Nanostructured Characterization of Papilio demoleus Linnaeus Butterfly Wings

MRS Advances ◽  
2018 ◽  
Vol 3 (42-43) ◽  
pp. 2689-2696
Author(s):  
J. Sackey ◽  
P. Prevost ◽  
K.A. Dompreh ◽  
M. Maaza
Keyword(s):  
Theoretical Study ◽  
Light Elements ◽  
Yellow Colour ◽  
Layer Arrangement ◽  
Butterfly Wings ◽  
Papilio Demoleus ◽  
Reflectance Measurements ◽  
Scanning Electron ◽  
Wing Scales

Abstract:The adult Papilio demoleus Linnaeus comes in different sizes (80-100 mm) and colours. On the basis of structural colour observation, an experimental and theoretical study on the different colours on Papilio demoleus Linnaeus wings was conducted. The wing scales were investigated from a photonic crystal perspective using scanning electron and optical microscopies and reflectance measurements. In the SEM measurements, the parts studied show nanostructured ridges separated by crossribs (grooves). The scales show several tilted cuticle layers lapped on the ridges, which constitute a grating. The widths of the ridges and crossribs (grooves) in the grating are different. Arrangements and shapes of scales are clearly seen under the optical microscopy. It was deduced that the yellow colour with the highest reflectance of 485 nm and 580 nm could be due to multiple interferences from a highly tilted cuticle arrangement. The layer arrangement in the brown and ash scales is not enough to reflect observable interference light. The study shows an application in fine light elements in the photo-electro devices.

scholarly journals Roaming of Materials Scientists in Biology: Structural Colours of Butterfly Wings

2019 ◽  
Vol 2 (2) ◽  
pp. 69-72
Author(s):  
László P. Biró ◽  
Krisztián Kertész ◽  
Gábor Piszter ◽  
Zsolt E. Horváth ◽  
Zsolt Bálint
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
General Plan ◽  
Transmission Electron ◽  
Vis Spectroscopy ◽  
Butterfly Wings ◽  
Species Specific ◽  
High Degree ◽  
Scanning Electron ◽  
Wing Scales

Abstract The photonic nanoarchitectures occurring in the wing scales of Lycaenid butterflies were investigated by scanning electron microscopy (SEM), transmission electron microscopy (TEM) and UV-VIS spectroscopy. We found that the males of all the nine investigated species possess photonic nanoarchitectures built according to the same general “plan”, but each species exhibits species-specific features which results in species-specific colours reproduced generation by generation with a high degree of accuracy.

The Use of Advanced Analytical Techniques for Characterization of the Chemical, Physical, and Crystallographic Nature of a Surface

1973 ◽  
Vol 31 ◽  
pp. 132-133 ◽  
Author(s):  
R. E. Herfert
Keyword(s):  
Surface Characterization ◽  
Analytical Techniques ◽  
X Ray Diffraction ◽  
Depth Of Penetration ◽  
X Ray ◽  
The Past ◽  
Transmission Electron ◽  
Scanning Electron

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.

Characterization of Sputtered Films using the Scanning Electron Microscope

1973 ◽  
Vol 31 ◽  
pp. 44-45
Author(s):  
R. F. Schneidmiller ◽  
W. F. Thrower ◽  
C. Ang
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Thin Film Deposition ◽  
Film Deposition ◽  
Sputtered Films ◽  
Plasma Sputtering ◽  
Microelectronic Devices ◽  
Control Film ◽  
Scanning Electron

Solid state materials in the form of thin films have found increasing structural and electronic applications. Among the multitude of thin film deposition techniques, the radio frequency induced plasma sputtering has gained considerable utilization in recent years through advances in equipment design and process improvement, as well as the discovery of the versatility of the process to control film properties. In our laboratory we have used the scanning electron microscope extensively in the direct and indirect characterization of sputtered films for correlation with their physical and electrical properties.Scanning electron microscopy is a powerful tool for the examination of surfaces of solids and for the failure analysis of structural components and microelectronic devices.

