Test Method for Measurement of Interstitial Oxygen Content of Silicon Wafers by Infrared Absorption Spectroscopy with p-Polarized Radiation Incident at the Brewster Angle

10.1520/f1619 ◽  
2003 ◽  
Author(s):  
Keyword(s):  
Oxygen Content ◽  
Absorption Spectroscopy ◽  
Infrared Absorption ◽  
Silicon Wafers ◽  
Brewster Angle ◽  
Test Method ◽  
Interstitial Oxygen ◽  
Infrared Absorption Spectroscopy ◽  
Radiation Incident ◽  
Polarized Radiation

High Resolution Infrared Absorption Spectroscopy of C60 Molecules and Clusters in Parahydrogen Solids

1999 ◽  
Author(s):  
Simon Tam ◽  
Michelle E. DeRose ◽  
Mario E. Fajardo ◽  
Norihito Sogoshi ◽  
Yoshiyasu Kato
Keyword(s):  
High Resolution ◽  
Absorption Spectroscopy ◽  
Infrared Absorption ◽  
Infrared Absorption Spectroscopy

scholarly journals Author Correction: Absolute 13C/12C isotope amount ratio for Vienna PeeDee Belemnite from infrared absorption spectroscopy

2021 ◽  
Author(s):  
Adam J. Fleisher ◽  
Hongming Yi ◽  
Abneesh Srivastava ◽  
Oleg L. Polyansky ◽  
Nikolai F. Zobov ◽  
...  
Keyword(s):  
Absorption Spectroscopy ◽  
Infrared Absorption ◽  
Infrared Absorption Spectroscopy ◽  
Isotope Amount Ratio
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