scholarly journals Highly Sensitive Electrostatic Force Detection Using Small Amplitude Frequency-Modulation Atomic Force Microscopy in the Second Flexural Mode

2011 ◽  
Vol 9 ◽  
pp. 146-152 ◽  
Author(s):  
Keisuke Nishi ◽  
Yoshihiro Hosokawa ◽  
Kei Kobayashi ◽  
Kazumi Matsushige ◽  
Hirofumi Yamada
Keyword(s):  
Atomic Force Microscopy ◽  
Frequency Modulation ◽  
Small Amplitude ◽  
Electrostatic Force ◽  
Force Detection ◽  
Flexural Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Highly Sensitive

Small Amplitude Frequency Modulation Atomic Force Microscopy of Lead Phthalocyanine Molecules Using Cantilever with Very High Spring Constant

2008 ◽  
Vol 47 (7) ◽  
pp. 6125-6127 ◽  
Author(s):  
Yoshihiro Hosokawa ◽  
Takashi Ichii ◽  
Kei Kobayashi ◽  
Kazumi Matsushige ◽  
Hirofumi Yamada
Keyword(s):  
Atomic Force Microscopy ◽  
Frequency Modulation ◽  
Small Amplitude ◽  
Spring Constant ◽  
Force Microscopy ◽  
Atomic Force ◽  
Very High

scholarly journals Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements

2019 ◽  
Vol 10 ◽  
pp. 617-633 ◽  
Author(s):  
Aaron Mascaro ◽  
Yoichi Miyahara ◽  
Tyler Enright ◽  
Omur E Dagdeviren ◽  
Peter Grütter
Keyword(s):  
Atomic Force Microscopy ◽  
Electrostatic Force ◽  
Oscillation Period ◽  
Electrostatic Force Microscopy ◽  
Time Varying ◽  
Time Resolved ◽  
Battery Materials ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Techniques

Recently, there have been a number of variations of electrostatic force microscopy (EFM) that allow for the measurement of time-varying forces arising from phenomena such as ion transport in battery materials or charge separation in photovoltaic systems. These forces reveal information about dynamic processes happening over nanometer length scales due to the nanometer-sized probe tips used in atomic force microscopy. Here, we review in detail several time-resolved EFM techniques based on non-contact atomic force microscopy, elaborating on their specific limitations and challenges. We also introduce a new experimental technique that can resolve time-varying signals well below the oscillation period of the cantilever and compare and contrast it with those previously established.

scholarly journals Resolving Structure and Mechanical Properties at the Nanoscale of Viruses with Frequency Modulation Atomic Force Microscopy

PLoS ONE ◽  
2012 ◽  
Vol 7 (1) ◽  
pp. e30204 ◽  
Author(s):  
David Martinez-Martin ◽  
Carolina Carrasco ◽  
Mercedes Hernando-Perez ◽  
Pedro J. de Pablo ◽  
Julio Gomez-Herrero ◽  
...  
Keyword(s):  
Mechanical Properties ◽  
Atomic Force Microscopy ◽  
Frequency Modulation ◽  
Force Microscopy ◽  
Atomic Force

Mapping and imaging for rapid atom discrimination: A study of frequency modulation atomic force microscopy

2009 ◽  
Vol 94 (2) ◽  
pp. 023108 ◽  
Author(s):  
Yoshiaki Sugimoto ◽  
Takashi Namikawa ◽  
Masayuki Abe ◽  
Seizo Morita
Keyword(s):  
Atomic Force Microscopy ◽  
Frequency Modulation ◽  
Force Microscopy ◽  
Atomic Force

Self-assembled monolayers of sulfonate-terminated alkanethiols investigated by frequency modulation atomic force microscopy in liquid

2017 ◽  
Vol 28 (45) ◽  
pp. 455603 ◽  
Author(s):  
Hitoshi Asakawa ◽  
Natsumi Inada ◽  
Kaito Hirata ◽  
Sayaka Matsui ◽  
Takumi Igarashi ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Frequency Modulation ◽  
Self Assembled Monolayers ◽  
Force Microscopy ◽  
Atomic Force ◽  
Assembled Monolayers ◽  
Self Assembled
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