scholarly journals Low-loss titanium dioxide waveguides and resonators using a dielectric lift-off fabrication process

2015 ◽  
Vol 23 (9) ◽  
pp. 11160 ◽  
Author(s):  
Christopher C. Evans ◽  
Chengyu Liu ◽  
Jin Suntivich
Author(s):  
Qiancheng Zhao ◽  
Jiawei Wang ◽  
Nitesh Chauhan ◽  
Debapam Bose ◽  
Naijun Jin ◽  
...  

2013 ◽  
Vol 562-565 ◽  
pp. 1224-1228
Author(s):  
Marina Ashmkhan ◽  
Jing Liu ◽  
Bo Wang ◽  
Fu Ting Yi

Silicon nano pin arrays with heights of 1.3-3.66um and diameter of 315-899nm, are fabricated by CsCl self-assemble for CsCl nano islands for mask and ICP etching for silicon pins. CsCl film is firstly deposited on the wafer by thermal evaporation and putted in the humid controlled environment to be developed to the CsCl islands with diameter of 341-915 nm as self-assembled technology. Then the ICP etching with SF6, CCl4, He gas is introduced to make the silicon nano pin by the mask of CsCl nano islands, and the silicon nano pins with the different height of 1.3-3.66 um are finished for field emission. The gated FEA templates are fabricated by photolithography process and the lift-off technology with Ti-Si film as the gate electrodes. The final template for field emission has the silicon nano pins with diameters of 31.7 nm on top, Ti-Ag film with thickness of 105nm and gate holes of 30um in diameter, and SU8 resist insulator structure with thickness of 4um and holes of 10um in diameter. The optimization of the fabrication process and the performance for the configuration will be made.


1994 ◽  
Vol 33 (Part 1, No. 5B) ◽  
pp. 2984-2988 ◽  
Author(s):  
Naoyuki Mishima ◽  
Yasushi Kuroda ◽  
Reiko Kobayashi ◽  
Toshiyuki Takagi

1999 ◽  
Author(s):  
H. Ishii ◽  
N. Sahri ◽  
T. Nagatsuma ◽  
K. Machida ◽  
K. Saito ◽  
...  

2007 ◽  
Vol 15 (19) ◽  
pp. 11798 ◽  
Author(s):  
Juejun Hu ◽  
Vladimir Tarasov ◽  
Nathan Carlie ◽  
Ning-Ning Feng ◽  
Laeticia Petit ◽  
...  
Keyword(s):  
Low Loss ◽  

2018 ◽  
Vol 2 (4) ◽  
pp. 81
Author(s):  
Kok Yeow You ◽  
Man Seng Sim

This paper focuses on the non-destructive dielectric measurement for low-loss planar materials with a thickness of less than 3 mm using a large coaxial probe with an outer diameter of 48 mm. The aperture probe calibration procedure required only to make a measurement of the half-space air and three offset shorts. The reflection coefficient for the thin material is measured using a Keysight E5071C network analyzer from 0.3 MHz to 650 MHz and then converted to a relative dielectric constant, εr and tangent loss, tan δ via closed form capacitance model and lift-off calibration process. Average measurement error of dielectric constant, Δεr is less than 6% from 1 MHz to 400 MHz and the resolution of loss tangent, tan δ measurement is capable of achieving 10−3.


Author(s):  
L. Zhang ◽  
K. Shqau ◽  
H. Verweij ◽  
G. Mumcu ◽  
K. Sertel ◽  
...  

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