Photoconductive terahertz generation in nitrogen-doped single-crystal diamond

2021 ◽  
Author(s):  
Pavel Chizhov ◽  
Maxim Komlenok ◽  
Vitali Kononenko ◽  
Vladimir Bukin ◽  
Alexander Ushakov ◽  
...  
Keyword(s):  
Single Crystal ◽  
Terahertz Generation ◽  
Nitrogen Doped ◽  
Single Crystal Diamond

A nitrogen doped low-dislocation density free-standing single crystal diamond plate fabricated by a lift-off process

2014 ◽  
Vol 104 (25) ◽  
pp. 252109 ◽  
Author(s):  
Yoshiaki Mokuno ◽  
Yukako Kato ◽  
Nobuteru Tsubouchi ◽  
Akiyoshi Chayahara ◽  
Hideaki Yamada ◽  
...  
Keyword(s):  
Dislocation Density ◽  
Single Crystal ◽  
Free Standing ◽  
Nitrogen Doped ◽  
Diamond Plate ◽  
Low Dislocation Density ◽  
Single Crystal Diamond ◽  
Lift Off

Application of Nitrogen-Doped Nanocrystalline Diamond Film on Partially Stabilized Zirconia for Pulverization Disk

2014 ◽  
Vol 1645 ◽  
Author(s):  
Kazuki Shiokawa ◽  
Takanori Mori ◽  
Atsushi Naka ◽  
Takehiko Matsumura ◽  
Tetsuya Suzuki
Keyword(s):  
Single Crystal ◽  
Adhesion Strength ◽  
Photoelectron Spectroscopy ◽  
Nanocrystalline Diamond ◽  
Stabilized Zirconia ◽  
Partially Stabilized Zirconia ◽  
Nitrogen Doped ◽  
As Doping ◽  
Single Crystal Diamond ◽  
Alternative Material

ABSTRACTWe report here partially stabilized zirconia (PSZ) matrix deposited with nanocrystalline diamond (NCD) films on its surface as an alternative material for pulverization disk with a potential of substituting high cost synthetic single crystal diamond. The deposition of NCD films on PSZ improved the characterization of the desorption-oxygen from PSZ matrix and enhanced the poor adhesion strength between NCD film and PSZ when N2 was used as doping gas. The results for X-ray photoelectron spectroscopy (XPS) and Raman spectroscopy confirmed that with increasing N2 flow rate, nitrogen and desorption-oxygen were incorporated into film. The adhesion test and the pulverization test showed that enhancement in the adhesion strength as well as in the pulverization performance with increasing nitrogen and oxygen concentration in the NCD films. The results proposed to substitute a synthetic single crystal diamond with PSZ by coating nitrogen-doped NCD film.

scholarly journals The Interface and Mechanical Properties of a CVD Single Crystal Diamond Produced by Multilayered Nitrogen Doping Epitaxial Growth

Materials ◽  
2019 ◽  
Vol 12 (15) ◽  
pp. 2492 ◽  
Author(s):  
Yun Zhao ◽  
Chengming Li ◽  
Jinlong Liu ◽  
Kang An ◽  
Xiongbo Yan ◽  
...  
Keyword(s):  
Chemical Vapor Deposition ◽  
Single Crystal ◽  
Vapor Deposition ◽  
Microwave Plasma ◽  
Chemical Vapor ◽  
Buffer Layers ◽  
Cross Sectional ◽  
Zero Phonon Line ◽  
Nitrogen Doped ◽  
Single Crystal Diamond

