Microstructure and Mechanical Properties of SiC/zirconia-toughened Mullite Nanocomposites Prepared from Mixtures of Mullite Gel, 2Y-TZP, and SiC Nanopowders

2002 ◽  
Vol 17 (5) ◽  
pp. 1024-1029 ◽  
Author(s):  
X. H. Jin ◽  
L. Gao ◽  
L. H. Gui ◽  
J. K. Guo

SiC/ZTM (zirconia-toughened mullite) nanocomposites were prepared by hot pressing mixtures of mullite gel, 2Y-TZP, and SiC nanopowders. The intimate mixing of Al2O3 and SiO2 components in the starting powder prevented intermediate ZrSiO4 phase formation during sintering. Addition of nano-sized SiC significantly retarded the matrix grain growth, making the microstructure much finer and more uniform. Transmission electron microscopy and high-resolution transmission electron microscopy revealed that many SiC nanoparticles were found in mullite and ZrO2 grains, and low-energy grain boundaries and mullite–liquid interfaces parallel to the {110} planes of rodlike mullite grains were formed. It is deduced that the formation of rodlike mullite grains is the result of the preferential development of these low-energy grain boundaries and mullite–liquid interfaces. The mechanical properties of the SiC/ZTM nanocomposite showed significant improvement over those of ZTM, and further enhancement in the mechanical properties was achieved by combinative strengthening with nano- and micro-sized SiC.

2018 ◽  
Vol 941 ◽  
pp. 1613-1617 ◽  
Author(s):  
Li Jun Peng ◽  
Xu Jun Mi ◽  
Hao Feng Xie ◽  
Yang Yu ◽  
Guo Jie Huang ◽  
...  

The Cr precipitation sequence in Cu-Cr-Zr-Ag alloy during the aging process at 450°C could be obtained by Transmission electron microscopy (TEM) and High-resolution transmission microscopy (HRTEM) in the study. The strengthening curve shows a unimodal type and the tensile strength trends to peak when the aged for 4h. The Cr phase transformation of Cu-Cr-Zr-Ag aged at 450°C is supersaturated solid sloution→G.P zones→fcc Cr phase→order fcc Cr phase→bcc Cr phase. The orientation relationship between bcc Cr precipitates and the matrix change from cube-on-cube to NW-OR.


1999 ◽  
Vol 588 ◽  
Author(s):  
Daisuke Takeuchi ◽  
Hideyuki Watanabe ◽  
Sadanori Yamanaka ◽  
Hideyo Okushi ◽  
Koji Kajimura ◽  
...  

AbstractThe band-A emission (around 2.8 eV) observed in high quality (device-grade) homoepitaxial diamond films grown by microwave-plasma chemical vapor deposition (CVD) was studied by means of scanning cathodoluminescence spectroscopy and high-resolution transmission electron microscopy. Recent progress in our study on homoepitaxial diamond films was obtained through the low CH4/H2 conditions by CVD. These showed atomically flat surfaces and the excitonic emission at room temperature, while the band-A emission (2.95 eV) decreased. Using these samples, we found that the band-A emission only appeared at unepitaxial crystallites (UC) sites, while other flat surface parts still showed the excitonic emission. High-resolution transmission electron microscopy revealed that there were grain boundaries which contained π-bonds in UC. This indicates that one of the origin of the band-A emission in diamond films is attributed to π bonds of grain boundaries.


1981 ◽  
Vol 5 ◽  
Author(s):  
David R. Clarke

ABSTRACTThe principal high resolution transmission electron microscopy techniques used in characterizing grain boundaries in electronic ceramics are described, including those recently developed for detecting the presence of extremely thin (∼10Å) intergranular phases. The capabilities of the techniques are illustrated with examples drawn from studies of ZnO varistors, PTC BaTiO3 devices and boundary layer capacitors.


1991 ◽  
Vol 238 ◽  
Author(s):  
Elsie C. Urdaneta ◽  
David E. Luzzi ◽  
Charles J. McMahon

ABSTRACTBismuth-induced grain boundary faceting in Cu-12 at ppm Bi polycrystals was studied using transmission electron microscopy (TEM). The population of faceted grain boundaries in samples aged at 600°C was observed to increase with heat treatment time from 15min to 24h; aging for 72h resulted in de-faceting, presumably due to loss of Bi from the specimen. The majority of completely faceted boundaries were found between grains with misorientation Σ=3. About 65% of the facets of these boundaries were found to lie parallel to crystal plane pairs of the type {111}1/{111]2- The significance of these findings in light of recent high resolution electron microscopy experiments is discussed.


1995 ◽  
Vol 398 ◽  
Author(s):  
W. Sinkler ◽  
C. Michaelsen ◽  
R. Bormann

ABSTRACTInverse melting of bcc Nb4sCr55 is investigated using transmission electron microscopy, high-resolution TEM and electron diffraction. It is shown that the transformation to the amorphous phase initiates at the bcc grain boundaries. The transformation results in an increase in incoherence, evidenced by a loss of bend contours. Some anisotropy is found in the amorphous phase produced by inverse melting, which is associated in HRTEM with preferentially oriented but discontinuous and distorted fringes. The results are consistent with the production of an amorphous phase by inverse melting.


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