Automatic alignment of a Kirkpatrick-Baez active optic by use of a soft-x-ray Hartmann wavefront sensor

2006 ◽  
Vol 31 (2) ◽  
pp. 199 ◽  
Author(s):  
Pascal Mercère ◽  
Mourad Idir ◽  
Thierry Moreno ◽  
Gilles Cauchon ◽  
Guillaume Dovillaire ◽  
...  
Keyword(s):  
Wavefront Sensor ◽  
X Ray ◽  
Automatic Alignment

Aliasing in a Hartmann wavefront sensor at x-ray wavelengths

2012 ◽  
Author(s):  
Lisa A. Poyneer ◽  
Brian Bauman ◽  
Bruce Macintosh
Keyword(s):  
Wavefront Sensor ◽  
X Ray

X-ray active mirror coupled with a Hartmann wavefront sensor

2010 ◽  
Vol 616 (2-3) ◽  
pp. 162-171 ◽  
Author(s):  
Mourad Idir ◽  
Pascal Mercere ◽  
Mohammed H. Modi ◽  
Guillaume Dovillaire ◽  
Xavier Levecq ◽  
...  
Keyword(s):  
Wavefront Sensor ◽  
X Ray ◽  
Active Mirror

scholarly journals High-Sensitivity X-ray Phase Imaging System Based on a Hartmann Wavefront Sensor

2021 ◽  
Vol 7 (1) ◽  
pp. 3
Author(s):  
Ginevra Begani Provinciali ◽  
Martin Piponnier ◽  
Laura Oudjedi ◽  
Xavier Levecq ◽  
Fabrice Harms ◽  
...  
Keyword(s):  
Imaging System ◽  
High Sensitivity ◽  
Test Sample ◽  
Wavefront Sensor ◽  
Reference Image ◽  
High Angular Resolution ◽  
Phase Imaging ◽  
X Ray ◽  
Laboratory Setup ◽  
The Impact

The Hartman wavefront sensor can be used for X-ray phase imaging with high angular resolution. The Hartmann sensor is able to retrieve both the phase and absorption from a single acquisition. The system calculates the shift in a series of apertures imaged with a detector with respect to their reference positions. In this article, the impact of the reference image on the final image quality is investigated using a laboratory setup. Deflection and absorption images of the same sample are compared using reference images acquired in air and in water. It can be easily coupled with tomographic setups to obtain 3D images of both phase and absorption. Tomographic images of a test sample are shown, where deflection images revealed details that were invisible in absorption. The findings reported in this paper can be used for the improvement of image reconstruction and for expanding the applications of X-ray phase imaging towards materials characterization and medical imaging.

scholarly journals Automatic alignment and reconstruction of images for soft X-ray tomography

2012 ◽  
Vol 177 (2) ◽  
pp. 259-266 ◽  
Author(s):  
Dilworth Y. Parkinson ◽  
Christian Knoechel ◽  
Chao Yang ◽  
Carolyn A. Larabell ◽  
Mark A. Le Gros
Keyword(s):  
X Ray ◽  
Automatic Alignment

Confocal depth-resolved fluorescence micro-X-ray absorption spectroscopy for the study of cultural heritage materials: a new mobile endstation at the Beijing Synchrotron Radiation Facility

2017 ◽  
Vol 24 (5) ◽  
pp. 1000-1005 ◽  
Author(s):  
Guang Chen ◽  
Shengqi Chu ◽  
Tianxi Sun ◽  
Xuepeng Sun ◽  
Lirong Zheng ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Absorption Spectroscopy ◽  
Incident Beam ◽  
Sample Volume ◽  
X Ray ◽  
Alignment Procedure ◽  
Beijing Synchrotron Radiation Facility ◽  
Automatic Alignment ◽  
Confocal Fluorescence ◽  
X Ray Absorption

