Low-frequency noise and charge carrier transfer mechanisms in composites of carbon nanoparticles and dielectric matrix

2021 ◽  
Author(s):  
◽  
Marina Tretjak
Keyword(s):  
Charge Carrier ◽  
Carbon Nanoparticles ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Dielectric Matrix ◽  
Carrier Transfer ◽  
Transfer Mechanisms

scholarly journals Volume charge carrier number fluctuations probed by low frequency noise measurements in InN layers

2011 ◽  
Vol 98 (25) ◽  
pp. 252104 ◽  
Author(s):  
Geeta Rani Mutta ◽  
Jean Marc Routoure ◽  
Bruno Guillet ◽  
Laurence Méchin ◽  
Javier Grandal ◽  
...  
Keyword(s):  
Charge Carrier ◽  
Low Frequency ◽  
Frequency Noise ◽  
Volume Charge ◽  
Low Frequency Noise ◽  
Noise Measurements

scholarly journals The charge carrier capture–emission process – the main source of the low-frequency noise in homogeneous semiconductors

2017 ◽  
Vol 56 (4) ◽  
pp. 200-206 ◽  
Author(s):  
Vilius Palenskis
Keyword(s):  
Charge Carrier ◽  
Noise Level ◽  
Relaxation Times ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Carrier Capture ◽  
Emission Process ◽  
Minimum Number ◽  
Charge Carrier Capture

The possibility of determination of the number of localized capture centers of defects (relaxators) that cause low-frequency noise in a particular frequency range has been investigated. Here it is shown that a minimum number of relaxators is needed to generate 1/f type low-frequency noise only when relaxation times are arbitrarily distributed one-by-one in every two-octave range. The expression for estimation of the low-frequency noise level of the sample under test is presented. The presented expression for 1/f noise explains not only the noise level dependence both on the frequency and number of defects in the sample but also the observed noise intensity dependence on the mobility of free charge carriers. It is shown that the main source that causes low-frequency noise in homogeneous semiconductors is the charge carrier capture–emission process.

Estimating the Quality of Thermionic Cathodes for Microwave Vacuum Tubes Using the Low-Frequency Noise Parameters

Vestnik MEI ◽  
2018 ◽  
Vol 5 (5) ◽  
pp. 120-127
Author(s):  
Mikhail D. Vorobyev ◽  
◽  
Dmitriy N. Yudaev ◽  
Andrey Yu. Zorin ◽  
◽  
...  
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Noise Parameters ◽  
Thermionic Cathodes ◽  
Vacuum Tubes

Simulation of Low Frequency Noise in a CCTWT

1999 ◽  
Author(s):  
Charles K. Birdsall ◽  
J. P. Varboncoeur ◽  
P. J. Christensen
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise

Impacts of low-frequency noise from industrial sources in residential areas

2021 ◽  
Vol 182 ◽  
pp. 108203
Author(s):  
Lígia T. Silva ◽  
Alda Magalhães ◽  
José Ferreira Silva ◽  
Fernando Fonseca
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Residential Areas ◽  
Industrial Sources

scholarly journals LOW-FREQUENCY NOISE MEASUREMENTS OF IR PHOTODETECTORS WITH VOLTAGE CROSS CORRELATION SYSTEM

Measurement ◽  
2021 ◽  
pp. 109867
Author(s):  
Krzysztof ACHTENBERG ◽  
Janusz MIKOŁAJCZYK ◽  
Carmine CIOFI ◽  
Graziella SCANDURRA ◽  
Krystian MICHALCZEWSKI ◽  
...  
Keyword(s):  
Cross Correlation ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Ir Photodetectors ◽  
Noise Measurements ◽  
Correlation System
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