scholarly journals PV cells electrical parameters measurement

2017 ◽  
Vol 68 (7) ◽  
pp. 74-77 ◽  
Author(s):  
Gabriel Cibira
Keyword(s):  
Contact Surface ◽  
Electrical Measurement ◽  
Parameters Estimation ◽  
Thin Layers ◽  
Optical Parameters ◽  
Electrical Parameters ◽  
Parameters Measurement ◽  
Measurement Approach ◽  
Silicon Cell

Abstract When measuring optical parameters of a photovoltaic silicon cell, precise results bring good electrical parameters estimation, applying well-known physical-mathematical models. Nevertheless, considerable re-combination phenomena might occur in both surface and intrinsic thin layers within novel materials. Moreover, rear contact surface parameters may influence close-area re-combination phenomena, too. Therefore, the only precise electrical measurement approach is to prove assumed cell electrical parameters. Based on theoretical approach with respect to experiments, this paper analyses problems within measurement procedures and equipment used for electrical parameters acquisition within a photovoltaic silicon cell, as a case study. Statistical appraisal quality is contributed.

WOx resistive memory elements for scaled Flash memories

2011 ◽  
Vol 1337 ◽  
Author(s):  
S. Gorji Ghalamestani ◽  
L. Goux ◽  
D.E. Díaz-Droguett ◽  
D. Wouters ◽  
J. G. Lisoni
Keyword(s):  
Resistive Switching ◽  
Photoelectron Spectroscopy ◽  
Time Windows ◽  
Electrical Measurement ◽  
Thin Layers ◽  
Switching Behavior ◽  
Elastic Recoil ◽  
X Ray ◽  
Bipolar Switching ◽  
Switching Characteristics

ABSTRACTWe investigated the resistive switching behavior of WOx films. WOx was obtained from the thermal oxidation of W thin layers. The parameters under investigation were the influence of the temperature (450-500 °C) and time (30-220 s) used to obtain the WOx on the resistive switching characteristics of Si\W\WOx\Metal_electrode ReRAM cells. The metal top electrodes (TE) tested were Pt, Ni, Cu and Au. The elemental composition and microstructure of the samples were characterized by means of elastic recoil detection analysis (ERD), X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM), X-ray diffraction (XRD) and X-ray reflectivity (XRR).Electrical measurement of the WOx-based memory elements revealed bipolar and unipolar switching and this depended upon the oxidation conditions and TE selected. Indeed, switching events were observed in WOx samples obtained either at 450 °C or 500 °C in time windows of 180-200 s and 30-60 s, respectively. Pt and Au TE promoted bipolar switching while unipolar behavior was observed with Ni TE only; no switching events were observed with Cu TE. Good switching characteristics seems not related to the overall thickness, crystallinity and composition of the oxide, but on the W6+/W5+ ratio present on the WOx surface, surface in contact with the TE material. Interestingly, W6+/W5+ ratio can be tuned through the oxidation conditions, showing a path for optimizing the properties of the WOx-based ReRAM cells.

INVESTIGATING ANNEALING EFFECT ON OPTICAL PROPERTIES OF Cd0.8Zn0.2S THIN FILMS

2014 ◽  
Vol 21 (05) ◽  
pp. 1450073 ◽  
Author(s):  
SOMAYEH AZIZI ◽  
HAMID REZAGHOLIPOUR DIZAJI ◽  
MOHAMMAD HOSSEIN EHSANI ◽  
SEYED FEYZOLAH GHAVAMI MIRMAHALLE
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Hexagonal Wurtzite Structure ◽  
Band Gap Energy ◽  
Annealing Effect ◽  
Thin Layers ◽  
Optical Parameters ◽  
Thermal Evaporation Method ◽  
X Ray ◽  
Glass Substrates

Cd 0.8 Zn 0.2 S thin films deposited on glass substrates by thermal evaporation method were annealed at different temperatures for the first time in order to investigate annealing effect on optical properties. The compositional, structural of nanoparticles precursor synthesized using microwave irradiation method and optical properties of the films were studied using energy dispersive X-ray (EDX), X-ray diffraction, transmission electron microscopy (TEM), and UV-visible spectrophotometer techniques. The annealed films were found to have hexagonal Wurtzite structure with strong preferential orientation along the (002) diffraction peak. Important optical parameters such as extinction coefficient and refractive index revealed the effect of heat treatment on the deposited thin layers. A reduction in the band gap energy from 2.41 eV to 2.29 eV was observed for the annealed samples.