Electrical Characterization of Different Failure Modes in Sub-100 nm Devices Using Nanoprobing Technique

2009 ◽  
Author(s):  
E. Hendarto ◽  
S.L. Toh ◽  
J. Sudijono ◽  
P.K. Tan ◽  
H. Tan ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Focused Ion Beam ◽  
Failure Modes ◽  
Ion Beam ◽  
Electrical Characterization ◽  
Nickel Silicide ◽  
Fault Isolation ◽  
Technology Nodes ◽  
Scanning Electron

Abstract The scanning electron microscope (SEM) based nanoprobing technique has established itself as an indispensable failure analysis (FA) technique as technology nodes continue to shrink according to Moore's Law. Although it has its share of disadvantages, SEM-based nanoprobing is often preferred because of its advantages over other FA techniques such as focused ion beam in fault isolation. This paper presents the effectiveness of the nanoprobing technique in isolating nanoscale defects in three different cases in sub-100 nm devices: soft-fail defect caused by asymmetrical nickel silicide (NiSi) formation, hard-fail defect caused by abnormal NiSi formation leading to contact-poly short, and isolation of resistive contact in a large electrical test structure. Results suggest that the SEM based nanoprobing technique is particularly useful in identifying causes of soft-fails and plays a very important role in investigating the cause of hard-fails and improving device yield.

Characterization of CMOS Structures (0.6 µm process) Submitted to HBM and COM ESD Stress Tests

1997 ◽  
Author(s):  
G. Meneghesso ◽  
E. Zanoni ◽  
P. Colombo ◽  
M. Brambilla ◽  
R. Annunziata ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Electrostatic Discharge ◽  
Stress Test ◽  
Complete Characterization ◽  
Stress Tests ◽  
Test Procedures ◽  
Emission Microscopy ◽  
Fast Rise ◽  
Scanning Electron

Abstract In this work, we present new results concerning electrostatic discharge (ESD) robustness of 0.6 μm CMOS structures. Devices have been tested according to both HBM and socketed CDM (sCDM) ESD test procedures. Test structures have been submitted to a complete characterization consisting in: 1) measurement of the tum-on time of the protection structures submitted to pulses with very fast rise times; 2) ESD stress test with the HBM and sCDM models; 3) failure analysis based on emission microscopy (EMMI) and Scanning Electron Microscopy (SEM).

Isolasi Dan Karakterisasi Bentonit Alam Menjadi Nanopartikel Monmorillonit

2018 ◽  
Vol 3 (1) ◽  
pp. 12 ◽  
Author(s):  
Zaimahwati Zaimahwati ◽  
Yuniati Yuniati ◽  
Ramzi Jalal ◽  
Syahman Zhafiri ◽  
Yuli Yetri
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Particle Size ◽  
Surface Morphology ◽  
Average Diameter ◽  
Particle Size Analyzer ◽  
Ft Ir ◽  
Scanning Electron ◽  
Sedimentation Processes

<p>Pada penelitian ini telah dilakukan isolasi dan karakterisasi bentonit alam menjadi nanopartikel montmorillonit. Bentonit alam yang digunakan diambil dari desa Blangdalam, Kecamatan Nisam Kabupaten Aceh Utara.  Proses isolasi meliputi proses pelarutan dengan aquades, ultrasonic dan proses sedimentasi. Untuk mengetahui karakterisasi montmorillonit dilakukan uji FT-IR, X-RD dan uji morfologi permukaan dengan Scanning Electron Microscopy (SEM). Partikel size analyzer untuk menganalisis dan menentukan ukuran nanopartikel dari isolasi bentonit alam. Dari hasil penelitian didapat ukuran nanopartikel montmorillonit hasil isolasi dari bentonit alam diperoleh berdiameter rata-rata 82,15 nm.</p><p><em>In this research we have isolated and characterized natural bentonite into montmorillonite nanoparticles. Natural bentonite used was taken from Blangdalam village, Nisam sub-district, North Aceh district. The isolation process includes dissolving process with aquades, ultrasonic and sedimentation processes.  The characterization of montmorillonite, FT-IR, X-RD and surface morphology test by Scanning Electron Microscopy (SEM). Particle size analyzer to analyze and determine the size of nanoparticles from natural bentonite insulation. From the research results obtained the size of montmorillonite nanoparticles isolated from natural bentonite obtained an average diameter of 82.15 nm.</em></p>

Sign in / Sign up

Export Citation Format

Share Document