scholarly journals Coherent-hybrid STED: high contrast sub-diffraction imaging using a bi-vortex depletion beam

2019 ◽  
Vol 27 (6) ◽  
pp. 8092 ◽  
Author(s):  
António Pereira ◽  
Mafalda Sousa ◽  
Ana C. Almeida ◽  
Luísa T. Ferreira ◽  
Ana Rita Costa ◽  
...  
Keyword(s):  
High Contrast ◽  
Diffraction Imaging

Seismic diffraction separation in the near-surface: Detection of high contrast voids in unconsolidated soils

Geophysics ◽  
2021 ◽  
pp. 1-72
Author(s):  
Parsa Bakhtiari Rad ◽  
Craig J. Hickey
Keyword(s):  
Soft Soil ◽  
Processing Parameters ◽  
Imaging Method ◽  
Data Sets ◽  
High Contrast ◽  
Near Surface ◽  
Time Migration ◽  
Diffraction Imaging ◽  
Dip Angle ◽  
Scattering Time

Seismic diffractions carry the signature of near-surface high-contrast anomalies and need to be extracted from the data to complement the reflection processing and other geophysical techniques. Since diffractions are often masked by reflections, surface waves and noise, a careful diffraction separation is required as a first step for diffraction imaging. A multiparameter time-imaging method is employed to separate near-surface diffractions. The implemented scheme makes use of the wavefront attributes that are reliable fully data-derived processing parameters. To mitigate the effect of strong noise and wavefield interference in near-surface data, the proposed workflow incorporates two wavefront-based parameters, dip angle and coherence, as additional constraints. The output of the diffraction separation is a time trace-based stacked section that provides the basis for further analysis and applications such as time migration. To evaluate the performance of the proposed wavefront-based workflow, it is applied to two challenging field data sets that were collected over small culverts in very near-surface soft soil environments. The results of the proposed constrained workflow and the existing unconstrained approach are presented and compared. The proposed workflow demonstrates superiority over the existing method by attenuating more reflection and noise, leading to improved diffraction separation. The abundance of unmasked diffractions reveal that the very near-surface is highly scattering. Time migration is carried out to enhance the anomaly detection by focusing of the isolated diffractions. Although strong diffractivity is observed at the approximate location of the targets, there are other diffracting zones observed in the final sections that might bring uncertainties for interpretation.

Single‐Crystalline Perovskite Microlasers for High‐Contrast and Sub‐Diffraction Imaging

2019 ◽  
Vol 29 (39) ◽  
pp. 1904868 ◽  
Author(s):  
Kaiyang Wang ◽  
Shuai Wang ◽  
Shumin Xiao ◽  
Nan Zhang ◽  
Yujie Wang ◽  
...  
Keyword(s):  
High Contrast ◽  
Single Crystalline ◽  
Diffraction Imaging

High-contrast imaging for weakly diffracting specimens in coherent diffraction imaging

2013 ◽  
Vol 11 (2) ◽  
pp. 021103-21105 ◽  
Author(s):  
Xingchen Pan Xingchen Pan ◽  
Suhas P. Veetil Suhas P. Veetil ◽  
Cheng Liu Cheng Liu ◽  
Qiang Lin Qiang Lin ◽  
Jianqiang Zhu Jianqiang Zhu
Keyword(s):  
High Contrast ◽  
Contrast Imaging ◽  
Coherent Diffraction Imaging ◽  
High Contrast Imaging ◽  
Diffraction Imaging

Resistance Monitor and Control for Vacuum Evaporation of Metals and Carbon

1976 ◽  
Vol 34 ◽  
pp. 572-573
Author(s):  
Russell L. Steere ◽  
Eric F. Erbe ◽  
J. Michael Moseley
Keyword(s):  
Electronic Device ◽  
Point Sources ◽  
High Contrast ◽  
Variable Resistor ◽  
Quality Of Results ◽  
Low Contrast ◽  
Evaporation Source ◽  
And Control ◽  
At Will

We have designed and built an electronic device which compares the resistance of a defined area of vacuum evaporated material with a variable resistor. When the two resistances are matched, the device automatically disconnects the primary side of the substrate transformer and stops further evaporation.This approach to controlled evaporation in conjunction with the modified guns and evaporation source permits reliably reproducible multiple Pt shadow films from a single Pt wrapped carbon point source. The reproducibility from consecutive C point sources is also reliable. Furthermore, the device we have developed permits us to select a predetermined resistance so that low contrast high-resolution shadows, heavy high contrast shadows, or any grade in between can be selected at will. The reproducibility and quality of results are demonstrated in Figures 1-4 which represent evaporations at various settings of the variable resistor.

