Sulfur Segregation and Surface Site Vacancy Compensation During Methanol to Methoxy Reactions on MoS2

MRS Advances ◽  
2018 ◽  
Vol 4 (15) ◽  
pp. 873-878
Author(s):  
Prescott E. Evans ◽  
Hae-Kyung Jeong ◽  
Peter A. Dowben
Keyword(s):  
Subsequent Annealing ◽  
Surface Site ◽  
Temperature Dependent ◽  
Sulfur Segregation ◽  
X Ray ◽  
Inverse Photoemission ◽  
Surface Vacancy ◽  
Intensity Ratios ◽  
Characteristic Features ◽  
Site Vacancy

ABSTRACTSulfur loss from the surface of MoS2(0001) is observed following the adsorption of methanol on MoS2 at 86 K and subsequent annealing of MoS2 near 300 K. This sulfur loss, at the MoS2 surface, leads to suppression of inverse photoemission features characteristic of the unoccupied states associated with MoS2. This sulfur loss is counteracted by further annealing to 350 K, as is evident in the temperature dependent sulfur to molybdenum integrated X-ray photoemission intensity ratios near 300 to 350 K. Upon further annealing to 350 K, inverse photoemission additionally indicates a reestablishment of characteristic features associated with the unoccupied states of MoS2. These results are indicative of sulfur segregation to the surface and compensation of surface vacancy sites.

Influence of X-Ray Induced Fluorescence on Energy Dispersive X-Ray Analysis of Thin Foils

1977 ◽  
Vol 35 ◽  
pp. 328-329
Author(s):  
E. A. Kenik ◽  
J. Bentley
Keyword(s):  
Thin Foil ◽  
Electron Excitation ◽  
Simple Approach ◽  
Foil Thickness ◽  
X Rays ◽  
X Ray ◽  
Hole Spectrum ◽  
Illumination System ◽  
Thin Foils ◽  
Intensity Ratios

Cliff and Lorimer (1) have proposed a simple approach to thin foil x-ray analy sis based on the ratio of x-ray peak intensities. However, there are several experimental pitfalls which must be recognized in obtaining the desired x-ray intensities. Undesirable x-ray induced fluorescence of the specimen can result from various mechanisms and leads to x-ray intensities not characteristic of electron excitation and further results in incorrect intensity ratios.In measuring the x-ray intensity ratio for NiAl as a function of foil thickness, Zaluzec and Fraser (2) found the ratio was not constant for thicknesses where absorption could be neglected. They demonstrated that this effect originated from x-ray induced fluorescence by blocking the beam with lead foil. The primary x-rays arise in the illumination system and result in varying intensity ratios and a finite x-ray spectrum even when the specimen is not intercepting the electron beam, an ‘in-hole’ spectrum. We have developed a second technique for detecting x-ray induced fluorescence based on the magnitude of the ‘in-hole’ spectrum with different filament emission currents and condenser apertures.

scholarly journals Electronic Structure of n-Cycloparaphenylenes Directly Observed by Photoemission Spectroscopy

2021 ◽  
Author(s):  
Kaname Kanai ◽  
Takuya Inoue ◽  
Takaya Furuichi ◽  
Kaito Shinoda ◽  
Takashi Iwahashi ◽  
...  
Keyword(s):  
Electronic Structure ◽  
Electronic Structures ◽  
Photoemission Spectroscopy ◽  
Cyclic Structure ◽  
Visible Absorption ◽  
X Ray ◽  
Inverse Photoemission

A series of n-cycloparaphenylenes ([n]CPP) were studied by ultraviolet photoemission, inverse photoemission, ultraviolet-visible absorption, and X-ray photoemission spectroscopy to detect their unique electronic structures. [n]CPP has a cyclic structure in...