A confocal fluorescence endstation for depth-resolved micro-X-ray absorption spectroscopy is described. A polycapillary half-lens defines the incident beam path and a second polycapillary half-lens at 90° defines the probe sample volume. An automatic alignment program based on an evolutionary algorithm is employed to make the alignment procedure efficient. This depth-resolved system was examined on a general X-ray absorption spectroscopy (XAS) beamline at the Beijing Synchrotron Radiation Facility. Sacrificial red glaze (AD 1368–1644) china was studied to show the capability of the instrument. As a mobile endstation to be applied on multiple beamlines, the confocal system can improve the function and flexibility of general XAS beamlines, and extend their capabilities to a wider user community.

scholarly journals Wavefront Sensing for Evaluation of Extreme Ultraviolet Microscopy

Sensors ◽  
2020 ◽  
Vol 20 (22) ◽  
pp. 6426
Author(s):  
Mabel Ruiz-Lopez ◽  
Masoud Mehrjoo ◽  
Barbara Keitel ◽  
Elke Plönjes ◽  
Domenico Alj ◽  
...  
Keyword(s):  
Extreme Ultraviolet ◽  
Numerical Aperture ◽  
Laser Flash ◽  
Optical Systems ◽  
Wavefront Sensor ◽  
Reliable Technique ◽  
Phase Measurements ◽  
X Ray ◽  
Classical Calculation

Wavefront analysis is a fast and reliable technique for the alignment and characterization of optics in the visible, but also in the extreme ultraviolet (EUV) and X-ray regions. However, the technique poses a number of challenges when used for optical systems with numerical apertures (NA) > 0.1. A high-numerical-aperture Hartmann wavefront sensor was employed at the free electron laser FLASH for the characterization of a Schwarzschild objective. These are widely used in EUV to achieve very small foci, particularly for photolithography. For this purpose, Schwarzschild objectives require highly precise alignment. The phase measurements acquired with the wavefront sensor were analyzed employing two different methods, namely, the classical calculation of centroid positions and Fourier demodulation. Results from both approaches agree in terms of wavefront maps with negligible degree of discrepancy.

scholarly journals Measurement of XUV sources' wavefronts

2001 ◽  
Vol 19 (1) ◽  
pp. 55-58
Author(s):  
S. LE PAPE ◽  
PH. ZEITOUN ◽  
P. DHEZ ◽  
M. FRANÇOIS ◽  
M. IDIR ◽  
...  
Keyword(s):  
Harmonic Generation ◽  
Experimental Results ◽  
Wavefront Sensor ◽  
High Order Harmonic Generation ◽  
Numerical Work ◽  
X Ray ◽  
High Order Harmonic ◽  
First Results ◽  
Ray Trace ◽  
Complete Investigation

New fields of X-ray source applications (X-ray laser and high order harmonic generation) could appear if an intensity higher than 1012 Wcm−2 is reached. Following this goal, we have started a complete investigation of the X-ray beam wavefront both numerically and experimentally. The first XUV wavefront sensor has been developed and tested on different XUV sources. For a better comprehension of the experimental results, a numerical work (ray-trace code) has been performed. We present and discuss the first results obtained on the X-ray laser at 21.2 nm.

scholarly journals EUV and Hard X-ray Hartmann Wavefront Sensing for Optical Metrology, Alignment and Phase Imaging

Sensors ◽  
2021 ◽  
Vol 21 (3) ◽  
pp. 874
Author(s):  
Ombeline de La Rochefoucauld ◽  
Guillaume Dovillaire ◽  
Fabrice Harms ◽  
Mourad Idir ◽  
Lei Huang ◽  
...  
Keyword(s):  
High Performance ◽  
High Harmonic ◽  
Ultra Violet ◽  
Phase Imaging ◽  
Wavefront Sensors ◽  
X Ray ◽  
X Ray Imaging ◽  
Wide Range ◽  
Automatic Alignment ◽  
Euv Lasers

For more than 15 years, Imagine Optic have developed Extreme Ultra Violet (EUV) and X-ray Hartmann wavefront sensors for metrology and imaging applications. These sensors are compatible with a wide range of X-ray sources: from synchrotrons, Free Electron Lasers, laser-driven betatron and plasma-based EUV lasers to High Harmonic Generation. In this paper, we first describe the principle of a Hartmann sensor and give some key parameters to design a high-performance sensor. We also present different applications from metrology (for manual or automatic alignment of optics), to soft X-ray source optimization and X-ray imaging.

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