scholarly journals Self Heating of an Atomic Force Microscope

10.14311/1141 ◽  
2010 ◽  
Vol 50 (1) ◽  
Author(s):  
O. Kučera
Keyword(s):  
Atomic Force Microscopy ◽  
Atomic Force Microscope ◽  
Thermal Noise ◽  
External Noise ◽  
Force Microscopy ◽  
Self Heating ◽  
Atomic Force ◽  
Optical Lever ◽  
Many Sources ◽  
Vibrational Noise

Atomic force microscopy (AFM) is a sensitive technique susceptible to unwanted influences, such as thermal noise, vibrational noise, etc. Although, tools that protect AFM against external noise have been developed and are widely used, there are still many sources of inherent noise. One of them is self-heating of the apparatus. This paper deals with self-heating of the AFM using an optical lever. This phenomenon is shown to be substantial in particular after activation of the microscope. The influence on the intrinsic contact noise of AFM’s is also examined. 

Thermal noise in contact atomic force microscopy

2021 ◽  
Vol 129 (23) ◽  
pp. 234303
Author(s):  
Chengfu Ma ◽  
Chenggang Zhou ◽  
Jinlan Peng ◽  
Yuhang Chen ◽  
Walter Arnold ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Thermal Noise ◽  
Force Microscopy ◽  
Atomic Force

Atomic force microscopy of slip lines in FeAl

1995 ◽  
Vol 10 (9) ◽  
pp. 2159-2161 ◽  
Author(s):  
J.H. Schneibel ◽  
L. Martínez
Keyword(s):  
Atomic Force Microscopy ◽  
Atomic Force Microscope ◽  
Room Temperature ◽  
Frequency Distributions ◽  
Slip Lines ◽  
Force Microscopy ◽  
Atomic Force ◽  
Shear Strains

Fe–40 at. % Al–0.1 at. % B specimens were polished flat, strained at room temperature, and examined in an atomic force microscope. The angles of height contours perpendicular to the slip lines were interpreted as shear strains and were statistically evaluated. The frequency distributions of these shear strains correlated well with the macroscopic strains. The maximum shear strains found were not much larger than the macroscopic strains. In particular, no steep slip steps corresponding to large local shears were found.

Frequency Response of Carbon Nanotube Probes during Tapping Mode of Atomic Force Microscopy

2013 ◽  
Vol 378 ◽  
pp. 466-471
Author(s):  
Po Jen Shih ◽  
Shang Hao Cai
Keyword(s):  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
Atomic Force Microscope ◽  
Frequency Response ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Frequency Responses ◽  
Atomic Force ◽  
Frequency Drop ◽  
Atomic Force Microscope Measurement

The dynamic behaviors of carbon nanotube probes applied in Atomic Force Microscope measurement are of interest in advanced nanoscalar topography. In this paper, we developed the characteristic equations and applied the model analysis to solve the eigenvalues of the microcantilever and the carbon nanotube. The eigenvalues were then used in the tapping mode system to predict the frequency responses against the tip-sample separations. It was found that the frequency drop steeply if the separation was less than certain distances. This instability of frequency is deduced from the jump of microcantilever or the jump of the carbon nanotube. Various lengths and binding angles of the carbon nanotube were considered, and the results indicated that the binding angle dominated the frequency responses and jumps.

scholarly journals Thermal noise limit for ultra-high vacuum noncontact atomic force microscopy

2013 ◽  
Vol 4 ◽  
pp. 32-44 ◽  
Author(s):  
Jannis Lübbe ◽  
Matthias Temmen ◽  
Sebastian Rode ◽  
Philipp Rahe ◽  
Angelika Kühnle ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Signal Processing ◽  
Transfer Function ◽  
Spectral Density ◽  
Thermal Noise ◽  
Noise Spectral Density ◽  
Force Microscopy ◽  
Atomic Force ◽  
Noise Limit ◽  
Signal Processing Electronics

The noise of the frequency-shift signal Δf in noncontact atomic force microscopy (NC-AFM) consists of cantilever thermal noise, tip–surface-interaction noise and instrumental noise from the detection and signal processing systems. We investigate how the displacement-noise spectral density d z at the input of the frequency demodulator propagates to the frequency-shift-noise spectral density d Δ f at the demodulator output in dependence of cantilever properties and settings of the signal processing electronics in the limit of a negligible tip–surface interaction and a measurement under ultrahigh-vacuum conditions. For a quantification of the noise figures, we calibrate the cantilever displacement signal and determine the transfer function of the signal-processing electronics. From the transfer function and the measured d z , we predict d Δ f for specific filter settings, a given level of detection-system noise spectral density d z ds and the cantilever-thermal-noise spectral density d z th. We find an excellent agreement between the calculated and measured values for d Δ f . Furthermore, we demonstrate that thermal noise in d Δ f , defining the ultimate limit in NC-AFM signal detection, can be kept low by a proper choice of the cantilever whereby its Q-factor should be given most attention. A system with a low-noise signal detection and a suitable cantilever, operated with appropriate filter and feedback-loop settings allows room temperature NC-AFM measurements at a low thermal-noise limit with a significant bandwidth.

Characterization of Polysilicon films using atomic force microscopy

1996 ◽  
Vol 424 ◽  
Author(s):  
Francis P. Fehlner ◽  
Chad B. Moore ◽  
J. Greg Couillard
Keyword(s):  
Atomic Force Microscopy ◽  
Atomic Force Microscope ◽  
Force Microscopy ◽  
Atomic Force ◽  
Polysilicon Films

AbstractA simplified technique for characterizing crystallites in polysilicon films has been demonstrated based on use of the atomic force microscope (AFM). The crystallization of films deposited by two different techniques was examined.

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