Comparative study of different infrared thermal wave imaging techniques for defect detection of composite materials

2019 ◽  
Vol 26 (2) ◽  
2021 ◽  
Vol 63 (12) ◽  
pp. 721-726
Author(s):  
G T Vesala ◽  
V S Ghali ◽  
S Subhani ◽  
Y Naga Prasanthi

In the recent past, quadratic frequency-modulated thermal wave imaging (QFMTWI) has been advanced with a chirp z-transform (CZT)-based processing approach to facilitate enhanced subsurface anomaly detection, depth quantification and material property estimation with enhanced depth resolution. In the present study, the applicability of CZT-based phase analysis for foreign object defect detection in a structural steel sample using QFMTWI is validated through finite element-based numerical modelling rather than experimental verification due to limited available resources. Furthermore, the enhanced defect detection capability of the CZT phase approach is qualitatively compared with the frequency- and time-domain phase approaches using the defect signal-to-noise ratio (SNR) as a quality metric. Also, an empirical relationship between the observed phases and the thermal reflection coefficient is obtained, which recommends the CZT phase as a prominent approach for foreign material defect detection.


1986 ◽  
Vol 82 ◽  
Author(s):  
William F. Regnault

ABSTRACTChemical sensors are being developed for in-dwelling biomedical applications. As sensor technologies progress, there is a tendency to fabricate more complex devices in a smaller area, thus enabling multiple sensors to be placed within a single in-dwelling catheter. As the active area of the detector is decreased, the defect structure of both the substrate and the various layers that make up the device plays an increasingly significant role in determining the ultimate sensitivity and reliability. A simple screening test to evaluate the viability of the substrate and the interfaces would aid in the initial evaluation of the fabricated device. To this end, thermal-wave imaging techniques have been applied to the study of a dislocation subgrain structure in a polycrystalline silicon wafer. Comparisons have been made between the results obtained using thermal-wave imaging, defect etching studies, and EBIC measurements.


2012 ◽  
Author(s):  
Ravibabu Mulaveesala ◽  
Venkata Nagarjuna P. ◽  
Dadda Ravi ◽  
Muniyappa Amarnath

2019 ◽  
Vol 8 (4) ◽  
pp. 9754-9757

Non-destructive testing plays a vital role in industrial and biomedical applications. Non-stationary stimulation based active Infrared thermography is an emerging area of interest in subsurface defect detection and visualization. In present article, frequency modulated thermal wave imaging is employed on a numerical simulation to detect defects of CFRP specimen and applied various post processing techniques such as FFT phase, Pulse compression, principal component analysis and random projection transform for better defect detection. Defect Signal to noise ratios considered as merit of analysis.


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