Rapid Determination of the Chloride Diffusivity in Concrete by Applying an Electric Field

10.14359/1244 ◽  
1993 ◽  
Vol 89 (1) ◽  
Keyword(s):  
Electric Field ◽  
Rapid Determination ◽  
Chloride Diffusivity

Rapid determination of cell mass and density using digitally controlled electric field in a microfluidic chip

Lab on a Chip ◽  
2014 ◽  
Vol 14 (22) ◽  
pp. 4426-4434 ◽  
Author(s):  
Yuliang Zhao ◽  
Hok Sum Sam Lai ◽  
Guanglie Zhang ◽  
Gwo-Bin Lee ◽  
Wen Jung Li
Keyword(s):  
Computer Vision ◽  
Electric Field ◽  
Single Cell ◽  
Cell Density ◽  
Microfluidic Chip ◽  
Rapid Determination ◽  
Cell Mass ◽  
Digitally Controlled ◽  
Optically Induced

Single-cell density and mass were measured rapidly using a combination of optically induced electrokinetics, microfluidics, computer vision, and classical sedimentation theory.

scholarly journals Rapid determination of single base mismatch mutations in DNA hybrids by direct electric field control

1997 ◽  
Vol 94 (4) ◽  
pp. 1119-1123 ◽  
Author(s):  
R. G. Sosnowski ◽  
E. Tu ◽  
W. F. Butler ◽  
J. P. O'Connell ◽  
M. J. Heller
Keyword(s):  
Electric Field ◽  
Rapid Determination ◽  
Single Base ◽  
Single Base Mismatch ◽  
Base Mismatch ◽  
Field Control

Weak Beam Imaging and Diffraction Studies of Stacking Faults in Silicon

1976 ◽  
Vol 34 ◽  
pp. 590-591
Author(s):  
T. Y. Tan ◽  
W. K. Tice
Keyword(s):  
Fast Neutron ◽  
Rapid Determination ◽  
Stacking Faults ◽  
Imaging Method ◽  
Large Reduction ◽  
Dislocation Loops ◽  
Fringe Spacing ◽  
Weak Beam ◽  
Kinematical Theory

In studying ion implanted semiconductors and fast neutron irradiated metals, the need for characterizing small dislocation loops having diameters of a few hundred angstrom units usually arises. The weak beam imaging method is a powerful technique for analyzing these loops. Because of the large reduction in stacking fault (SF) fringe spacing at large sg, this method allows for a rapid determination of whether the loop is faulted, and, hence, whether it is a perfect or a Frank partial loop. This method was first used by Bicknell to image small faulted loops in boron implanted silicon. He explained the fringe spacing by kinematical theory, i.e., ≃l/(Sg) in the fault fringe in depth oscillation. The fault image contrast formation mechanism is, however, really more complicated.

Methods for rapid determination of pecan (Carya illinoensis) seed viability

2017 ◽  
Vol 45 (2) ◽  
pp. 455-464
Author(s):  
T.T. Xue ◽  
J. Liu ◽  
Y.B. Shen ◽  
G.Q. Liu
Keyword(s):  
Rapid Determination ◽  
Seed Viability ◽  
Carya Illinoensis
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