scholarly journals Quick and Reliable Colorimetric Reflectometry for Thickness Determination of Low Dimensional GaS Exfoliated Layers by Optical Microscopy

2021 ◽  
Author(s):  
Yael Gutierrez ◽  
Gonzalo Santos ◽  
MARIA GIANGREGORIO ◽  
stefano dicorato ◽  
Fabio Palumbo ◽  
...  
Keyword(s):  
Optical Microscopy ◽  
Thickness Determination ◽  
Low Dimensional

Thickness determination of ultrathin oxide films and its application in magnetic tunnel junctions

2006 ◽  
Vol 35 (12) ◽  
pp. 2142-2146 ◽  
Author(s):  
J. Joshua Yang ◽  
Chengxiang Ji ◽  
Ying Yang ◽  
Y. Austin Chang ◽  
Feng X. Liu ◽  
...  
Keyword(s):  
Tunnel Junctions ◽  
Oxide Films ◽  
Magnetic Tunnel Junctions ◽  
Thickness Determination ◽  
Ultrathin Oxide Films ◽  
Ultrathin Oxide

Thickness determination of thin and ultra-thin SiO2 films by C-AFM IV-spectroscopy

2006 ◽  
Vol 252 (6) ◽  
pp. 2375-2388 ◽  
Author(s):  
Werner Frammelsberger ◽  
Guenther Benstetter ◽  
Janice Kiely ◽  
Richard Stamp
Keyword(s):  
Sio2 Films ◽  
Thickness Determination

Indexing approximants of icosahedral quasicrystals

1999 ◽  
Vol 55 (6) ◽  
pp. 975-983 ◽  
Author(s):  
M. Quiquandon ◽  
A. Katz ◽  
F. Puyraimond ◽  
D. Gratias
Keyword(s):  
Unit Cell ◽  
Dimensional Lattice ◽  
Geometrical Properties ◽  
Actual Model ◽  
Icosahedral Quasicrystals ◽  
Low Dimensional

It is well known that the crystallography of approximants is directly related to that of the parent quasicrystal, once its unit-cell vectors are identified as parallel projections of certain N-dimensional lattice nodes {\bf A}^{i}. Derived here are explicit simple relations for calculating the shear matrices {\boldvarepsilon} and the related crystallographic properties of the corresponding approximants, including diffraction indexing and the determination of the lattice in perpendicular space. Applied to low-dimensional approximants, the derivation shows that the systematic `accidental' extinction rules observed in the pentagonal phases are generic extinctions that are due to the geometrical properties of the projected 1D lattice and are independent of the actual model of the quasicrystal.

scholarly journals Standard Free Thickness Determination of Thin TEM Samples via Backscatter Electron Image Correlation

2009 ◽  
Vol 15 (S2) ◽  
pp. 340-341 ◽  
Author(s):  
R Salzer ◽  
A Graff ◽  
M Simon ◽  
F Altmann
Keyword(s):  
Image Correlation ◽  
Backscatter Electron Image ◽  
Backscatter Electron ◽  
Thickness Determination ◽  
Electron Image

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Determination of Mean Free Path for Inelastic Scattering in Poly(2-Vinyl Pyridine) by Low-Loss Spectrum Imaging

2000 ◽  
Vol 6 (S2) ◽  
pp. 224-225
Author(s):  
A. Aitouchen ◽  
T. Chou ◽  
M. Libera ◽  
M. Misra
Keyword(s):  
Free Path ◽  
Free Fall ◽  
Mean Free Path ◽  
Specimen Thickness ◽  
Thickness Determination ◽  
Vinyl Pyridine ◽  
Integrated Intensity ◽  
Inelastic Mean Free Path ◽  
Electron Energy Loss

The common experimental method to determine the total inelastic mean free path i by electron energy-loss spectroscopy (EELS) is by the relation : t/λi= ln(It/IO) [1] where t is the specimen thickness, It, is the total integrated intensity, and Io is the intensity of the zero-loss peak. The accuracy of this measurement depends on the thickness determination. Model geometries like cubes, wedges, and spheres enable accurate thickness determination from transmission images.Spherical polymers with diameters of order 10-200nm can be made from a number of high-Tg polymers by solvent atomization. This research studied atomized spheres of poly(2-vinyl pyridine) [PVP]. A solution of 0.1% PVP in THF was nebulized. After solvent evaporation during free fall within the chamber atmosphere, solid spherical polymer particles with a range of diameters were collected on holey-carbon TEM grids at the bottom of the atomization chamber.

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