scholarly journals Structural Analysis of Polyelectrolyte Film Absorbing Metal Ion by SAXS Utilizing with X-ray Anomalous Dispersion Effect†

2007 ◽  
Vol 111 (29) ◽  
pp. 8663-8667 ◽  
Author(s):  
Masaaki Sugiyama ◽  
Takao Mitsui ◽  
Takashi Sato ◽  
Yoshinori Akai ◽  
Yuji Soejima ◽  
...  
Keyword(s):  
Structural Analysis ◽  
Metal Ion ◽  
Anomalous Dispersion ◽  
Dispersion Effect ◽  
X Ray ◽  
Polyelectrolyte Film

Structural analysis of excess-anion C-type rare earth oxide: a case study with Gd1−xCexO1.5+x/2(x= 0.20 and 0.40)

2003 ◽  
Vol 36 (4) ◽  
pp. 1082-1084 ◽  
Author(s):  
V. Grover ◽  
S. N. Achary ◽  
A. K. Tyagi
Keyword(s):  
Rare Earth ◽  
Structural Analysis ◽  
Metal Ion ◽  
Rare Earth Oxide ◽  
Charge Balance ◽  
X Ray Diffraction ◽  
X Ray ◽  
Cell Parameters ◽  
Lattice Space

Structural analysis of anion-rich C-type Gd2O3was carried by the Rietveld refinement of the powder X-ray diffraction data for compositions Gd0.8Ce0.2O1.60and Gd0.6Ce0.4O1.70. Both compounds have a body-centred cubic lattice (space groupIa\bar{3}, No. 206,Z= 32) with unit-cell parameters of 10.8488 (1) and 10.8542 (1) Å, respectively. Both of these compounds are iso-structural with the C-type rare earth oxides, with excess anions as required for charge balance. The structural analysis reveals that there are two different kinds of metal ion site, namely 8b(M1) and 24d(M2), and two different kinds of anion sites, namely 48e(O1) and 16c(O2). The excess anions occupy the 16c(xxx) sites. The two metal ions each form an approximately eightfold-coordination polyhedron with O1 and O2. The details of these two compositions are explained and compared with both the CeO2structure and the Gd2O3structure,i.e.the end member.

Structure Investigation of Metal Ions Clustering in Dehydrated Gel Using X-ray Anomalous Dispersion Effect

2003 ◽  
Vol 72 (8) ◽  
pp. 2110-2113 ◽  
Author(s):  
Yuji Soejima ◽  
Shuichiro Kuwajima ◽  
Masaaki Sugiyama ◽  
Masahiko Annaka ◽  
Atsushi Nakamura ◽  
...  
Keyword(s):  
Metal Ions ◽  
Anomalous Dispersion ◽  
Structure Investigation ◽  
Dispersion Effect ◽  
X Ray

Scanning Anomalous Small-Angle Scattering as a Tool to Examine Welded Bulk Glass

2005 ◽  
Vol 475-479 ◽  
pp. 3401-3404 ◽  
Author(s):  
Isao Murase ◽  
Ryoichi Kurosaki ◽  
Hiroshi Okuda ◽  
Shojiro Ochiai ◽  
Y. Yokoyama ◽  
...  
Keyword(s):  
Small Angle ◽  
Amorphous Materials ◽  
Small Angle Scattering ◽  
Anomalous Dispersion ◽  
Dispersion Effect ◽  
Inhomogeneous Materials ◽  
Macroscopic Scale ◽  
X Ray ◽  
Spatially Inhomogeneous ◽  
Angle Scattering

Small-angle scattering measurements utilizing anomalous dispersion effect just below the Zr and Ni K edge have been made for welded Zr-based amorphous materials. The measurements were carried out at a bending magnet beam-line 40B of SPring8. A small and parallel X-ray beam generated at the third generation synchrotron is suitable for nanostructure mapping of heterogeneous materials, whose structure varies with less than a millimeter scale. The remelted and heat-affected zones were examined for electron-beam welded Zr-Ni-Cu-Al alloys. Merits and the characteristics, as well as its present limitations of scanning small-angle scattering with a use of anomalous dispersion effect is discussed as a tool to examine microstructure in the spatially inhomogeneous materials in macroscopic scale as well as microscopic scale.

scholarly journals Location-specific quantification of protein-bound metal ions by X-ray anomalous dispersion: Q-XAD

2019 ◽  
Vol 75 (8) ◽  
pp. 764-771 ◽  
Author(s):  
Julia J. Griese ◽  
Martin Högbom
Keyword(s):  
Metal Ions ◽  
Metal Binding ◽  
Binding Sites ◽  
Metal Ion ◽  
Anomalous Dispersion ◽  
Data Sets ◽  
Data Set ◽  
X Ray ◽  
Anomalous Data ◽  
Specific Metal

Here, a method is described which exploits X-ray anomalous dispersion (XAD) to quantify mixtures of metal ions in the binding sites of proteins and can be applied to metalloprotein crystals of average quality. This method has successfully been used to study site-specific metal binding in a protein from the R2-like ligand-binding oxidase family which assembles a heterodinuclear Mn/Fe cofactor. While previously only the relative contents of Fe and Mn in each metal-binding site have been assessed, here it is shown that the method can be extended to quantify the relative occupancies of at least three different transition metals, enabling complex competition experiments. The number of different metal ions that can be quantified is only limited by the number of high-quality anomalous data sets that can be obtained from one crystal, as one data set has to be collected for each transition-metal ion that is present (or is suspected to be present) in the protein, ideally at the absorption edge of each metal. A detailed description of the method, Q-XAD, is provided.

Layered structure analysis of GMR multilayers by X-ray reflectometry using the anomalous dispersion effect

1998 ◽  
Vol 5 (3) ◽  
pp. 969-971 ◽  
Author(s):  
Tatsumi Hirano ◽  
Katsuhisa Usami ◽  
Kazuhiro Ueda ◽  
Hiroyuki Hoshiya
Keyword(s):  
Absorption Edge ◽  
Layered Structure ◽  
Anomalous Dispersion ◽  
X Rays ◽  
Dispersion Effect ◽  
Accurate Analysis ◽  
Final Thickness ◽  
X Ray ◽  
Interface Width ◽  
Good Agreement

As a basic layered structure for giant magnetoresistive (GMR) heads, NiFe/Cu/NiFe/Ta/Si substrate was measured by X-ray reflectometry at Cu Kα, Cu Kβ and Cu K-absorption-edge energies. The accuracy of both the Cu thickness and the interface width between the upper NiFe and the Cu layers was found to improve in the order Cu Kα < Cu Kβ < Cu K-edge. The final thickness and interface width values obtained from Cu Kβ reflectivity are in good agreement with those from the Cu K-edge. The anomalous-dispersion effect is useful in the more accurate analysis of the layered structure of transition metal multilayers because it causes a large difference in the refractive indices of specific elements near the absorption edge. The Kβ X-rays, which can be produced from conventional X-ray sources, are also available for the accurate analysis of reflectivity measurements.

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