scholarly journals Reference-free THz-TDS conductivity analysis of thin conducting films

2020 ◽  
Vol 28 (20) ◽  
pp. 28819
Author(s):  
Patrick R. Whelan ◽  
Qian Shen ◽  
Da Luo ◽  
Meihui Wang ◽  
Rodney S. Ruoff ◽  
...  
Keyword(s):  
Thin Conducting

A thin conducting sheet (TCS) model in 3D FDTD : Implementation and validation

2008 ◽  
Author(s):  
Toufic Abboud ◽  
Francois Bereux ◽  
Jean-Loup Lhermitte ◽  
Pierre Benjamin ◽  
Richard Perraud ◽  
...  
Keyword(s):  
Thin Conducting ◽  
Conducting Sheet

DIFFUSION OF PULSED EDDY CURRENTS IN THIN CONDUCTING PLATES

2008 ◽  
Author(s):  
T. W. Krause ◽  
C. Mandache ◽  
J. H. V. Lefebvre ◽  
Donald O. Thompson ◽  
Dale E. Chimenti
Keyword(s):  
Eddy Currents ◽  
Thin Conducting ◽  
Pulsed Eddy Currents

scholarly journals Interaction of an electromagnetic E-wave with a thin conducting film between two dielectric media in the case of an anisotropic isoenergetic surface and impurity scattering

2021 ◽  
Vol 2103 (1) ◽  
pp. 012156
Author(s):  
I A Kuznetsova ◽  
D N Romanov ◽  
A A Yushkanov
Keyword(s):  
Impurity Scattering ◽  
Charge Carriers ◽  
Surface Scattering ◽  
Conducting Film ◽  
Dielectric Media ◽  
Thin Conducting ◽  
Transmission And Absorption ◽  
Thin Conducting Film ◽  
The Magnetic Field ◽  
Isoenergetic Surface

Abstract The coefficients of reflection, transmission and absorption are calculated in the framework of the kinetic approach, when an electromagnetic E-wave interacts with a thin conducting film located between two dielectric media. To account for the surface scattering of charge carriers is used a model of mirror-diffuse boundary conditions, assuming that the specularity coefficients of the upper and lower surfaces of the film differ from each other. The electromagnetic wave falls on the upper surface of the film at an arbitrary angle. The case of an anisotropic isoenergetic surface of a conductor having the form of a three-axis ellipsoid, one of the main axes of which is parallel to the magnetic field strength of the wave, and the other is perpendicular to the film surfaces, is considered. The impurity scattering of electrons (holes) is dominated in the volume of the conductor. The dependence of the absorption coefficient on the parameters of the isoenergetic surface of the conductor is analyzed.

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