The scandium-rich indide Sc50Pt13.47In2.53

2020 ◽  
Vol 75 (6-7) ◽  
pp. 715-720 ◽  
Author(s):  
Nataliya L. Gulay ◽  
Jutta Kösters ◽  
Yaroslav M. Kalychak ◽  
Rainer Pöttgen
Keyword(s):  
Single Crystal ◽  
Intermetallic Phases ◽  
Subsequent Annealing ◽  
Induction Melting ◽  
X Ray

AbstractThe scandium-rich indide Sc50Pt13.47In2.53 was obtained by induction melting of the elements and subsequent annealing. The structure of Sc50Pt13.47In2.53 has been refined from single-crystal X-ray diffractometer data: Fm$\overline{3}$, a = 1774.61(3) pm, wR2 = 0.0443, 1047 F2 values and 35 variables. Sc50Pt13.47In2.53 is isopointal with the intermetallic phases Sc50Co12.5In3.5, Sc50Rh13.3In2.7, Sc50Ir13.6In2.4, Ag7+xMg26−x and Ga4.55Mg21.85Pd6.6 (Pearson code cF264 and Wyckoff sequence ih2fecba). Two of the eight crystallographic sites in the structure show mixed occupancies: M1 (≡Pt20.70In10.30) and M2 (≡Pt30.76In20.24). The structure contains four basic polyhedra: M2@Sc8 cubes, Pt1@Sc10 sphenocorona and slightly distorted M1@Sc12 and In3@Sc12 icosahedra. The polyhedra are condensed via common scandium corners and edges. The various Sc–Sc distances range from 302–334 pm and are indicative of substantial Sc–Sc bonding, stabilizing the Sc50Pt13.47In2.53 structure.

Temperature-induced structural phase transitions in RERhSn (RE = Y, Gd-Tm, Lu)

2021 ◽  
Vol 0 (0) ◽  
Author(s):  
Simon Engelbert ◽  
Rolf-Dieter Hoffmann ◽  
Jutta Kösters ◽  
Steffen Klenner ◽  
Rainer Pöttgen
Keyword(s):  
Rare Earth ◽  
Phase Transitions ◽  
Driving Force ◽  
Room Temperature ◽  
Structural Phase ◽  
Structural Phase Transitions ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
Temperature Dependent ◽  
X Ray

Abstract The structures of the equiatomic stannides RERhSn with the smaller rare earth elements Y, Gd-Tm and Lu were reinvestigated on the basis of temperature-dependent single crystal X-ray diffraction data. GdRhSn crystallizes with the aristotype ZrNiAl at 293 and 90 K. For RE = Y, Tb, Ho and Er the HP-CeRuSn type (approximant with space group R3m) is already formed at room temperature, while DyRhSn adopts the HP-CeRuSn type below 280 K. TmRhSn and LuRhSn show incommensurate modulated variants with superspace groups P31m(1/3; 1/3; γ) 000 (No. 157.1.23.1) (γ = 3/8 for TmRhSn and γ = 2/5 for LuRhSn). The driving force for superstructure formation (modulation) is a strengthening of Rh–Sn bonding. The modulation is expressed in a 119Sn Mössbauer spectrum of DyRhSn at 78 K through line broadening.

How to Use the Features of Total Reflection of X-Rays for Energy Dispersive XRF

1988 ◽  
Vol 32 ◽  
pp. 105-114 ◽  
Author(s):  
H. Schwenke ◽  
W. Berneike ◽  
J. Knoth ◽  
U. Weisbrod
Keyword(s):  
Thin Films ◽  
Penetration Depth ◽  
Fluorescence Analysis ◽  
Total Reflection ◽  
X Rays ◽  
X Ray ◽  
Characteristic Features ◽  
Respective Characteristic ◽  
Nanometer Regime ◽  
Sensitive Method

AbstractThe total reflection of X-rays is mainly determined by three parameters , that is the orltical angle, the reflectivity and the penetration depth. For X-ray fluorescence analysis the respective characteristic features can be exploited in two rather different fields of application. In the analysis of trace elements in samples placed as thin films on optical flats, detection limits as low as 2 pg or 0.05 ppb, respectively, have been obtained. In addition, a penetration depth in the nanometer regime renders Total Reflection XRF an inherently sensitive method for the elemental analysis of surfaces. This paper outlines the main physical and constructional parameters for instrumental design and quantitation in both branches of TXRF.