Using a novel electrical measurement approach to measure the effects of liming on rooting parameters in German beech forests

2020 ◽  
Author(s):  
Oliver van Straaten ◽  
Jan Čermák ◽  
Larissa Kulp ◽  
Ulrike Talkner
Keyword(s):  
Low Frequency ◽  
Cost Effective ◽  
Electrical Measurement ◽  
Root Surface ◽  
Fine Root Biomass ◽  
Impedance Method ◽  
Root Surface Area ◽  
Beech Forests ◽  
Mature Trees ◽  
Measurement Approach

<p>Hundreds of thousands of hectares have been limed in German forests in the last three decades to mitigate the effects of soil acidification. To understand the long-term impacts of liming on tree rooting behaviour and the implications for soil organic matter, we used a novel electrical approach to quantify rooting parameters of mature beech forests and compared it to the standard monolith excavation approach. At each of the three experiment sites located in northern Germany, we looked at rooting behaviour in limed plots (overall eight tons of lime per hectare applied in the 1980s and 1990s) in comparison to adjacent control plots. First, we used the standard monolith excavation approach to determine fine root biomass at the stand level. With an electrical approach called the “earth impedance method” (EIM) we subsequently estimated tree absorbing root surface area (ARSA; this is the contact area where roots take up nutrients and water). This experimental, non-destructive approach uses a low frequency alternating electric current that flows from the roots to the soil and vice versa, and the electrical impedance (resistivity) is recalculated to estimate ARSA for the sample tree. We measured the ARSA of six mature trees per plot (12 trees per site).</p><p>To summarize the results of the sampling approaches, (1) both root estimation approach measurements were positively correlated, validating the EIM; (2) the ARSA was positively correlated with tree size at each site, further substantiating the rapid and cost effective EIM; (3) however this method is vulnerable to variables that effect electrical conductivity, such as soil moisture and the thickness and makeup of the organic horizons.</p><p>Overall, no significant differences between limed and control plots were detected with either measurement approach, suggesting that despite improved soil pH conditions the tree root systems in limed plots remain relatively constant in size and capacity to take up nutrients and water.</p>

Solar Selective Properties of Electrolytically Formed Thin Layers on Aluminum

2000 ◽  
Vol 122 (2) ◽  
pp. 101-105 ◽  
Author(s):  
T. Mo¨ller ◽  
Th. Schwarz ◽  
D. Ho¨nicke
Keyword(s):  
Sol Gel ◽  
Electrochemical Process ◽  
Thin Layers ◽  
Electrical Parameters ◽  
Electrolytic Bath ◽  
Alumina Layer ◽  
Pulse Technique ◽  
Step Procedure ◽  
One Step ◽  
Enhanced Stability

A novel electrochemical process for the formation of solar selective absorber layers on aluminum is presented. The growth of an alumina layer and the incorporation of metal ions into the layer is done by a one-step procedure using only one electrolytic bath and application of a voltage pulse technique. The influence of selected electrical parameters on the solar selective properties is described and the enhanced stability of an absorber layer, attained by a sol-gel-posttreatment, is discussed. [S0199-6231(00)00602-X]

Design and Implementation of Self-Learning Electrical Measurement System

2014 ◽  
Vol 926-930 ◽  
pp. 1265-1268
Author(s):  
Yuan Cai Chen ◽  
Yun Di Wang
Keyword(s):  
Electric Current ◽  
Virtual Instrument ◽  
Transient State ◽  
Electrical Measurement ◽  
Test Method ◽  
Measurement Technology ◽  
Electrical Parameters ◽  
Instrument Measuring ◽  
Data Acquisition Card ◽  
Continuous Dynamic

Through the electrical parameters measurement technology of autonomic learning, understanding of the system hardware by regulating circuit, data acquisition card and computer. This paper, by learning to solve the traditional electrical parameters test method of testing process is not continuous, dynamic transient state is difficult to send now and positioning problem. Virtual instrument measuring instrument is based on the computer, it has many advantages compared with traditional instrument, has been developing rapidly in recent years. The system finished the electrician experiment of common electrical parameters such as: voltage, electric current; Dc voltage, electric current; a measure of the resistance, capacitance and inductance.

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