scholarly journals Refractive index profiles of Ge-doped optical fibers with nanometer spatial resolution using atomic force microscopy

2004 ◽  
Vol 12 (7) ◽  
pp. 1452 ◽  
Author(s):  
P. Pace ◽  
Shane T. Huntington ◽  
K. Lyytik�inen ◽  
A. Roberts ◽  
J. D. Love
Keyword(s):  
Atomic Force Microscopy ◽  
Refractive Index ◽  
Spatial Resolution ◽  
Optical Fibers ◽  
Force Microscopy ◽  
Atomic Force

Atomic force microscopy for the determination of refractive index profiles of optical fibers and waveguides: A quantitative study

1997 ◽  
Vol 82 (6) ◽  
pp. 2730-2734 ◽  
Author(s):  
S. T. Huntington ◽  
P. Mulvaney ◽  
A. Roberts ◽  
K. A. Nugent ◽  
M. Bazylenko
Keyword(s):  
Atomic Force Microscopy ◽  
Refractive Index ◽  
Optical Fibers ◽  
Quantitative Study ◽  
Force Microscopy ◽  
Atomic Force

High-Spatial-Resolution Topographic Imaging and Dimer Distance Analysis of Si(100)-(2×1) Using Noncontact Atomic Force Microscopy

2008 ◽  
Vol 47 (7) ◽  
pp. 6085-6087 ◽  
Author(s):  
Daisuke Sawada ◽  
Takashi Namikawa ◽  
Masuhiro Hiragaki ◽  
Yoshiaki Sugimoto ◽  
Masayuki Abe ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Force Microscopy ◽  
Distance Analysis ◽  
Atomic Force ◽  
Topographic Imaging

scholarly journals Топография поверхности и оптические характеристики тонких пленок AlN на подложке GaAs (100), полученных методом реактивного ионно-плазменного распыления

2019 ◽  
Vol 45 (5) ◽  
pp. 38
Author(s):  
Е.В. Фомин ◽  
А.Д. Бондарев ◽  
A.I. Rumyantseva ◽  
T. Maurer ◽  
Н.А. Пихтин ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Refractive Index ◽  
Surface Structure ◽  
Optical Characteristics ◽  
Process Conditions ◽  
Antireflection Coatings ◽  
Force Microscopy ◽  
Plasma Sputtering ◽  
Atomic Force ◽  
Ion Plasma

AbstractA study of the surface topography and optical characteristics of thin AlN films used as passivating and antireflection coatings deposited on n -GaAs (100) substrates by reactive ion-plasma sputtering is reported. It was found that the process conditions affect the structure and the optical characteristics of the films, which makes it possible to obtain coatings with prescribed parameters. An analysis of the results furnished by ellipsometry and atomic-force microscopy of the surface shows that the refractive index of the films is correlated with the surface structure.

Force dependences for the definition of the atomic force microscopy spatial resolution

1988 ◽  
Vol 132 (6-7) ◽  
pp. 354-358 ◽  
Author(s):  
Yu.N. Moiseev ◽  
V.M. Mostepanenko ◽  
V.I. Panov ◽  
I.Yu. Sokolov
Keyword(s):  
Atomic Force Microscopy ◽  
Spatial Resolution ◽  
Force Microscopy ◽  
Atomic Force ◽  
Definition Of

Atomic Force Microscopy Studies on Optical Fibers

1997 ◽  
pp. 179-188
Author(s):  
M. John Matthewson ◽  
Vincenzo V. Rondinella ◽  
James Colaizzi
Keyword(s):  
Atomic Force Microscopy ◽  
Optical Fibers ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Optical force microscopy: combining light with atomic force microscopy for nanomaterial identification

Nanophotonics ◽  
2019 ◽  
Vol 8 (10) ◽  
pp. 1659-1671
Author(s):  
Nusrat Jahan ◽  
Hanwei Wang ◽  
Shensheng Zhao ◽  
Arkajit Dutta ◽  
Hsuan-Kai Huang ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Spatial Resolution ◽  
Optical Force ◽  
Scanning Probe ◽  
Force Microscopy ◽  
Atomic Force ◽  
Recent Advances ◽  
Spectroscopic Information

AbstractScanning probe techniques have evolved significantly in recent years to detect surface morphology of materials down to subnanometer resolution, but without revealing spectroscopic information. In this review, we discuss recent advances in scanning probe techniques that capitalize on light-induced forces for studying nanomaterials down to molecular specificities with nanometer spatial resolution.

scholarly journals BioAFMviewer: An interactive interface for simulated AFM scanning of biomolecular structures and dynamics

2020 ◽  
Vol 16 (11) ◽  
pp. e1008444
Author(s):  
Romain Amyot ◽  
Holger Flechsig
Keyword(s):  
Molecular Structure ◽  
Atomic Force Microscopy ◽  
Spatial Resolution ◽  
High Speed ◽  
Graphical Representation ◽  
Force Microscopy ◽  
Interactive Interface ◽  
Atomic Force ◽  
And Control

We provide a stand-alone software, the BioAFMviewer, which transforms biomolecular structures into the graphical representation corresponding to the outcome of atomic force microscopy (AFM) experiments. The AFM graphics is obtained by performing simulated scanning over the molecular structure encoded in the corresponding PDB file. A versatile molecular viewer integrates the visualization of PDB structures and control over their orientation, while synchronized simulated scanning with variable spatial resolution and tip-shape geometry produces the corresponding AFM graphics. We demonstrate the applicability of the BioAFMviewer by comparing simulated AFM graphics to high-speed AFM observations of proteins. The software can furthermore process molecular movies of conformational motions, e.g. those obtained from servers which model functional transitions within a protein, and produce the corresponding simulated AFM movie. The BioAFMviewer software provides the platform to employ the plethora of structural and dynamical data of proteins in order to help in the interpretation of biomolecular AFM experiments.

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