Atom probe field-ion microscopy: A technique for microstructural characterization of irradiated materials on the atomic scale

1989 ◽  
Vol 20 (12) ◽  
pp. 2651-2661 ◽  
Author(s):  
M. K. Miller ◽  
M. G. Hetherington ◽  
M. G. Burke
Keyword(s):  
Microstructural Characterization ◽  
Atom Probe ◽  
Atomic Scale ◽  
Probe Field ◽  
Field Ion Microscopy ◽  
Ion Microscopy

Characterization of Internal Interfaces by Atom Probe Field Ion Microscopy

1992 ◽  
Vol 295 ◽  
Author(s):  
M. K. Miller ◽  
Raman Jayaram
Keyword(s):  
Grain Boundaries ◽  
Compositional Analysis ◽  
Atom Probe ◽  
Probe Field ◽  
Field Ion Microscopy ◽  
Surrounding Matrix ◽  
Wide Range ◽  
Ion Microscopy ◽  
Field Ion Microscope

AbstractThe near atomic spatial resolution of the atom probe field ion microscope permits the elemental characterization of internal interfaces, grain boundaries and surfaces to be performed in a wide variety of materials. Information such as the orientation relationship between grains, topology of the interface, and the coherency of small precipitates with the surrounding matrix may be obtained from field ion microscopy. Details of the solute segregation may be obtained at the plane of the interface and as a function of distance from the interface for all elements simultaneously from atom probe compositional analysis. The capabilities and limitations of the atom probe technique in the characterization of internal interfaces is illustrated with examples of grain boundaries and interphase interfaces in a wide range of materials including intermetallics, model alloys, and commercial steels.

On the structure and chemistry of Ni3Al on an atomic scale via atom-probe field-ion microscopy

1995 ◽  
Vol 90 (1) ◽  
pp. 95-105 ◽  
Author(s):  
G.P.E.M. Van Bakel ◽  
K. Hariharan ◽  
D.N. Seidman
Keyword(s):  
Atom Probe ◽  
Atomic Scale ◽  
Probe Field ◽  
Field Ion Microscopy ◽  
Ion Microscopy

scholarly journals Introduction: A Special Issue on Nanoscale Characterization Using Atom Probe Field Ion Microscopy

2004 ◽  
Vol 10 (3) ◽  
pp. 323-323 ◽  
Author(s):  
D.J. Larson
Keyword(s):  
Real World ◽  
Atom Probe ◽  
Atomic Scale ◽  
The Internet ◽  
Quebec City ◽  
Special Issue ◽  
Probe Field ◽  
Field Ion Microscopy ◽  
Nanoscale Characterization ◽  
Ion Microscopy

While searching the internet for “nanotechnology,” I was not surprised to find many definitions. Two of these are as follows: (1) nanotechnology is the development and use of devices that have a size of only a few nanometers; and (2) nanotechnology can best be considered as a “catch-all” description of activities at the level of atoms and molecules that have applications in the real world. While nanotechnology is usually focused on the building of structures at the atomic scale, the characterization of such structures should also be considered as nanotechnology. At the Microscopy and Microanalysis 2002 Meeting in Quebec City, together with Tom Kelly and Mike Thompson, I organized a symposium entitled “Advances in Nanoscale Technology.” The response to this symposium was impressive, with 32 contributed and 7 invited presentations. Some of these presentations concentrated on atom probe field ion microscopy and form the basis for the invited contributions in this special issue of Microscopy and Microanalysis.

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