRACTLaNiO3 thin films were deposited on SrLaAlO4 (100) and SrLaAlO4 (001) single crystal substrates by a chemical solution deposition method and heat-treated in oxygen atmosphere at 700°C in tube oven. Structural, morphological, and electrical properties of the LaNiO3 thin films were characterized by X-ray diffraction (XRD), atomic force microscopy (AFM), field emission scanning electron microscopy (FE-SEM), and electrical resistivity as temperature function (Hall measurements). The X-ray diffraction data indicated good crystallinity and a structural preferential orientation. The LaNiO3 thin films have a very flat surface and no droplet was found on their surfaces. Samples of LaNiO3 grown onto (100) and (001) oriented SrLaAlO4 single crystal substrates reveled average grain size by AFM approximately 15-30 and 20-35 nm, respectively. Transport characteristics observed were clearly dependent upon the substrate orientation which exhibited a metal-to-insulator transition. The underlying mechanism is a result of competition between the mobility edge and the Fermi energy through the occupation of electron states which in turn is controlled by the disorder level induced by different growth surfaces.

PREPARATION AND CHARACTERISTICS OF Sm-DOPED Bi2Ti2O7 THIN FILMS

2007 ◽  
Vol 14 (01) ◽  
pp. 147-150 ◽  
Author(s):  
DONGMEI YANG ◽  
CHANGHONG YANG ◽  
CHUNXUE YUAN ◽  
XIN YIN ◽  
JIANRU HAN
Keyword(s):  
Thin Films ◽  
Chemical Solution Deposition ◽  
Room Temperature ◽  
Chemical Solution ◽  
X Ray Diffraction ◽  
Solution Deposition ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Dielectric Constant And Loss

Crack-free Sm-doped Bi 2 Ti 2 O 7( Sm : Bi 2 Ti 2 O 7) thin films with a strong (111) orientation have been prepared on p-Si (111) by chemical solution deposition (CSD). The structural properties and crystallizations were studied by X-ray diffraction. The surface morphology and quality were examined using atomic force microscopy (AFM). The dielectric constant and loss factor at different frequencies were also evaluated at room temperature. Their insulation was studied, too. The films exhibit better insulating property than does the pure Bi 2 Ti 2 O 7.

scholarly journals Reactive Dual Magnetron Sputtering: A Fast Method for Preparing Stoichiometric Microcrystalline ZnWO4 Thin Films

Surfaces ◽  
2021 ◽  
Vol 4 (2) ◽  
pp. 106-114
Author(s):  
Yannick Hermans ◽  
Faraz Mehmood ◽  
Kerstin Lakus-Wollny ◽  
Jan P. Hofmann ◽  
Thomas Mayer ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetron Sputtering ◽  
Photoelectron Spectroscopy ◽  
Fast Method ◽  
X Ray Diffraction ◽  
X Ray ◽  
Glass Substrates ◽  
Post Annealing ◽  
Rf Signal ◽  
First Time

Thin films of ZnWO4, a promising photocatalytic and scintillator material, were deposited for the first time using a reactive dual magnetron sputtering procedure. A ZnO target was operated using an RF signal, and a W target was operated using a DC signal. The power on the ZnO target was changed so that it would match the sputtering rate of the W target operated at 25 W. The effects of the process parameters were characterized using optical spectroscopy, X-ray diffraction, and scanning electron microscopy, including energy dispersive X-ray spectroscopy as well as X-ray photoelectron spectroscopy. It was found that stoichiometric microcrystalline ZnWO4 thin films could be obtained, by operating the ZnO target during the sputtering procedure at a power of 55 W and by post-annealing the resulting thin films for at least 10 h at 600 °C. As FTO coated glass substrates were used, annealing led as well to the incorporation of Na, resulting in n+ doped ZnWO4 thin films.

