scholarly journals Preferential Formation of Layered Structure of Ionic Liquid at Ionic Liquid Aqueous Solution / Graphite Electrode Interfaces Observed by Frequency-Modulation Atomic Force Microscopy

2014 ◽  
Vol 12 (0) ◽  
pp. 89-96 ◽  
Author(s):  
Tomohiro Harada ◽  
Yasuyuki Yokota ◽  
Akihito Imanishi ◽  
Ken-ichi Fukui
Keyword(s):  
Aqueous Solution ◽  
Atomic Force Microscopy ◽  
Ionic Liquid ◽  
Frequency Modulation ◽  
Layered Structure ◽  
Graphite Electrode ◽  
Force Microscopy ◽  
Preferential Formation ◽  
Atomic Force

Aqueous Solution Structure over α-Al2O3(011̅2) Probed by Frequency-Modulation Atomic Force Microscopy

2010 ◽  
Vol 114 (49) ◽  
pp. 21423-21426 ◽  
Author(s):  
Takumi Hiasa ◽  
Kenjiro Kimura ◽  
Hiroshi Onishi ◽  
Masahiro Ohta ◽  
Kazuyuki Watanabe ◽  
...  
Keyword(s):  
Aqueous Solution ◽  
Atomic Force Microscopy ◽  
Frequency Modulation ◽  
Solution Structure ◽  
Force Microscopy ◽  
Atomic Force ◽  
Α Al2o3

Molecularly clean ionic liquid/rubrene single-crystal interfaces revealed by frequency modulation atomic force microscopy

2015 ◽  
Vol 17 (10) ◽  
pp. 6794-6800 ◽  
Author(s):  
Yasuyuki Yokota ◽  
Hisaya Hara ◽  
Yusuke Morino ◽  
Ken-ichi Bando ◽  
Akihito Imanishi ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Ionic Liquid ◽  
Single Crystal ◽  
Frequency Modulation ◽  
Field Effect ◽  
Field Effect Transistors ◽  
Force Microscopy ◽  
Atomic Force ◽  
Clean Interface ◽  
Crystal Interfaces

Frequency modulation atomic force microscopy was employed to show a molecularly clean interface between an ionic liquid and a rubrene single crystal for possible applications to electric double-layer field-effect transistors.

Structural investigation of ionic liquid/rubrene single crystal interfaces by using frequency-modulation atomic force microscopy

2013 ◽  
Vol 49 (90) ◽  
pp. 10596 ◽  
Author(s):  
Yasuyuki Yokota ◽  
Hisaya Hara ◽  
Tomohiro Harada ◽  
Akihito Imanishi ◽  
Takafumi Uemura ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Ionic Liquid ◽  
Single Crystal ◽  
Frequency Modulation ◽  
Structural Investigation ◽  
Force Microscopy ◽  
Atomic Force ◽  
Crystal Interfaces

Frequency Modulation Atomic Force Microscopy in Ionic Liquid Using Quartz Tuning Fork Sensors

2012 ◽  
Vol 51 (8S3) ◽  
pp. 08KB08 ◽  
Author(s):  
Takashi Ichii ◽  
Motohiko Fujimura ◽  
Masahiro Negami ◽  
Kuniaki Murase ◽  
Hiroyuki Sugimura
Keyword(s):  
Atomic Force Microscopy ◽  
Ionic Liquid ◽  
Frequency Modulation ◽  
Tuning Fork ◽  
Quartz Tuning Fork ◽  
Force Microscopy ◽  
Atomic Force
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