scholarly journals All-optical DAC using counter-propagating optical and electrical pulses in a Mach-Zehnder modulator

2014 ◽  
Vol 22 (21) ◽  
pp. 26429 ◽  
Author(s):  
Arthur James Lowery
Keyword(s):  
All Optical ◽  
Electrical Pulses ◽  
Mach Zehnder Modulator

All-optical Mach–Zehnder modulator using a photochromic dye-doped polymer

2002 ◽  
Vol 80 (10) ◽  
pp. 1710-1712 ◽  
Author(s):  
Jae-Wook Kang ◽  
Jang-Joo Kim ◽  
Eunkyoung Kim
Keyword(s):  
Photochromic Dye ◽  
All Optical ◽  
Mach Zehnder Modulator ◽  
Doped Polymer

40 Gbit/s polarisation-insensitive and wavelength-independent InP Mach-Zehnder modulator for all-optical regeneration

1999 ◽  
Vol 35 (9) ◽  
pp. 730 ◽  
Author(s):  
O. Leclerc ◽  
P. Brindel ◽  
D. Rouvillain ◽  
E. Pincemin ◽  
B. Dany ◽  
...  
Keyword(s):  
All Optical ◽  
Optical Regeneration ◽  
Mach Zehnder Modulator

scholarly journals All-optical generation of binary phase-coded microwave pulses without baseband components based on a dual-parallel Mach–Zehnder modulator

2019 ◽  
Vol 27 (14) ◽  
pp. 20064 ◽  
Author(s):  
Chunqi Song ◽  
Mingzheng Lei ◽  
Jinwang Qian ◽  
Zhennan Zheng ◽  
Shanguo Huang ◽  
...  
Keyword(s):  
Binary Phase ◽  
Optical Generation ◽  
All Optical ◽  
Microwave Pulses ◽  
Mach Zehnder Modulator

Implementation of Mach Zehnder modulator based all optical gates

2019 ◽  
Author(s):  
Anoopshi Johari ◽  
Brajesh K. Kaushik ◽  
Abhinav Bhatnagar ◽  
Prabhat K. Dubey ◽  
Sanjeev Naithani
Keyword(s):  
All Optical ◽  
Mach Zehnder Modulator ◽  
Optical Gates

All-optical UWB pulse generation and pulse shape modulation by using dual-in dual-out Mach-Zehnder Modulator

2008 ◽  
Author(s):  
Jie Yin ◽  
Kun Xu ◽  
Jianqiang Li ◽  
Hao Huang ◽  
Ye Zhang ◽  
...  
Keyword(s):  
Pulse Shape ◽  
Pulse Generation ◽  
All Optical ◽  
Mach Zehnder Modulator ◽  
Shape Modulation

Correlation analysis of radiation damage

1978 ◽  
Vol 36 (1) ◽  
pp. 214-215
Author(s):  
R. Hegerl ◽  
A. Feltynowski ◽  
B. Grill
Keyword(s):  
Electron Microscopy ◽  
Independent Random Variables ◽  
Optical Parameters ◽  
Bright Field Image ◽  
Bright Field ◽  
Expectation Value ◽  
All Optical ◽  
Image Element ◽  
Stochastic Series ◽  
The Common

Till now correlation functions have been used in electron microscopy for two purposes: a) to find the common origin of two micrographs representing the same object, b) to check the optical parameters e. g. the focus. There is a third possibility of application, if all optical parameters are constant during a series of exposures. In this case all differences between the micrographs can only be caused by different noise distributions and by modifications of the object induced by radiation.Because of the electron noise, a discrete bright field image can be considered as a stochastic series Pm,where i denotes the number of the image and m (m = 1,.., M) the image element. Assuming a stable object, the expectation value of Pm would be Ηm for all images. The electron noise can be introduced by addition of stationary, mutual independent random variables nm with zero expectation and the variance. It is possible to treat the modifications of the object as a noise, too.

Sign in / Sign up

Export Citation Format

Share Document