scholarly journals Using Anomalous Dispersion Effect for Fourier Transform Analysis of X-ray Reflectivity from Thin-Film Stacks

2007 ◽  
Vol 32 (1) ◽  
pp. 223-225
Author(s):  
Kazuhiro Ueda
Keyword(s):  
Thin Film ◽  
Fourier Transform ◽  
Anomalous Dispersion ◽  
Dispersion Effect ◽  
X Ray

scholarly journals Structural Analysis of Polyelectrolyte Film Absorbing Metal Ion by SAXS Utilizing with X-ray Anomalous Dispersion Effect†

2007 ◽  
Vol 111 (29) ◽  
pp. 8663-8667 ◽  
Author(s):  
Masaaki Sugiyama ◽  
Takao Mitsui ◽  
Takashi Sato ◽  
Yoshinori Akai ◽  
Yuji Soejima ◽  
...  
Keyword(s):  
Structural Analysis ◽  
Metal Ion ◽  
Anomalous Dispersion ◽  
Dispersion Effect ◽  
X Ray ◽  
Polyelectrolyte Film

Structure Investigation of Metal Ions Clustering in Dehydrated Gel Using X-ray Anomalous Dispersion Effect

2003 ◽  
Vol 72 (8) ◽  
pp. 2110-2113 ◽  
Author(s):  
Yuji Soejima ◽  
Shuichiro Kuwajima ◽  
Masaaki Sugiyama ◽  
Masahiko Annaka ◽  
Atsushi Nakamura ◽  
...  
Keyword(s):  
Metal Ions ◽  
Anomalous Dispersion ◽  
Structure Investigation ◽  
Dispersion Effect ◽  
X Ray

Scanning Anomalous Small-Angle Scattering as a Tool to Examine Welded Bulk Glass

2005 ◽  
Vol 475-479 ◽  
pp. 3401-3404 ◽  
Author(s):  
Isao Murase ◽  
Ryoichi Kurosaki ◽  
Hiroshi Okuda ◽  
Shojiro Ochiai ◽  
Y. Yokoyama ◽  
...  
Keyword(s):  
Small Angle ◽  
Amorphous Materials ◽  
Small Angle Scattering ◽  
Anomalous Dispersion ◽  
Dispersion Effect ◽  
Inhomogeneous Materials ◽  
Macroscopic Scale ◽  
X Ray ◽  
Spatially Inhomogeneous ◽  
Angle Scattering

Small-angle scattering measurements utilizing anomalous dispersion effect just below the Zr and Ni K edge have been made for welded Zr-based amorphous materials. The measurements were carried out at a bending magnet beam-line 40B of SPring8. A small and parallel X-ray beam generated at the third generation synchrotron is suitable for nanostructure mapping of heterogeneous materials, whose structure varies with less than a millimeter scale. The remelted and heat-affected zones were examined for electron-beam welded Zr-Ni-Cu-Al alloys. Merits and the characteristics, as well as its present limitations of scanning small-angle scattering with a use of anomalous dispersion effect is discussed as a tool to examine microstructure in the spatially inhomogeneous materials in macroscopic scale as well as microscopic scale.

Layered structure analysis of GMR multilayers by X-ray reflectometry using the anomalous dispersion effect

1998 ◽  
Vol 5 (3) ◽  
pp. 969-971 ◽  
Author(s):  
Tatsumi Hirano ◽  
Katsuhisa Usami ◽  
Kazuhiro Ueda ◽  
Hiroyuki Hoshiya
Keyword(s):  
Absorption Edge ◽  
Layered Structure ◽  
Anomalous Dispersion ◽  
X Rays ◽  
Dispersion Effect ◽  
Accurate Analysis ◽  
Final Thickness ◽  
X Ray ◽  
Interface Width ◽  
Good Agreement

As a basic layered structure for giant magnetoresistive (GMR) heads, NiFe/Cu/NiFe/Ta/Si substrate was measured by X-ray reflectometry at Cu Kα, Cu Kβ and Cu K-absorption-edge energies. The accuracy of both the Cu thickness and the interface width between the upper NiFe and the Cu layers was found to improve in the order Cu Kα < Cu Kβ < Cu K-edge. The final thickness and interface width values obtained from Cu Kβ reflectivity are in good agreement with those from the Cu K-edge. The anomalous-dispersion effect is useful in the more accurate analysis of the layered structure of transition metal multilayers because it causes a large difference in the refractive indices of specific elements near the absorption edge. The Kβ X-rays, which can be produced from conventional X-ray sources, are also available for the accurate analysis of reflectivity measurements.

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