scholarly journals Complete Optical Characterization of Non-Uniform SiOx Thin Films Using Imaging Spectroscopic Reflectometry

2009 ◽  
Vol 7 ◽  
pp. 409-412 ◽  
Author(s):  
Miloslav Ohlídal ◽  
Ivan Ohlídal ◽  
David Necas ◽  
Petr Klapetek
Keyword(s):  
Thin Films ◽  
Optical Characterization ◽  
Spectroscopic Reflectometry

Possibilities and limitations of imaging spectroscopic reflectometry in optical characterization of thin films

2015 ◽  
Author(s):  
Miloslav Ohlídal ◽  
Ivan Ohlidal ◽  
David Nečas ◽  
Jiří Vodák ◽  
Daniel Franta ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Characterization ◽  
Spectroscopic Reflectometry

Optical characterization of diamond-like carbon thin films non-uniform in thickness using spectroscopic reflectometry

2008 ◽  
Vol 17 (4-5) ◽  
pp. 709-712
Author(s):  
Ivan Ohlídal ◽  
David Nečas ◽  
Vilma Buršíková ◽  
Daniel Franta ◽  
Miloslav Ohlídal
Keyword(s):  
Thin Films ◽  
Optical Characterization ◽  
Diamond Like Carbon ◽  
Spectroscopic Reflectometry ◽  
Carbon Thin Films

Structural and Optical Characterization of Zinc Telluride Thin Films

2013 ◽  
Vol 665 ◽  
pp. 254-262 ◽  
Author(s):  
J.R. Rathod ◽  
Haresh S. Patel ◽  
K.D. Patel ◽  
V.M. Pathak
Keyword(s):  
Thin Films ◽  
Extinction Coefficient ◽  
Nir Spectroscopy ◽  
Optical Characterization ◽  
X Ray Diffraction ◽  
X Ray ◽  
Evaporation Technique ◽  
Film Form ◽  
Znte Thin Films

Group II-VI compounds have been investigated largely in last two decades due to their interesting optoelectronic properties. ZnTe, a member of this family, possesses a bandgap around 2.26eV. This material is now a day investigated in thin film form due to its potential towards various viable applications. In this paper, the authors report their investigations on the preparation of ZnTe thin films using vacuum evaporation technique and their structural and optical characterizations. The structural characterization, carried out using an X-ray diffraction (XRD) technique shows that ZnTe used in present case possesses a cubic structure. Using the same data, the micro strain and dislocation density were evaluated and found to be around 1.465×10-3lines-m2and 1.639×1015lines/m2respecctively. The optical characterization carried out in UV-VIS-NIR region reveals the fact that band gap of ZnTe is around 2.2eV in present case. In addition to this, it was observed that the value of bandgap decreases as the thickness of films increases. The direct transitions of the carries are involved in ZnTe. Using the data of UV-VIS-NIR spectroscopy, the transmission coefficient and extinction coefficient were also calculated for ZnTe thin films. Besides, the variation of extinction coefficient with wavelength has also been discussed here.

Simulation and prediction of optical characterization of casting (Adamantan-Fulgide) thin films using (CTANNs) approach

2019 ◽  
Vol 33 (11) ◽  
pp. 1950093 ◽  
Author(s):  
A. M. A. EL-Barry ◽  
D. M. Habashy
Keyword(s):  
Experimental Data ◽  
Thin Films ◽  
Back Propagation ◽  
Optical Characterization ◽  
Experimental Information ◽  
Training Algorithm ◽  
Energy Gaps ◽  
Resilient Back Propagation ◽  
Good Agreement

For reinforcement, the photochromic field and the cooperation between the theoretical and experimental branches of physics, the computational, theoretical artificial neural networks (CTANNs) and the resilient back propagation (R[Formula: see text]) training algorithm were used to model optical characterizations of casting (Admantan-Fulgide) thin films with different concentrations. The simulated values of ANN are in good agreement with the experimental data. The model was also used to predict values, which were not included in the training. The high precision of the model has been constructed. Moreover, the concentration dependence of both the energy gaps and Urbach’s tail were, also tested. The capability of the technique to simulate the experimental information with best accuracy and the foretelling of some concentrations which is not involved in the experimental data recommends it to dominate the modeling technique in casting (Admantan-Fulgide) thin films.

Optical characterization of thin films by guided waves

1989 ◽  
Vol 28 (14) ◽  
pp. 2918 ◽  
Author(s):  
Emile Pelletier ◽  
F. Flory ◽  
Y. Hu
Keyword(s):  
Thin Films ◽  
Guided Waves ◽  
Optical Characterization
Sign in / Sign up

Export Citation Format

Share Document