Effect of Irradiation on the Fracture Properties of Zr-2.5Nb Pressure Tubes at the End of Design Life

Author(s):  
ZL Pan ◽  
S St Lawrence ◽  
PH Davies ◽  
M Griffiths ◽  
S Sagat
2005 ◽  
Vol 2 (9) ◽  
pp. 12436 ◽  
Author(s):  
ZL Pan ◽  
S St Lawrence ◽  
PH Davies ◽  
M Griffiths ◽  
S Sagat

Author(s):  
RR Hosbons ◽  
PH Davies ◽  
M Griffiths ◽  
S Sagat ◽  
CE Coleman

1997 ◽  
Vol 473 ◽  
Author(s):  
David R. Clarke

ABSTRACTAs in other engineered structures, fracture occasionally occurs in integrated microelectronic circuits. Fracture can take a number of forms including voiding of metallic interconnect lines, decohesion of interfaces, and stress-induced microcracking of thin films. The characteristic feature that distinguishes such fracture phenomena from similar behaviors in other engineered structures is the length scales involved, typically micron and sub-micron. This length scale necessitates new techniques for measuring mechanical and fracture properties. In this work, we describe non-contact optical techniques for probing strains and a microscopic “decohesion” test for measuring interface fracture resistance in integrated circuits.


2015 ◽  
Vol 105 (37) ◽  
pp. 1-8
Author(s):  
Yongjoo Jung ◽  
Chungyoung Cho ◽  
Hongsik Kim ◽  
Dongjin Lee ◽  
Heungbae Gil ◽  
...  
Keyword(s):  

2002 ◽  
Vol 17 (1) ◽  
pp. 45-49 ◽  
Author(s):  
Gongde Zhang ◽  
Eero Hiltunen ◽  
Jaakko E. Laine ◽  
Hannu Paulapuro ◽  
Heikki Kettunen ◽  
...  
Keyword(s):  

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