scholarly journals Contribution of Metal Layer Thickness for Quantitative Backscattered Electron Imaging of Field Emission Scanning Electron Microscopy

2012 ◽  
Vol 10 (0) ◽  
pp. 301-304
Author(s):  
Hyonchol Kim ◽  
Hiroyuki Takei ◽  
Tsutomu Negishi ◽  
Masato Kudo ◽  
Hideyuki Terazono ◽  
...  
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