Annealing effect on in-plane alignment and surface morphology of epitaxial Bi4Ti3O12 thin films prepared by the chemical solution deposition

2001 ◽  
Vol 16 (9) ◽  
pp. 2519-2525 ◽  
Author(s):  
K. Hwang ◽  
Y. Park
Keyword(s):  
Thin Films ◽  
Surface Morphology ◽  
Chemical Solution Deposition ◽  
Three Dimensional ◽  
Annealing Effect ◽  
Chemical Solution ◽  
Epitaxial Relationship ◽  
Solution Deposition ◽  
X Ray ◽  
Lower Temperature

Bi4Ti3O12 thin films were grown epitaxially on SrTiO3(100) substrates by chemical solution deposition using metal naphthenates as starting materials. Homogeneous Bi–Ti solution with toluene was spin-coated onto the substrates and pyrolyzed at 500 °C for 10 min in air. Highly c-axis-oriented Bi4Ti3O12 thin films were crystallized by annealing pyrolyzed films at ≥650 °C. The x-ray pole-figure analysis indicated that the Bi4Ti3O12 thin films have an epitaxial relationship with the SrTiO3(100) substrates. The surface morphology of the films annealed at lower temperature, i.e., 650 °C, exhibited flat and smooth surfaces, while films annealed at higher temperatures, i.e., 750 and 800 °C, were characterized by three-dimensional outgrowth.

scholarly journals Chemical Solution Deposition of YBCO Films with Gd Excess

Coatings ◽  
2020 ◽  
Vol 10 (9) ◽  
pp. 860
Author(s):  
Valentina Pinto ◽  
Angelo Vannozzi ◽  
Achille Angrisani Armenio ◽  
Francesco Rizzo ◽  
Andrea Masi ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Chemical Solution Deposition ◽  
Zero Field ◽  
Chemical Solution ◽  
Solution Deposition ◽  
Decomposition Approach ◽  
X Ray ◽  
Transmission Electron ◽  
Different Temperatures ◽  
Metal Organic

Chemical solution deposition of Gd-doped YBCO, Y1GdyBa2Cu3O7−δ, (YBCO-Gd), film was carried out following the metal-organic decomposition approach and in situ route. Two dopant concentrations, 5 and 10 mol %, were evaluated. The morphology and crystalline structure of the superconductor films were deeply investigated. In general, a homogeneous and well c-axis oriented film was observed by using scanning and transmission electron microscopy (SEM and TEM) and X-ray diffraction. However, compared to pure YBCO, YBCO-Gd samples showed an increased stacking faults concentration, as recognized by TEM. X-ray photoelectron spectroscopy allowed studying the Gd distribution in the films and gathered information about the Gd electronic environment. Superconducting properties were evaluated at different temperatures, magnetic field directions, and intensities. Higher zero-field critical current densities were measured with respect to undoped samples in the temperature range from 10 to 77 K with both Gd concentrations (i.e., 28, 27, and 13 MA·cm−2, respectively, for YBCO-Gd 5%, YBCO-Gd 10%, and undoped YBCO at 10 K in self field condition). At low temperatures, this improvement was maintained up to 12 T, confirming the efficacy of Gd addition for the enhancement of transport properties of YBCO film.

scholarly journals Annealing-Driven Microstructural Evolution and Its Effects on the Surface and Nanomechanical Properties of Cu-Doped NiO Thin Films

Coatings ◽  
2019 ◽  
Vol 9 (2) ◽  
pp. 107 ◽  
Author(s):  
San-Ho Wang ◽  
Sheng-Rui Jian ◽  
Guo-Ju Chen ◽  
Huy-Zu Cheng ◽  
Jenh-Yih Juang
Keyword(s):  
Thin Films ◽  
Photoelectron Spectroscopy ◽  
Annealing Temperature ◽  
Film Surface ◽  
X Ray Diffraction ◽  
X Ray ◽  
Nanomechanical Properties ◽  
Glass Substrates ◽  
Structural Surface ◽  
Diffraction Peaks

The effects of annealing temperature on the structural, surface morphological and nanomechanical properties of Cu-doped (Cu-10 at %) NiO thin films grown on glass substrates by radio-frequency magnetron sputtering are investigated in this study. The X-ray diffraction (XRD) results indicated that the as-deposited Cu-doped NiO (CNO) thin films predominantly consisted of highly defective (200)-oriented grains, as revealed by the broadened diffraction peaks. Progressively increasing the annealing temperature from 300 to 500 °C appeared to drive the films into a more equiaxed polycrystalline structure with enhanced film crystallinity, as manifested by the increased intensities and narrower peak widths of (111), (200) and even (220) diffraction peaks. The changes in the film microstructure appeared to result in significant effects on the surface energy, in particular the wettability of the films as revealed by the X-ray photoelectron spectroscopy and the contact angle of the water droplets on the film surface. The nanoindentation tests further revealed that both the hardness and Young’s modulus of the CNO thin films increased with the annealing temperature, suggesting that the strain state and/or grain boundaries may have played a prominent role in determining the film’s nanomechanical characterizations.

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