Statistical Analysis of Pitting Corrosion in Condenser Tubes

2009 ◽  
pp. 109-109-13 ◽  
Author(s):  
JP Ault ◽  
GA Gehring
Keyword(s):  
Statistical Analysis ◽  
Pitting Corrosion

Statistical Analysis of Pitting Corrosion Field Data and Their Use for Realistic Reliability Estimations in Non-Piggable Pipeline Systems

CORROSION ◽  
10.5006/1195 ◽  
2014 ◽  
Vol 70 (11) ◽  
pp. 1090-1100 ◽  
Author(s):  
Alma Valor ◽  
Francisco Caleyo ◽  
Lester Alfonso ◽  
Julio Vidal ◽  
José M. Hallen
Keyword(s):  
Statistical Analysis ◽  
Pitting Corrosion ◽  
Field Data ◽  
Pipeline Systems

Statistical analysis of the pitting corrosion induced by potentiostatic pulse tests of wrought and SLM 316L stainless steels

2021 ◽  
pp. 110036
Author(s):  
Arthur Racot ◽  
Isabelle Aubert ◽  
Marie Touzet ◽  
Stéphanie Thiebaut ◽  
Michel Demesy
Keyword(s):  
Statistical Analysis ◽  
Pitting Corrosion ◽  
Stainless Steels

On the pitting corrosion behavior of ultrafine‐grained aluminum processed by ECAP: A statistical analysis

2020 ◽  
Vol 71 (8) ◽  
pp. 1244-1256
Author(s):  
Marcelo V. Quartiermeister ◽  
Danielle C. C. Magalhães ◽  
Guilherme S. Vacchi ◽  
Diogo P. Braga ◽  
Rodrigo Silva ◽  
...  
Keyword(s):  
Statistical Analysis ◽  
Corrosion Behavior ◽  
Pitting Corrosion ◽  
Ultrafine Grained

scholarly journals The Pitting Corrosion Behavior of the Austenitic Stainless Steel 308L-316L Welded Joint

Metals ◽  
2020 ◽  
Vol 10 (9) ◽  
pp. 1258
Author(s):  
Jinshan He ◽  
Shiguang Xu ◽  
Wenxin Ti ◽  
Yaolei Han ◽  
Jinna Mei ◽  
...  
Keyword(s):  
Stainless Steel ◽  
Corrosion Resistance ◽  
Statistical Analysis ◽  
Austenitic Stainless Steel ◽  
Passive Film ◽  
Pitting Corrosion ◽  
Welded Joint ◽  
Weld Zone ◽  
Electrochemical Tests ◽  
Pitting Corrosion Resistance

The pitting corrosion resistance of the austenitic stainless steel 308L-316L welded joint was investigated by electrochemical tests. It is found that the weld zone was the most critical for pits to initiate in the welded joint due to relatively instable passive film with few Mo and inhomogeneous passive film induced by multiple (Mn, Al, and Si) oxides and continuous network of 13.94 vol.% δ ferrites. By statistical analysis, 53.8% pits initiated at (Mn, Al, and Si) oxides, 23.0% in austenite, and 23.2% at interface between ferrite and austenite. In addition, heat-affected zone was prone to have pitting corrosion compared with the base metal since residual strain was much higher in the region.

Statistical analysis of classification

1966 ◽  
Vol 24 ◽  
pp. 188-189
Author(s):  
T. J. Deeming
Keyword(s):  
Multivariate Analysis ◽  
Statistical Analysis ◽  
Classification Scheme ◽  
Analytical Procedure ◽  
Narrow Band ◽  
Scientific Research ◽  
Maximum Amount ◽  
Amount Of Information

If we make a set of measurements, such as narrow-band or multicolour photo-electric measurements, which are designed to improve a scheme of classification, and in particular if they are designed to extend the number of dimensions of classification, i.e. the number of classification parameters, then some important problems of analytical procedure arise. First, it is important not to reproduce the errors of the classification scheme which we are trying to improve. Second, when trying to extend the number of dimensions of classification we have little or nothing with which to test the validity of the new parameters.Problems similar to these have occurred in other areas of scientific research (notably psychology and education) and the branch of Statistics called Multivariate Analysis has been developed to deal with them. The techniques of this subject are largely unknown to astronomers, but, if carefully applied, they should at the very least ensure that the astronomer gets the maximum amount of information out of his data and does not waste his time looking for information which is not there. More optimistically, these techniques are potentially capable of indicating the number of classification parameters necessary and giving specific formulas for computing them, as well as pinpointing those particular measurements which are most crucial for determining the classification parameters.

Quantitative parallel EELS spectrum imaging developed as a new tool in AEM

1992 ◽  
Vol 50 (2) ◽  
pp. 1202-1203
Author(s):  
Gianluigi Botton ◽  
Gilles L'espérance
Keyword(s):  
Statistical Analysis ◽  
Spatial Resolution ◽  
Personal Computer ◽  
Systematic Study ◽  
Present Author ◽  
Chemical Elements ◽  
Detection Limits ◽  
Research Groups ◽  
Quantitative Performance ◽  
Spectrum Imaging

As interest for parallel EELS spectrum imaging grows in laboratories equipped with commercial spectrometers, different approaches were used in recent years by a few research groups in the development of the technique of spectrum imaging as reported in the literature. Either by controlling, with a personal computer both the microsope and the spectrometer or using more powerful workstations interfaced to conventional multichannel analysers with commercially available programs to control the microscope and the spectrometer, spectrum images can now be obtained. Work on the limits of the technique, in terms of the quantitative performance was reported, however, by the present author where a systematic study of artifacts detection limits, statistical errors as a function of desired spatial resolution and range of chemical elements to be studied in a map was carried out The aim of the present paper is to show an application of quantitative parallel EELS spectrum imaging where statistical analysis is performed at each pixel and interpretation is carried out using criteria established from the statistical analysis and variations in composition are analyzed with the help of information retreived from t/γ maps so that artifacts are avoided.

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