MAXIMUM SPECIFIC POWER OF CAPACITIVE ELECTROSTATIC MOTORS WITH A METAL - THIN-FILM FERROELECTRIC STRUCTURE

I.L. Baginsky

doi:10.15372/aut20210310

MAXIMUM SPECIFIC POWER OF CAPACITIVE ELECTROSTATIC MOTORS WITH A METAL - THIN-FILM FERROELECTRIC STRUCTURE

Автометрия ◽

10.15372/aut20210310 ◽

2021 ◽

Vol 57 (3) ◽

pp. 85-91

Author(s):

I.L. Baginsky

Keyword(s):

Thin Film ◽

Specific Power ◽

Metal Thin Film ◽

Ferroelectric Structure

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Ultimate Specific Power of Capacity Electrostatic Motors Having Metal–Thin Film Ferroelectric Design

Optoelectronics Instrumentation and Data Processing ◽

10.3103/s8756699021030031 ◽

2021 ◽

Vol 57 (3) ◽

pp. 297-302

Author(s):

I. L. Baginsky

Keyword(s):

Thin Film ◽

Specific Power ◽

Metal Thin Film

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In-situ investigation by X-ray diffraction and wafer curvature of phase formation and stress evolution during metal thin film – silicon reactions

Zeitschrift für Kristallographie Supplements ◽

10.1524/zksu.2007.2007.suppl_26.81 ◽

2007 ◽

Vol 2007 (suppl_26) ◽

pp. 81-89

Author(s):

O. Thomas

Keyword(s):

Thin Film ◽

Phase Formation ◽

Stress Evolution ◽

X Ray Diffraction ◽

X Ray ◽

Wafer Curvature ◽

Thin Film Silicon ◽

Metal Thin Film ◽

In Situ Investigation

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Comments on “electron emission from metal-CdS-insulator-metal and metal-insulator-CdS-metal thin film devices”

Thin Solid Films ◽

10.1016/0040-6090(72)90358-6 ◽

1972 ◽

Vol 11 (1) ◽

pp. 187-189 ◽

Cited By ~ 5

Author(s):

R.A. Collins

Keyword(s):

Thin Film ◽

Electron Emission ◽

Metal Insulator ◽

Metal Thin Film ◽

Thin Film Devices

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Atomic emission stratigraphy by laser-induced plasma spectroscopy: Quantitative depth profiling of metal thin film systems

Applied Surface Science ◽

10.1016/j.apsusc.2014.01.125 ◽

2014 ◽

Vol 302 ◽

pp. 189-193 ◽

Cited By ~ 16

Author(s):

Tristan O. Nagy ◽

Ulrich Pacher ◽

Hannes Pöhl ◽

Wolfgang Kautek

Keyword(s):

Thin Film ◽

Depth Profiling ◽

Atomic Emission ◽

Plasma Spectroscopy ◽

Laser Induced Plasma ◽

Metal Thin Film

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Wrenching of a metal thin film on a structured polymer layer

Journal of Physics Condensed Matter ◽

10.1088/0953-8984/18/41/007 ◽

2006 ◽

Vol 18 (41) ◽

pp. 9403-9413 ◽

Cited By ~ 1

Author(s):

S Joon Kwon

Keyword(s):

Thin Film ◽

Polymer Layer ◽

Metal Thin Film

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Single-step fabrication of double-layered metal thin film pattern for the electrodes of electronic devices

Current Applied Physics ◽

10.1016/j.cap.2011.07.025 ◽

2011 ◽

Vol 11 (4) ◽

pp. S179-S182 ◽

Cited By ~ 4

Author(s):

Hyeonggeun Yu ◽

Hyunkwon Shin ◽

Myeongkyu Lee

Keyword(s):

Thin Film ◽

Electronic Devices ◽

Single Step ◽

Metal Thin Film

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A UHV chamber for metal-semiconductor and metal-metal thin film studies

Nuclear Instruments and Methods ◽

10.1016/0029-554x(78)90955-2 ◽

1978 ◽

Vol 149 (1-3) ◽

pp. 701-704 ◽

Cited By ~ 3

Author(s):

C.A. Crider ◽

J.M. Poate ◽

J.E. Rowe ◽

G.H. Wheatley

Keyword(s):

Thin Film ◽

Film Studies ◽

Metal Thin Film ◽

Metal Metal

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Measurement of the proximity effect in ferromagnetic‐normal metal thin film sandwiches

Journal of Applied Physics ◽

10.1063/1.329656 ◽

1981 ◽

Vol 52 (3) ◽

pp. 1617-1619 ◽

Cited By ~ 19

Author(s):

R. Meservey ◽

P. M. Tedrow ◽

V. R. Kalvey

Keyword(s):

Thin Film ◽

Proximity Effect ◽

Normal Metal ◽

Metal Thin Film

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Room temperature interactions in Au/metal and Al/metal thin film couples

Thin Solid Films ◽

10.1016/0040-6090(81)90400-4 ◽

1981 ◽

Vol 75 (3) ◽

pp. 229-235 ◽

Cited By ~ 20

Author(s):

Ž. Marinković ◽

V. Simić

Keyword(s):

Thin Film ◽

Room Temperature ◽

Metal Thin Film ◽

Temperature Interactions

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Measurement of thickness of metal thin film by using chromatic confocal spectral technology

Optics and Precision Engineering ◽

10.3788/ope.20111901.0017 ◽

2011 ◽

Vol 19 (1) ◽

pp. 17-22 ◽

Cited By ~ 1

Author(s):

马小军 MA Xiao-jun ◽

高党忠 GAO Dang-zhong ◽

杨蒙生 YANG Meng-sheng ◽

赵学森 ZHAO Xue-sen ◽

叶成钢 YE Cheng-gang ◽

...

Keyword(s):

Thin Film ◽

Metal Thin Film ◽

Measurement Of Thickness

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