scholarly journals Contact resonance atomic force microscopy for viscoelastic characterization of polymer-based nanocomposites at variable temperature

2016 ◽  
Author(s):  
Marco Natali ◽  
Daniele Passeri ◽  
Melania Reggente ◽  
Emanuela Tamburri ◽  
Maria Letizia Terranova ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Variable Temperature ◽  
Force Microscopy ◽  
Atomic Force ◽  
Contact Resonance

Nanometer-Scale Characterization of Ferroelectric Polymer Thin Films by Variable-Temperature Atomic Force Microscopy

2000 ◽  
Vol 39 (Part 1, No. 6B) ◽  
pp. 3830-3833 ◽  
Author(s):  
Takeshi Fukuma ◽  
Kei Kobayashi ◽  
Toshihisa Horiuchi ◽  
Hirofumi Yamada ◽  
Kazumi Matsushige
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Variable Temperature ◽  
Polymer Thin Films ◽  
Nanometer Scale ◽  
Force Microscopy ◽  
Ferroelectric Polymer ◽  
Atomic Force ◽  
Scale Characterization

Stereometric characterization of Dinizia excelsa Ducke wood from Amazon rainforest using atomic force microscopy

2021 ◽  
Author(s):  
Willian Silva Conceição ◽  
Ştefan Ţălu ◽  
Robert Saraiva Matos ◽  
Glenda Quaresma Ramos ◽  
Fidel Guereiro Zayas ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Amazon Rainforest ◽  
Force Microscopy ◽  
Atomic Force ◽  
Dinizia Excelsa

Characterization of mitochondria isolated from normal and ischemic hearts in rats utilizing atomic force microscopy

Micron ◽  
2011 ◽  
Vol 42 (3) ◽  
pp. 299-304 ◽  
Author(s):  
Gi-Ja Lee ◽  
Su-Jin Chae ◽  
Jae Hoon Jeong ◽  
So-Ra Lee ◽  
Sang-Jin Ha ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force

Characterization of carbon films microstructure by atomic force microscopy and Raman spectroscopy

1994 ◽  
Vol 76 (6) ◽  
pp. 3443-3447 ◽  
Author(s):  
J. M. Yáñez‐Limón ◽  
F. Ruiz ◽  
J. González‐Hernández ◽  
C. Vázquez‐López ◽  
E. López‐Cruz
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Carbon Films ◽  
Force Microscopy ◽  
Atomic Force

Characterization of Batch-Microfabricated Scanning Electrochemical-Atomic Force Microscopy Probes

2005 ◽  
Vol 77 (2) ◽  
pp. 424-434 ◽  
Author(s):  
Phillip S. Dobson ◽  
John M. R. Weaver ◽  
Mark N. Holder ◽  
Patrick R. Unwin ◽  
Julie V. Macpherson
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force
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