Raman Spectroscopy Investigation of a Manganese Oxide Layer Caused by Water Corrosion on an IrMn Thin Film

2021 ◽  
Vol 10 (1) ◽  
pp. 20210060
Author(s):  
Kunpot Mopoung ◽  
Pattana Suwanyangyaun ◽  
Kanogkwan Sawaengsai ◽  
Laddawan Supadee ◽  
Noppadon Nuntawong ◽  
...  
Keyword(s):  
Thin Film ◽  
Raman Spectroscopy ◽  
Manganese Oxide ◽  
Oxide Layer

Combinatorial (Ba,Sr)TiO3 thin film growth: X-ray diffraction and Raman spectroscopy

2009 ◽  
Vol 106 (3) ◽  
pp. 034108 ◽  
Author(s):  
H. Bouyanfif ◽  
J. Wolfman ◽  
M. El Marssi ◽  
Y. Yuzyuk ◽  
R. Bodeux ◽  
...  
Keyword(s):  
Thin Film ◽  
Raman Spectroscopy ◽  
Film Growth ◽  
Thin Film Growth ◽  
Tio3 Thin Film ◽  
X Ray Diffraction ◽  
X Ray

Chemical Bath Deposition of Lead Sulphide (PbS) Thin Film and their Characterization

2013 ◽  
Vol 209 ◽  
pp. 111-115 ◽  
Author(s):  
Sandip V. Bhatt ◽  
M.P. Deshpande ◽  
Bindiya H. Soni ◽  
Nitya Garg ◽  
Sunil H. Chaki
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Raman Spectroscopy ◽  
Thin Film Deposition ◽  
Film Deposition ◽  
Excitation Wavelength ◽  
Face Centered Cubic ◽  
Phonon Modes ◽  
Lead Sulphide ◽  
X Ray

Thin film deposition of PbS is conveniently carried out by chemical reactions of lead acetate with thiourea at room temperature. Energy dispersive analysis of X-ray (EDAX), X-ray diffraction (XRD), selected area electron diffraction patterns (SAED), UV-Vis-NIR spectrophotometer, Scanning Electron Microscopy (SEM), Atomic force microscopy (AFM), Photoluminescence (PL) and Raman spectroscopy techniques are used for characterizing thin films. EDAX spectra shows that no impurity is present and XRD pattern indicates face centered cubic structure of PbS thin films. The average crystallite size obtained using XRD is about 15nm calculated using Scherrer’s formula and that determined from Hall-Williamson plot was found to be 18nm. SAED patterns indicate that the deposited PbS thin films are polycrystalline in nature. Blue shift due to quantum confinement was seen from the UV-Vis-NIR absorption spectra of thin film in comparison with bulk PbS. The Photoluminescence spectra obtained for thin film with different excitation sources shows sharp emission peaks at 395nm and its intensity of photoluminescence increases with increasing the excitation wavelength. Raman spectroscopy of deposited thin film was used to study the optical phonon modes at an excitation wavelength of 488nm using (Ar+) laser beam.

Probing disorder and transport properties in polypyrrole thin-film devices by impedance and Raman spectroscopy

2013 ◽  
Vol 46 (36) ◽  
pp. 365306 ◽  
Author(s):  
Vaibhav Varade ◽  
Gajanan V Honnavar ◽  
P Anjaneyulu ◽  
K P Ramesh ◽  
Reghu Menon
Keyword(s):  
Thin Film ◽  
Raman Spectroscopy ◽  
Transport Properties ◽  
Thin Film Devices

scholarly journals Characterization by Raman Spectroscopy of Oxide Layer Formed on Stainless Steels

1990 ◽  
Vol 54 (12) ◽  
pp. 1376-1381 ◽  
Author(s):  
Shozo Inoue ◽  
Hitoshi Uchida ◽  
Mika Morii ◽  
Keiji Koterazawa
Keyword(s):  
Raman Spectroscopy ◽  
Oxide Layer ◽  
Stainless Steels
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