In the present investigation, a nitrogen-doped multilayer homoepitaxial single crystal diamond is synthesized on a high-pressure high temperature (HPHT) Ib-type diamond substrate using the microwave plasma chemical vapor deposition (MPCVD) method. When 0.15 sccm of nitrogen was added in the gas phase, the growth rate of the doped layer was about 1.7 times that of the buffer layer, and large conical and pyramidal features are formed on the surface of the sample. Raman mapping and photoluminescence imaging of the polished cross sectional slice shows a broadband emission, with a characteristic zero phonon line (ZPL) at 575 nm in the doped layers, and large compressive stress was formed in the nitrogen-doped layers. X-ray topography shows that the defects at the interface can induce dislocation. The pyramid feature is formed at the defect, and more nitrogen-related defects are formed in the pyramid region. Thin nitrogen-doped multilayers were successfully prepared, and the thickness of the nitrogen-doped and buffer layers was about 650 nm each. The indentation measurements reveal that the thin nitrogen-doped multilayers are ultra-tough (at least ~22 MPa m1/2), compared to the Ib-type HPHT seed substrate (~8 MPa m1/2) and the unintentionally doped chemical vapor deposition (CVD) single crystal diamond (~14 MPa m1/2).

scholarly journals Epitaxial lateral growth of single-crystal diamond under high pressure by a plate-to-plate MPCVD

2021 ◽  
Vol 1 (1) ◽  
pp. 143-149
Author(s):  
Wei Cao ◽  
Deng Gao ◽  
Hongyang Zhao ◽  
Zhibin Ma
Keyword(s):  
High Pressure ◽  
Single Crystal ◽  
Lateral Growth ◽  
Single Crystal Diamond

On The Optimized Nucleation of Near-Single-Crystal Cvd Diamond Film

1995 ◽  
Vol 416 ◽  
Author(s):  
L. C. Chen ◽  
C. C. Juan ◽  
J. Y. Wu ◽  
K. H. Chen ◽  
J. W. Teng
Keyword(s):  
Single Crystal ◽  
Photoelectron Spectroscopy ◽  
Morphological Evolution ◽  
Present Report ◽  
Ex Situ ◽  
Nucleation Density ◽  
Induced Current ◽  
Current Time ◽  
Single Crystal Diamond

ABSTRACTNear-single-crystal diamond films have been obtained in a number of laboratories recently. The optimization of nucleation density by using a bias-enhanced nucleation (BEN) method is believed to be a critical step. However, the condition of optimized nucleation has never been clearly delineated. In the present report, a novel quantitative technique was established to monitor the nucleation of diamond in-situ. Specifically, the induced current was measured as a function of nucleation time during BEN. The timedependence of induced current was studied under various methane concentrations as well as substrate temperatures. The optimized nucleation condition can be unambiguously determined from the current-time plot. Besides the in-situ current probe, ex-situ x-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM) were also used to investigate the chemical and morphological evolution. Characteristic XPS and AFM features of optimized nucleation is discussed.

Development of Diamond-Based X-ray Detection for High Flux Beamline Diagnostics

2009 ◽  
Vol 1203 ◽  
Author(s):  
Jen Bohon ◽  
John Smedley ◽  
Erik M. Muller ◽  
Jeffrey W. Keister
Keyword(s):  
Single Crystal ◽  
Linear Response ◽  
Voltage Dependence ◽  
Cvd Diamond ◽  
High Flux ◽  
National Synchrotron Light Source ◽  
X Ray ◽  
Single Crystal Diamond ◽  
Synchrotron Light ◽  
Pulse Structure

AbstractHigh quality single crystal and polycrystalline CVD diamond detectors with platinum contacts have been tested at the white beam X28C beamline at the National Synchrotron Light Source under high-flux conditions. The voltage dependence of these devices has been measured under DC and pulsed-bias conditions, establishing the presence or absence of photoconductive gain in each device. Linear response has been achieved over eleven orders of magnitude when combined with previous low flux studies. Temporal measurements with single crystal diamond detectors have resolved the ns scale pulse structure of the NSLS.

Thermal conductivity of isotopically modified single crystal diamond

1993 ◽  
Vol 70 (24) ◽  
pp. 3764-3767 ◽  
Author(s):  
Lanhua Wei ◽  
P. K. Kuo ◽  
R. L. Thomas ◽  
T. R. Anthony ◽  
W. F. Banholzer
Keyword(s):  
Thermal Conductivity ◽  
Single Crystal ◽  
Single Crystal Diamond
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