K shell X-ray intensity ratios, K-Li, K-L, and K-M vacancy transfer probabilities of Ba and Tl following internal conversion process

2014 ◽  
Vol 92 (11) ◽  
pp. 1489-1493 ◽  
Author(s):  
P.V. Sreevidya ◽  
S.B. Gudennavar ◽  
Daisy Joseph ◽  
S.G. Bubbly
Keyword(s):  
Beta Decay ◽  
Internal Conversion ◽  
Experimental Results ◽  
Conversion Process ◽  
X Rays ◽  
X Ray ◽  
Multichannel Analyser ◽  
Intensity Ratios

K shell X-rays of barium and thallium following internal conversion decay in Cs137 and Hg203, respectively, were detected using a Si(Li) X-ray detector coupled to PC-based 8k multichannel analyser employing the method suggested earlier by our group. The K shell X-ray intensity ratios and vacancy transfer probabilities for thallium and barium were calculated. The obtained results are compared with theoretical, semiempirical, and others’ experimental results obtained via photoionization as well as decay processes. The effects of beta decay and internal conversion on X-ray emission probabilities are discussed.

Ternary Antimonides RE4T7Sb6 (RE=Gd–Lu; T =Ru, Rh) with Cubic U4Re7Si6-type Structure

2013 ◽  
Vol 68 (9) ◽  
pp. 971-978 ◽  
Author(s):  
Inga Schellenberg ◽  
Ute Ch. Rodewald ◽  
Christian Schwickert ◽  
Matthias Eul ◽  
Rainer Pöttgen
Keyword(s):  
Magnetic Susceptibility ◽  
Single Crystal ◽  
Magnetic Moment ◽  
Induction Furnace ◽  
X Ray Diffraction ◽  
Temperature Dependent ◽  
X Ray ◽  
Antiferromagnetic Ordering ◽  
Arc Melting ◽  
Intermediate Valent

The ternary antimonides RE4T7Sb6 (RE=Gd-Lu; T =Ru, Rh) have been synthesized from the elements by arc-melting and subsequent annealing in an induction furnace. The samples have been characterized by powder X-ray diffraction. Four structures were refined on the basis of single-crystal X-ray diffractometer data: U4Re7Si6 type, space group Im3m with a=862.9(2) pm, wR2=0.0296, 163 F2 values for Er4Ru7Sb6; a=864.1(1) pm, wR2=0.1423, 153 F2 values for Yb4Ru7Sb6; a=872.0(2) pm, wR2=0.0427, 172 F2 values for Tb4Rh7Sb6; and a=868.0(2) pm, wR2=0.0529, 154 F2 values for Er4Rh7Sb6, with 10 variables per refinement. The structures have T1@Sb6 octahedra and slightly distorted RE@T26Sb6 cuboctahedra as building units. The distorted cuboctahedra are condensed via all trapezoidal faces, and this network leaves octahedral voids for the T1 atoms. The ruthenium-based series of compounds was studied by temperature-dependent magnetic susceptibility measurements. Lu4Ru7Sb6 is Pauli-paramagnetic. The antimonides RE4Ru7Sb6 with RE=Dy, Ho, Er, and Tm show Curie-Weiss paramagnetism. Antiferromagnetic ordering occurs at 10.0(5), 5.1(5) and 4.0(5) K for Dy4Ru7Sb6, Ho4Ru7Sb6 and Er4Ru7Sb6, respectively, while Tm4Ru7Sb6 remains paramagnetic. Yb4Ru7Sb6 is an intermediate-valent compound with a reduced magnetic moment of 3.71(1) μB per Yb as compared to 4.54 μB for a free Yb3+ ion

K-shell X-ray intensity ratios and vacancy transfer probabilities of Pt, Au, and Pb by a simple method

2014 ◽  
Vol 119 (3) ◽  
pp. 392-397 ◽  
Author(s):  
L. F. M. Anand ◽  
S. B. Gudennavar ◽  
S. G. Bubbly ◽  
B. R. Kerur
Keyword(s):  
Simple Method ◽  
X Ray ◽  
Intensity Ratios
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