scholarly journals Analysis of reflectance curve of turbid media and determination of the non-surface complex refractive index

2015 ◽  
Vol 23 (19) ◽  
pp. 24602
Author(s):  
Jiwen Sun ◽  
Jin Wang ◽  
Qing Ye ◽  
Jianchun Mei ◽  
Wenyuan Zhou ◽  
...  
Keyword(s):  
Refractive Index ◽  
Complex Refractive Index ◽  
Turbid Media ◽  
Surface Complex ◽  
Reflectance Curve

scholarly journals Optical Characterization of Ultra-Thin Films of Azo-Dye-Doped Polymers Using Ellipsometry and Surface Plasmon Resonance Spectroscopy

Photonics ◽  
2021 ◽  
Vol 8 (2) ◽  
pp. 41
Author(s):  
Najat Andam ◽  
Siham Refki ◽  
Hidekazu Ishitobi ◽  
Yasushi Inouye ◽  
Zouheir Sekkat
Keyword(s):  
Refractive Index ◽  
Optical Properties ◽  
Surface Plasmon Resonance ◽  
Surface Plasmon ◽  
Spectroscopic Ellipsometry ◽  
Plasmon Resonance ◽  
Complex Refractive Index ◽  
Resonance Spectroscopy ◽  
Doped Polymers

The determination of optical constants (i.e., real and imaginary parts of the complex refractive index (nc) and thickness (d)) of ultrathin films is often required in photonics. It may be done by using, for example, surface plasmon resonance (SPR) spectroscopy combined with either profilometry or atomic force microscopy (AFM). SPR yields the optical thickness (i.e., the product of nc and d) of the film, while profilometry and AFM yield its thickness, thereby allowing for the separate determination of nc and d. In this paper, we use SPR and profilometry to determine the complex refractive index of very thin (i.e., 58 nm) films of dye-doped polymers at different dye/polymer concentrations (a feature which constitutes the originality of this work), and we compare the SPR results with those obtained by using spectroscopic ellipsometry measurements performed on the same samples. To determine the optical properties of our film samples by ellipsometry, we used, for the theoretical fits to experimental data, Bruggeman’s effective medium model for the dye/polymer, assumed as a composite material, and the Lorentz model for dye absorption. We found an excellent agreement between the results obtained by SPR and ellipsometry, confirming that SPR is appropriate for measuring the optical properties of very thin coatings at a single light frequency, given that it is simpler in operation and data analysis than spectroscopic ellipsometry.

Determination of complex refractive index of polystyrene microspheres from 370 to 1610 nm

2003 ◽  
Vol 48 (24) ◽  
pp. 4165-4172 ◽  
Author(s):  
Xiaoyan Ma ◽  
Jun Q Lu ◽  
R Scott Brock ◽  
Kenneth M Jacobs ◽  
Ping Yang ◽  
...  
Keyword(s):  
Refractive Index ◽  
Complex Refractive Index ◽  
Polystyrene Microspheres

Determination of thin film refractive index and thickness by means of film phase thickness

Open Physics ◽  
2008 ◽  
Vol 6 (2) ◽  
Author(s):  
Milen Nenkov ◽  
Tamara Pencheva
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Refractive Index ◽  
Barium Titanate ◽  
Spectral Region ◽  
Complex Refractive Index ◽  
Refractive Index Dispersion ◽  
New Approach ◽  
Phase Thickness

AbstractA new approach for determination of refractive index dispersion n(λ) (the real part of the complex refractive index) and thickness d of thin films of negligible absorption and weak dispersion is proposed. The calculation procedure is based on determination of the phase thickness of the film in the spectral region of measured transmittance data. All points of measured spectra are included in the calculations. Barium titanate thin films are investigated in the spectral region 0.38–0.78 μm and their n(λ) and d are calculated. The approach is validated using Swanepoel’s method and it is found to be applicable for relatively thin films when measured transmittance spectra have one minimum and one maximum only.

scholarly journals Organic crystal-based THz source for complex refractive index measurements of window materials using single-shot THz spectroscopy

2021 ◽  
Vol 127 (11) ◽  
Author(s):  
Lufan Du ◽  
Franz Roeder ◽  
Yun Li ◽  
Mostafa Shalaby ◽  
Burgard Beleites ◽  
...  
Keyword(s):  
Refractive Index ◽  
Complex Refractive Index ◽  
Accurate Determination ◽  
Laser Pulses ◽  
Thz Spectroscopy ◽  
Thz Radiation ◽  
Single Shot ◽  
Detection Scheme ◽  
Electro Optic

AbstractWe employed N-benzyl-2-methyl-4-nitroaniline (BNA) crystals bonded on substrates of different thermal conductivity to generate THz radiation by pumping with 800 nm laser pulses. Crystals bonded on sapphire substrate provided four times more THz yield than glass substrate. A pyrodetector and a single-shot electro-optic (EO) diagnostic were employed for measuring the energy and temporal characterisation of the THz pulse. Systematic studies were carried out for the selection of a suitable EO crystal, which allowed accurate determination of the emitted THz spectrum from both substrates. Subsequently, the THz source and single-shot electro-optic detection scheme were employed to measure the complex refractive index of window materials in the THz range.

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