Conductive LaNiO3 Electrode Grown by Pulsed Laser Ablation on Si Substrate

1997 ◽  
Vol 12 (4) ◽  
pp. 931-935 ◽  
Author(s):  
Li Sun ◽  
Tao Yu ◽  
Yan-Feng Chen ◽  
Jun Zhou ◽  
Nai-Ben Ming

Using the pulsed laser ablation (PLA) technique, conductive LaNiO3 thin films have been successfully grown on (001) Si substrates. The XRD θ-2θ scan patterns indicate a preferential (110) orientation, and the electron probe microanalyzer (EPMA) investigations show that the three elements La, Ni, and O distribute uniformly in the films. The resistivity of the as-deposited LaNiO3 films display a metallic character. Polycrystalline PbTiO3films are deposited by metalorganic chemical vapor deposition (MOCVD) on these LaNiO3 electrodes. Ferroelectricity measurements of the PbTiO3/LaNiO3 heterostructure prove LaNiO3 to be a promising electrode material in the integration of ferroelectrics and Si wafer.

1995 ◽  
Vol 34 (Part 1, No. 9B) ◽  
pp. 5154-5157 ◽  
Author(s):  
Atsushi Masuda ◽  
Yasuhiro Yamanaka ◽  
Mitsutoshi Tazoe ◽  
Yasuto Yonezawa ◽  
Akiharu Morimoto ◽  
...  

2018 ◽  
Vol 16 (36) ◽  
pp. 1-10
Author(s):  
Uday Muhsin Nayef

In this research, porous silicon (PS) prepared by anodization etching on surface of single crystalline p-type Si wafer, then Gold nanoparticle (AuNPs) prepared by pulsed laser ablation in liquid. NPs deposited on PS layer by drop casting. The morphology of PS, AuNPs and AuNPs/PS samples were examined by AFM. The crystallization of this sample was characterized by X-ray diffraction (XRD). The electrical properties and sensitivity to CO2 gas were investigated to Al/AuNPs/PS/c-Si/Al, we found that AuNPs plays crucial role to enhance this properties.


2000 ◽  
Vol 638 ◽  
Author(s):  
Yuka Yamada ◽  
Toshiharu Makino ◽  
Nobuyasu Suzuki ◽  
Takehito Yoshida

AbstractWe have developed silicon (Si) nanocrystallite light-emitting devices synthesized by a novel integrated process in which a size-controlling unit of differential mobility analyzer (DMA) is combined to a nanocrystallite formation unit of pulsed laser ablation (PLA). The size-controlled Si nanocrystallites as active layers have been deposited on Si substrates, and have been covered with stoichiometric indium oxide (In2O3) thin films synthesized also by the PLA process. The electroluminescence (EL) spectra had a narrow bandwidth of 0.15 eV peaked at slightly higher energy region (1.17 eV) than the bulk Si energy gap (1.10 eV), at room temperature.


Author(s):  
M. W. Bench ◽  
C.B. Carter

There has been an increasing interest in recent years in the growth of epitactic oxide thin films for use in a variety of technological applications, including optical and electronic devices. A number of fundamental aspects of the growth of TiO2 films on alumina substrates by metal-organic chemical vapor deposition have been reported by Chang et al. For the case of MgO, Hesse et al. demonstrated the epitactic growth by pulsed-laser deposition of YBa2Cu3O7-x on (001) MgO passivated by a layer of the inverse spinel Mg2TiO4. The Mg2TiO4 layer was formed directly by a vapor-phase solid-state reaction during the deposition by e-beam evaporation of TiO2 onto heated MgO substrates. In other studies, TiO2 thin films have been grown using a variety of deposition techniques. For the growth of oxide materials in general, pulsed-laser ablation is a viable means of growing films, and allows materials with a wide range of stoichiometrics to be produced.


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