Confocal laser microscopy of impregnated central nervous system tissue

1988 ◽  
Vol 46 ◽  
pp. 94-95
Author(s):  
J.N. Turner ◽  
M. Siemens ◽  
D. Szarowski ◽  
D.N. Collins
Keyword(s):  
Electron Microscopy ◽  
Central Nervous System ◽  
Nervous System ◽  
Three Dimensional ◽  
Dimensional Structure ◽  
Confocal Laser ◽  
High Contrast ◽  
Central Nervous System Tissue ◽  
Tissue Samples ◽  
Reflected Light

A classic preparation of central nervous system tissue (CNS) is the Golgi procedure popularized by Cajal. The method is partially specific as only a few cells are impregnated with silver chromate usualy after osmium post fixation. Samples are observable by light (LM) or electron microscopy (EM). However, the impregnation is often so dense that structures are masked in EM, and the osmium background may be undesirable in LM. Gold toning is used for a subtle but high contrast EM preparation, and osmium can be omitted for LM. We are investigating these preparations as part of a study to develop correlative LM and EM (particularly HVEM) methodologies in neurobiology. Confocal light microscopy is particularly useful as the impregnated cells have extensive three-dimensional structure in tissue samples from one to several hundred micrometers thick. Boyde has observed similar preparations in the tandem scanning reflected light microscope (TSRLM).

The CM120 Biotwin: a high-contrast objective lens, optimum cryo-vacuum and improved EDX performance

1995 ◽  
Vol 53 ◽  
pp. 584-585
Author(s):  
Uwe Lücken ◽  
Michael Felsmann ◽  
Wim M. Busing ◽  
Frank de Jong
Keyword(s):  
Life Science ◽  
Focal Length ◽  
Objective Lens ◽  
High Contrast ◽  
Contrast Imaging ◽  
X Ray ◽  
Forming Mechanism ◽  
Similar Image ◽  
High Contrast Imaging ◽  
Low Concentrations

A new microscope for the study of life science specimen has been developed. Special attention has been given to the problems of unstained samples, cryo-specimens and x-ray analysis at low concentrations.A new objective lens with a Cs of 6.2 mm and a focal length of 5.9 mm for high-contrast imaging has been developed. The contrast of a TWIN lens (f = 2.8 mm, Cs = 2 mm) and the BioTWTN are compared at the level of mean and SD of slow scan CCD images. Figure 1a shows 500 +/- 150 and Fig. 1b only 500 +/- 40 counts/pixel. The contrast-forming mechanism for amplitude contrast is dependent on the wavelength, the objective aperture and the focal length. For similar image conditions (same voltage, same objective aperture) the BioTWIN shows more than double the contrast of the TWIN lens. For phasecontrast specimens (like thin frozen-hydrated films) the contrast at Scherzer focus is approximately proportional to the √ Cs.

Performance and applications of the holography electron microscope

1993 ◽  
Vol 51 ◽  
pp. 1078-1079
Author(s):  
Akira Tonomura
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Phase Measurement ◽  
Electron Holography ◽  
Imaging Method ◽  
High Contrast ◽  
Magnetic Lens ◽  
High Brightness ◽  
Holographic Imaging ◽  
Dynamic Observation

Electron holography is a two-step imaging method. However, the ultimate performance of holographic imaging is mainly determined by the brightness of the electron beam used in the hologram-formation process. In our 350kV holography electron microscope (see Fig. 1), the decrease in the inherently high brightness of field-emitted electrons is minimized by superposing a magnetic lens in the gun, for a resulting value of 2 × 109 A/cm2 sr. This high brightness has lead to the following distinguished features. The minimum spacing (d) of carrier fringes is d = 0.09 Å, thus allowing a reconstructed image with a resolution, at least in principle, as high as 3d=0.3 Å. The precision in phase measurement can be as high as 2π/100, since the position of fringes can be known precisely from a high-contrast hologram formed under highly collimated illumination. Dynamic observation becomes possible because the current density is high.

Compositional Analysis of III-V Interface Lattice Images

1980 ◽  
Vol 38 ◽  
pp. 318-319
Author(s):  
A. Olsen ◽  
J.C.H. Spence ◽  
P. Petroff
Keyword(s):  
Crystal Structure ◽  
Image Matching ◽  
Compositional Analysis ◽  
Depth Of Field ◽  
Limit Set ◽  
High Contrast ◽  
Resolution Limit ◽  
Fourier Image ◽  
Lattice Images ◽  
True Structure

Since the point resolution of the JEOL 200CX electron microscope is up = 2.6Å it is not possible to obtain a true structure image of any of the III-V or elemental semiconductors with this machine. Since the information resolution limit set by electronic instability (1) u0 = (2/πλΔ)½ = 1.4Å for Δ = 50Å, it is however possible to obtain, by choice of focus and thickness, clear lattice images both resembling (see figure 2(b)), and not resembling, the true crystal structure (see (2) for an example of a Fourier image which is structurally incorrect). The crucial difficulty in using the information between Up and u0 is the fractional accuracy with which Af and Cs must be determined, and these accuracies Δff/4Δf = (2λu2Δf)-1 and ΔCS/CS = (λ3u4Cs)-1 (for a π/4 phase change, Δff the Fourier image period) are strongly dependent on spatial frequency u. Note that ΔCs(up)/Cs ≈ 10%, independent of CS and λ. Note also that the number n of identical high contrast spurious Fourier images within the depth of field Δz = (αu)-1 (α beam divergence) decreases with increasing high voltage, since n = 2Δz/Δff = θ/α = λu/α (θ the scattering angle). Thus image matching becomes easier in semiconductors at higher voltage because there are fewer high contrast identical images in any focal series.

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