Field Ion Microscopy of Surface Structures on an Atomic Scale

2009 ◽  
pp. 80-80-19
Author(s):  
E. W. Müller
Keyword(s):  
Surface Structures ◽  
Atomic Scale ◽  
Field Ion Microscopy ◽  
Ion Microscopy

scholarly journals Nanometer Scale Tomographic Investigation of Fine Scale Precipitates in a CuFeNi Granular System by Three-Dimensional Field Ion Microscopy

2012 ◽  
Vol 18 (5) ◽  
pp. 1129-1134 ◽  
Author(s):  
Sophie Cazottes ◽  
François Vurpillot ◽  
Abdeslem Fnidiki ◽  
Dany Lemarchand ◽  
Marcello Baricco ◽  
...  
Keyword(s):  
Three Dimensional ◽  
Precise Determination ◽  
Atomic Scale ◽  
Granular System ◽  
Field Ion Microscopy ◽  
Mean Diameter ◽  
The Matrix ◽  
The Mean ◽  
Ion Microscopy

AbstractThe microstructure of Cu80Fe10Ni10 (at. %) granular ribbons was investigated by means of three-dimensional field ion microscopy (3D FIM). This ribbon is composed of magnetic precipitates embedded in a nonmagnetic matrix. The magnetic precipitates have a diameter smaller than 5 nm in the as-spun state and are coherent with the matrix. No accurate characterization of such a microstructure has been performed so far. A tomographic characterization of the microstructure of melt spun and annealed Cu80Fe10Ni10 ribbon was achieved with 3D FIM at the atomic scale. A precise determination of the size distribution, number density, and distance between the precipitates was carried out. The mean diameter for the precipitates is 4 nm in the as-spun state. After 2 h at 350°C, there is an increase of the size of the precipitates, while after 2 h at 400°C the mean diameter of the precipitates decreases. Those data were used as inputs in models that describe the magnetic and magnetoresistive properties of this alloy.

True Atomic-Scale Imaging in Three Dimensions: A Review of the Rebirth of Field-Ion Microscopy

2017 ◽  
Vol 23 (2) ◽  
pp. 210-220 ◽  
Author(s):  
Francois Vurpillot ◽  
Frédéric Danoix ◽  
Matthieu Gilbert ◽  
Sebastian Koelling ◽  
Michal Dagan ◽  
...  
Keyword(s):  
Three Dimensional ◽  
Atom Probe ◽  
Image Sequences ◽  
Atomic Scale ◽  
Three Dimensions ◽  
Physical Metallurgy ◽  
Science And Engineering ◽  
Computing Power ◽  
Field Ion Microscopy ◽  
Ion Microscopy

AbstractThis article reviews recent advances utilizing field-ion microscopy (FIM) to extract atomic-scale three-dimensional images of materials. This capability is not new, as the first atomic-scale reconstructions of features utilizing FIM were demonstrated decades ago. The rise of atom probe tomography, and the application of this latter technique in place of FIM has unfortunately severely limited further FIM development. Currently, the ubiquitous availability of extensive computing power makes it possible to treat and reconstruct FIM data digitally and this development allows the image sequences obtained utilizing FIM to be extremely valuable for many material science and engineering applications. This article demonstrates different applications of these capabilities, focusing on its use in physical metallurgy and semiconductor science and technology.

Atomic-Scale Analysis of Metamorphic Magnetite using Field Ion Microscopy and Atom Probe Tomography

2004 ◽  
Vol 10 (S02) ◽  
pp. 512-513 ◽  
Author(s):  
K R Kuhlman ◽  
T F Kelly ◽  
M K Miller
Keyword(s):  
Atom Probe Tomography ◽  
Atom Probe ◽  
Atomic Scale ◽  
Scale Analysis ◽  
Field Ion Microscopy ◽  
Ion Microscopy

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

On the structure and chemistry of Ni3Al on an atomic scale via atom-probe field-ion microscopy

1995 ◽  
Vol 90 (1) ◽  
pp. 95-105 ◽  
Author(s):  
G.P.E.M. Van Bakel ◽  
K. Hariharan ◽  
D.N. Seidman
Keyword(s):  
Atom Probe ◽  
Atomic Scale ◽  
Probe Field ◽  
Field Ion Microscopy ◽  
Ion Microscopy
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