Low Temperature Scanning Electron Microscope for Fabrication and Characterization of High-Tc Josephson Junctions and Circuits

2000 ◽  
Author(s):  
Judy Wu ◽  
Siyuan Han
Keyword(s):  
Electron Microscope ◽  
Low Temperature ◽  
Scanning Electron Microscope ◽  
Josephson Junctions ◽  
High Tc ◽  
Fabrication And Characterization ◽  
Temperature Scanning ◽  
Scanning Electron

Nanomanipulator-assisted fabrication and characterization of carbon nanotubes inside scanning electron microscope

Micron ◽  
2005 ◽  
Vol 36 (5) ◽  
pp. 471-476 ◽  
Author(s):  
Seong Chu Lim ◽  
Keun Soo Kim ◽  
Im Bok Lee ◽  
Seung Yol Jeong ◽  
Shinje Cho ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Fabrication And Characterization ◽  
Scanning Electron

scholarly journals Fabrication and characterization of solid-state nanopores using a field emission scanning electron microscope

2006 ◽  
Vol 88 (10) ◽  
pp. 103109 ◽  
Author(s):  
Hung Chang ◽  
Samir M. Iqbal ◽  
Eric A. Stach ◽  
Alexander H. King ◽  
Nestor J. Zaluzec ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Solid State ◽  
Scanning Electron Microscope ◽  
Field Emission ◽  
Fabrication And Characterization ◽  
Scanning Electron

Low-temperature Scanning Electron Microscope constructed with high-excitation objective lens

1989 ◽  
Vol 47 ◽  
pp. 734-735
Author(s):  
H. Koike ◽  
T. Inoué
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Low Temperature ◽  
Scanning Electron Microscope ◽  
Freeze Substitution ◽  
Objective Lens ◽  
Rapid Freezing ◽  
High Excitation ◽  
Temperature Scanning ◽  
Scanning Electron

Low temperature microscope technology can be traced back to the last century including the time of light microscope, and its history is over a hundred years. In the field of electron microscopy, low temperature techniques such as the freeze-fracture replica, freeze-sectioning, freeze-substitution, etc. were tested up to early 1960s. According to the progress of the rapid-freezing method, the freeze-substitution and freeze-etching replica methods have provided great successful results.The low temperature scanning electron microscope (LTSEM) was also tested by Echlin et al. in 1970, and thereafter, a number of LTSEM constructions were attempted. These LTSEMs are generally classified into two groups: the type with fracturing and coating facilities directly attached to the SEM column, and the group having a separated preparation chamber and a transfer device. The LTSEM so far constructed were reviewed comprehensively in greater detail. Some such instruments were designed taking account of stringent requirements of low temperature techniques. These systems, however, seemed to be too comprehensive, involving complex procedures as compared withe their resolutions. In comparison with the conspicuous results obtained by other low temperature techniques, the LTSEM can be regarded as still in the stage prior to practical application from the viewpoint of the high resolution. In consideration of these circumstances, the present paper aims at providing a new LTSEM to realize simple operation retaining the advantage of the ultrastructural preservation by the rapid-freezing and the high resolution by introducing the high-excitation objective lens.

Low temperature scanning electron microscope measurements on a Nb/Ta junction

1997 ◽  
Vol 279 (1-2) ◽  
pp. 85-94 ◽  
Author(s):  
J.B. le Grand ◽  
M.P. Bruijn ◽  
C. Patel ◽  
P.A.J. de Korte ◽  
S. Lemke ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Low Temperature ◽  
Scanning Electron Microscope ◽  
Temperature Scanning ◽  
Scanning Electron

Low temperature scanning electron microscope studies of mouse small intestine

1983 ◽  
Vol 132 (2) ◽  
pp. 209-217 ◽  
Author(s):  
K. E. Carr ◽  
T. L. Hayes ◽  
M. McKoon ◽  
M. Sprague ◽  
S. J. Bastacky
Keyword(s):  
Small Intestine ◽  
Electron Microscope ◽  
Low Temperature ◽  
Scanning Electron Microscope ◽  
Mouse Small Intestine ◽  
Temperature Scanning ◽  
Scanning Electron

Ice in cement paste as analyzed in the low-temperature scanning electron microscope

1989 ◽  
Vol 19 (2) ◽  
pp. 306-314 ◽  
Author(s):  
Paulo J.M. Monteiro ◽  
Ahmed I. Rashed ◽  
Jacob Bastacky ◽  
Thomas L. Hayes
Keyword(s):  
Electron Microscope ◽  
Low Temperature ◽  
Scanning Electron Microscope ◽  
Cement Paste ◽  
Temperature Scanning ◽  
Scanning Electron
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